المؤلفون: Matsunaga T., Nagashima N., Nojima T., Sugimoto S.

المصدر: MATEC Web of Conferences, Vol 321, p 04010 (2020)

مصطلحات موضوعية: Engineering (General). Civil engineering (General), TA1-2040

Relation: https://www.matec-conferences.org/articles/matecconf/pdf/2020/17/matecconf_ti2019_04010.pdf; https://doaj.org/toc/2261-236X; https://doaj.org/article/6e363707c3b840329e4495046a729208

الاتاحة: https://doi.org/10.1051/matecconf/202032104010
https://doaj.org/article/6e363707c3b840329e4495046a729208

المؤلفون: Jang, B-K, Feng, F-J, Lee, K-S, Garcia, E, Nistal, A, Nagashima, N, Kim, S, Oh, Y-S, Kim, H-T

المصدر: Surface and Coatings Technology , 308 pp. 24-30. (2016)

مصطلحات موضوعية: Environmental barrier coatings, Y2SiO5, Isothermal heat treatment, Thermal growth oxide, Mechanical properties

وصف الملف: text

Relation: https://discovery.ucl.ac.uk/id/eprint/10059414/1/18-Thermal%20behavior%20and%20mechanical%20properties%20of%20Y2SiO5%20environmental%20barrier%20after%20isothermal%20heat%20treatment%20%28Surf%20Coat%20Technol%202016%29.pdf; https://discovery.ucl.ac.uk/id/eprint/10059414/

الاتاحة: https://discovery.ucl.ac.uk/id/eprint/10059414/1/18-Thermal%20behavior%20and%20mechanical%20properties%20of%20Y2SiO5%20environmental%20barrier%20after%20isothermal%20heat%20treatment%20%28Surf%20Coat%20Technol%202016%29.pdf
https://discovery.ucl.ac.uk/id/eprint/10059414/

المؤلفون: Ono, Y, Yuri, T, Nagashima, N, Ogata, T, Nagao, N

المصدر: IOP Conference Series: Materials Science and Engineering ; volume 102, page 012001 ; ISSN 1757-8981 1757-899X

الاتاحة: http://dx.doi.org/10.1088/1757-899x/102/1/012001
http://stacks.iop.org/1757-899X/102/i=1/a=012001/pdf
http://stacks.iop.org/1757-899X/102/i=1/a=012001?key=crossref.955b3c17597d6b909e3e2f9fe1755c42

المؤلفون: Iwakiri , W., Gendreau, K., Arzoumanian, Z., Strohmayer, T.E., Mihara, T., Altamirano, Diego, Jaisawal, Gaurava K., Sanna, A., Buisson, D. J. K., Negoro, H., Nakajima, M., Kudo, Y., Shibui, H., Takagi, K., Takahashi, H., Tatano, K., Nishio, H., Kawamuro, T., Yamada, S., Wang, S., Tamagawa, T., Kawai, N., Matsuoka, M., Sakamoto, T., Serino, M., Sugita, S., Kawakubo, Y., Hiramatsu, H., Nishikawa, H., Kondo, Y., Yoshida, A., Tsuboi, Y., Sugai, H., Nagashima, N., Shidatsu, M., Niida, Y., Takahashi, I., Niwano, M., Higuchi, N., Yatsu , Y., Nakahira, S., Ueno, S., Tomida, H., Ishikawa, M., Ogawa, S., Kurihara, M., Ueda, Y., Okada, Y., Yamauchi, M., Otsuki, Y., Hasegawa, T., Nishio, M., Yamaoka, K., Sugizaki, M.

المصدر: Iwakiri , W , Gendreau , K , Arzoumanian , Z , Strohmayer , T E , Mihara , T , Altamirano , D , Jaisawal , G K , Sanna , A , Buisson , D J K , Negoro , H , Nakajima , M , Kudo , Y , Shibui , H , Takagi , K , Takahashi , H , Tatano , K , Nishio , H , Kawamuro , T , Yamada , S , Wang , S , Tamagawa , T , Kawai , N , Kawai , N , Matsuoka , M ....

مصطلحات موضوعية: X-ray, Binary, Neutron Star

Relation: https://orbit.dtu.dk/en/publications/7fdc3fd3-2fd4-4937-906f-637e23501b44

الاتاحة: https://orbit.dtu.dk/en/publications/7fdc3fd3-2fd4-4937-906f-637e23501b44

المؤلفون: Miyahara, K., Nagashima, N., Matsuoka, S.

المصدر: Philosophical Magazine A ; volume 82, issue 10, page 2149-2160 ; ISSN 0141-8610 1460-6992

الاتاحة: https://doi.org/10.1080/01418610210134459

المؤلفون: Nagashima, N, Shalabi, A, Watanabe, T, Ogawa, N, Koyama, I, Kyo, S, Burdick, J.F

المصدر: Transplantation Proceedings ; volume 33, issue 3, page 2350-2351 ; ISSN 0041-1345

الاتاحة: https://doi.org/10.1016/s0041-1345(01)02018-8
https://api.elsevier.com/content/article/PII:S0041134501020188?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0041134501020188?httpAccept=text/plain

المؤلفون: Nagashima, N., Watanabe, T., Kuo, A., Burdick, J.F.

المصدر: Transplantation Proceedings ; volume 30, issue 4, page 1168-1169 ; ISSN 0041-1345

الاتاحة: https://doi.org/10.1016/s0041-1345(98)00194-8
https://api.elsevier.com/content/article/PII:S0041134598001948?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0041134598001948?httpAccept=text/plain

المؤلفون: Matsushita, N, Kitao, H, Ishiai, M, Nagashima, N, Hirano, S, Okawa, K, Ohta, T, Yu, D, McHugh, P, Hickson, I, Venkitaraman, A, Kurumizaka, H, Takata, M

Relation: https://ora.ox.ac.uk/objects/uuid:10588b25-aa90-4d12-ab6b-d93be6aa86b2; https://doi.org/10.1016/j.molcel.2005.08.018

الاتاحة: https://doi.org/10.1016/j.molcel.2005.08.018
https://ora.ox.ac.uk/objects/uuid:10588b25-aa90-4d12-ab6b-d93be6aa86b2

المؤلفون: Colaianni, M. L., Chen, P. J., Nagashima, N., Yates, J. T.

المصدر: Journal of Applied Physics; 5/15/1993, Vol. 73 Issue 10, p4927, 5p

مصطلحات موضوعية: SILICON nitride, THIN films, CHEMICAL decomposition, AMMONIA

المؤلفون: Mayuzumi, S., Yamakawa, S., Tateshita, Y., Tsukamoto, M., Wakabayashi, H., Ohno, T., Nagashima, N.

المصدر: 2009 International Symposium on VLSI Technology, Systems, and Applications ; page 20-21

الاتاحة: http://dx.doi.org/10.1109/vtsa.2009.5159273
http://xplorestaging.ieee.org/ielx5/5129138/5159260/05159273.pdf?arnumber=5159273

المؤلفون: Morimoto, R., Kimura, T., Okayama, Y., Hirai, T., Maeda, H., Oshima, K., Watanabe, R., Fukui, H., Tsunoda, Y., Togo, M., Kanai, S., Shino, S., Hoshino, T., Shimazaki, K., Nakazawa, M., Nakazawa, K., Takasu, Y., Yamasaki, H., Inokuma, H., Taniguchi, S., Fujimaki, T., Yamada, H., Watanabe, S., Muramatsu, S., Iwasa, S., Nagaoka, K., Mimotogi, S., Iwamoto, T., Nii, H., Sogo, Y., Ohno, K., Yoshida, K., Sunouchi, K., Ikeda, M., Iwai, M., Kitano, T., Naruse, H., Enomoto, Y., Imai, K., Yamada, S., Saito, M., Kuwata, T., Matsuoka, F., Nagashima, N.

المصدر: 2007 IEEE Symposium on VLSI Technology ; page 28-29

الاتاحة: http://dx.doi.org/10.1109/vlsit.2007.4339714
http://xplorestaging.ieee.org/ielx5/4339664/4339665/04339714.pdf?arnumber=4339714

المؤلفون: Ando, T., Hirano, T., Tai, K., Yamaguchi, S., Tanaka, K., Oshiyama, I., Nakata, M., Watanabe, K., Yamamoto, R., Kanda, S., Tateshita, Y., Wakabayashi, H., Tagawa, Y., Tsukamoto, M., Iwamoto, H., Saito, M., Toyoda, S., Kumigashira, H., Oshima, M., Nagashima, N., Kadomura, S.

المصدر: 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/vtsa.2007.378913
http://xplorestaging.ieee.org/ielx5/4239457/4239458/04239481.pdf?arnumber=4239481

المؤلفون: Tsuno, H., Anzai, K., Matsumura, M., Minami, S., Honjo, A., Koike, H., Hiura, Y., Takeo, A., Fu, W., Fukuzaki, Y., Kanno, M., Ansai, H., Nagashima, N.

المصدر: 2007 IEEE Symposium on VLSI Technology ; page 204-205

الاتاحة: http://dx.doi.org/10.1109/vlsit.2007.4339693
http://xplorestaging.ieee.org/ielx5/4339664/4339665/04339693.pdf?arnumber=4339693

المؤلفون: Yamakawa, S., Wang, J., Tateshita, Y., Nagano, K., Tsukamoto, M., Ohri, H., Nagashima, N., Ansai, H.

المصدر: Simulation of Semiconductor Processes and Devices 2007 ; page 109-112 ; ISBN 9783211728604

الاتاحة: http://dx.doi.org/10.1007/978-3-211-72861-1_26
http://link.springer.com/content/pdf/10.1007/978-3-211-72861-1_26.pdf

المؤلفون: Eiho, A., Sanuki, T., Morifuji, E., Iwamoto, T., Sudo, G., Fukasaku, K., Ota, K., Sawada, T., Fuji, O., Nii, H., Togo, M., Ohno, K., Yoshida, K., Tsuda, H., Ito, T., Shioza, Y., Fuji, N., Yamazaki, H., Nakazawa, M., Iwasa, S., Muramatsu, S., Nagaoka, K., Iwai, M., Ikeda, M., Saito, M, Naruse, H., Enomoto, Y., Kitano, Yamada, S., Imai, K., Nagashima, N., Kuwata, T., Matsuoka, F.

المصدر: 2007 IEEE Symposium on VLSI Technology

الاتاحة: http://dx.doi.org/10.1109/vlsit.2007.4339699
http://xplorestaging.ieee.org/ielx5/4339664/4339665/04339699.pdf?arnumber=4339699

المؤلفون: Nagashima, N., Kimura, T., Yamakawa, S., Kanda, S., Yamamoto, R., Hiyama, S., Fujita, S., Miyanami, Y., Ikuta, T., Nagano, K., Hirano, T., Kadomura, S., Kataoka, T., Kato, T., Tateshita, Y., Kikuchi, Y., Wang, J., Saito, M., Ohno, T., Iwamoto, H., Kamide, Y., Tagawa, Y., Yamagishi, N., Kugimiya, K.

المصدر: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. ; volume 43, page 190-191

الاتاحة: http://dx.doi.org/10.1109/vlsit.2006.1705281
http://xplorestaging.ieee.org/ielx5/11173/35986/01705281.pdf?arnumber=1705281

المؤلفون: Matsuoka, F., Nagashima, N., Yamada, S., Iwai, M., Saito, M., Oono, K., Oshima, K., Morimoto, R., Fukasaku, K., Iinuma, T., Aoyama, T., Takegawa, Y., Hamaguchi, M., Kimura, T., Komoda, T., Eiho, A., Oishi, A., Watanabe, R., Nakayama, K., Ono, T., Taniguchi, S., Nakajima, K., Saito, T., Okayama, Y.

المصدر: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. ; page 96-97

الاتاحة: http://dx.doi.org/10.1109/vlsit.2006.1705234
http://xplorestaging.ieee.org/ielx5/11173/35986/01705234.pdf?arnumber=1705234

المؤلفون: Sanuki, T., Tanaka, H., Oota, K., Fujii, O., Yamaguchi, R., Nakayama, K., Morimasa, Y., Takasu, Y., Idebuchi, J., Nishiyama, N., Fukui, H., Yoshimura, H., Matsuo, K., Mizushima, I., Ito, H., Takegawa, Y., Saito, M., Iwai, M., Nagashima, N., Matsuoka, F.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ; page 501-504

الاتاحة: http://dx.doi.org/10.1109/iedm.2005.1609391
http://xplorestaging.ieee.org/ielx5/10701/33791/01609391.pdf?arnumber=1609391

المؤلفون: Tai, K., Hirano, T., Yamaguchi, S., Ando, T., Hiyama, S., Wang, J., Nagahama, Y., Kato, T., Yamanaka, M., Terauchi, S., Kanda, S., Yamamoto, R., Tateshita, Y., Tagawa, Y., Iwamoto, H., Saito, M., Nagashima, N., Kadomura, S.

المصدر: 2006 European Solid-State Device Research Conference ; page 121-124 ; ISSN 1930-8876

الاتاحة: http://dx.doi.org/10.1109/essder.2006.307653
http://xplorestaging.ieee.org/ielx5/4099836/4099837/04099871.pdf?arnumber=4099871

المؤلفون: Kawasaki, H., Ohuchi, K., Oishi, A., Fujii, O., Tsujii, H., Ishida, T., Kasai, K., Okayama, Y., Kojima, K., Adachi, K., Aoki, N., Kanernura, T., Hagishima, D., Fujiwara, M., Inaba, S., Ishimam, K., Nagashima, N., Ishiuchi, H.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. ; page 169-172

الاتاحة: http://dx.doi.org/10.1109/iedm.2004.1419098
http://xplorestaging.ieee.org/ielx5/9719/30682/01419098.pdf?arnumber=1419098