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1Electronic Resource
المؤلفون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS, Veliadis, Victor, Snook, M, Hearne, H, Nechay, B, Woodruff, S, Lavoie, C, Kirby, C, Imhoff, Eugene, White, J, Davis, Stuart M
المصدر: DTIC
مصطلحات الفهرس: Inorganic Chemistry, PHOTOLITHOGRAPHY, SILICON CARBIDES, AVALANCHES, BLOCKING, CATASTROPHIC CONDITIONS, CYCLES, DEPOSITION, DIELECTRICS, DIODES, DOSAGE, EDGES, FABRICATION, IMPLANTATION, INTERFACES, JUNCTIONS, LABOR, LITHOGRAPHY, LOSSES, MEASUREMENT, REGIONS, REPRINTS, SENSITIVITY, THICKNESS, TOLERANCE, TRANSITIONS, VOLTAGE, WAFERS, Text
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2Electronic Resource
المؤلفون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS, Snook, M, Hearne, H, McNutt, Ty, El-Hinnawy, N, Veliadis, V, Nechay, B, Woodruff, S, Howell, R S, Giorgi, David, White, Joe
المصدر: DTIC
مصطلحات الفهرس: Electrical and Electronic Equipment, Mfg & Industrial Eng & Control of Product Sys, Electricity and Magnetism, ELECTRIC CONNECTORS, FABRICATION, HIGH VOLTAGE, OPTIMIZATION, PERFORMANCE(ENGINEERING), PIN DIODES, SILICON CARBIDES, WAFERS, BREAKDOWN(ELECTRONIC THRESHOLD), CURRENT DENSITY, DEFECTS(MATERIALS), ELECTRIC CURRENT, HIGH POWER, LEAKAGE(ELECTRICAL), LOW COSTS, PEAK POWER, POWER CONDITIONING, SIMPLIFICATION, 4H-SILICON CARBIDE WAFERS, WAFER INTERCONNECTIONS, FULL-WAFER DIODES, WAFER-INTERCONNECTED DIODES, POWER DENSITY, DISSIPATED ENERGY, CALCULATED ACTION, PULSED TESTING, PEAK CURRENT DENSITY, Text
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3Electronic Resource
المصدر: DTIC
مصطلحات الفهرس: Computer Programming and Software, Test Facilities, Equipment and Methods, AUTOMATION, TEST MANAGEMENT, TEST METHODS, AGILE SOFTWARE DEVELOPMENT, CASE STUDIES, PERFORMANCE TESTS, PROJECT MANAGEMENT, SOFTWARE ENGINEERING, AUTOMATED TESTING, SMOKE TESTS, REGRESSION TESTS, SPRINTS TESTING, AGILE TESTING CYCLES, SMOKE TESTING, REGRESSION TESTING, LOAD TESTING, SERVICE TESTING, TEST SCRIPTS, SERVICE ORIENTED ARCHITECTURE, REQUIREMENTS VALIDATION, Text
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4Academic Journal
المؤلفون: Veliadis, Victor, Snook, M, Hearne, H, Nechay, B, Woodruff, S, Lavoie, C, Kirby, C, Imhoff, Eugene, White, J, Davis, Stuart M
المساهمون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS
المصدر: DTIC
مصطلحات موضوعية: Inorganic Chemistry, PHOTOLITHOGRAPHY, SILICON CARBIDES, AVALANCHES, BLOCKING, CATASTROPHIC CONDITIONS, CYCLES, DEPOSITION, DIELECTRICS, DIODES, DOSAGE, EDGES, FABRICATION, IMPLANTATION, INTERFACES, JUNCTIONS, LABOR, LITHOGRAPHY, LOSSES, MEASUREMENT, REGIONS, REPRINTS, SENSITIVITY, THICKNESS, TOLERANCE, TRANSITIONS, VOLTAGE, WAFERS, geo, socio
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5Academic Journal
المؤلفون: Snook, M, Hearne, H, McNutt, Ty, El-Hinnawy, N, Veliadis, V, Nechay, B, Woodruff, S, Howell, R S, Giorgi, David, White, Joe
المساهمون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS
المصدر: DTIC
مصطلحات موضوعية: Electrical and Electronic Equipment, Mfg & Industrial Eng & Control of Product Sys, Electricity and Magnetism, ELECTRIC CONNECTORS, FABRICATION, HIGH VOLTAGE, OPTIMIZATION, PERFORMANCE(ENGINEERING), PIN DIODES, SILICON CARBIDES, WAFERS, BREAKDOWN(ELECTRONIC THRESHOLD), CURRENT DENSITY, DEFECTS(MATERIALS), ELECTRIC CURRENT, HIGH POWER, LEAKAGE(ELECTRICAL), LOW COSTS, PEAK POWER, POWER CONDITIONING, SIMPLIFICATION, 4H-SILICON CARBIDE WAFERS, WAFER INTERCONNECTIONS, FULL-WAFER DIODES, WAFER-INTERCONNECTED DIODES, POWER DENSITY, DISSIPATED ENERGY, CALCULATED ACTION, PULSED TESTING, PEAK CURRENT DENSITY
وصف الملف: text/html
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6Academic Journal
المؤلفون: Kilical, H F
المساهمون: NORTHROP GRUMMAN SYSTEMS CORP LINTHICUM MD ELECTRONIC SYSTEMS
المصدر: DTIC
مصطلحات موضوعية: Computer Programming and Software, Test Facilities, Equipment and Methods, AUTOMATION, TEST MANAGEMENT, TEST METHODS, AGILE SOFTWARE DEVELOPMENT, CASE STUDIES, PERFORMANCE TESTS, PROJECT MANAGEMENT, SOFTWARE ENGINEERING, AUTOMATED TESTING, SMOKE TESTS, REGRESSION TESTS, SPRINTS TESTING, AGILE TESTING CYCLES, SMOKE TESTING, REGRESSION TESTING, LOAD TESTING, SERVICE TESTING, TEST SCRIPTS, SERVICE ORIENTED ARCHITECTURE, REQUIREMENTS VALIDATION
وصف الملف: text/html