المؤلفون: Saadia Aziz, Ijaz Ali Shoukat, Mohsin Iftikhar, Mohsin Murtaza, Abdulmajeed M. Alenezi, Cheng-Chi Lee, Imran Taj

المصدر: Cryptography, Vol 8, Iss 4, p 47 (2024)

مصطلحات موضوعية: cryptography, dynamic permutation, IoT, lightweight block cipher, memory efficiency, NIST Statistical Test, Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2410-387X/8/4/47; https://doaj.org/toc/2410-387X

URL الوصول: https://doaj.org/article/faab1d793d6141ea8a557918b6207af2

المؤلفون: Gulmira Shakhmetova, Alibek Barlybayev, Zhanat Saukhanova, Altynbek Sharipbay, Sayat Raykul, Altay Khassenov

المصدر: Applied Sciences, Vol 14, Iss 11, p 4341 (2024)

مصطلحات موضوعية: finite state machines, invertible finite automata, image encryption and decryption, NIST statistical test suite, histogram analysis, correlation analysis, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

Relation: https://www.mdpi.com/2076-3417/14/11/4341; https://doaj.org/toc/2076-3417; https://doaj.org/article/4f4e09453fb24df9a0f7bfe1e4259941

الاتاحة: https://doi.org/10.3390/app14114341
https://doaj.org/article/4f4e09453fb24df9a0f7bfe1e4259941

المؤلفون: Lamia A. Muhalha, Imad S. Alshawi

المصدر: International Journal of Electrical and Computer Engineering (IJECE), 13(1), 833-841, (2023-02-01)

مصطلحات موضوعية: Hash function, Keystream generator Salsa20, NIST statistical test suite, Salsa20 algorithm, Speck algorithm

Relation: oai:zenodo.org:7456133

الاتاحة: https://doi.org/10.11591/ijece.v13i1.pp833-841

المؤلفون: M. O. Pikuza, S. Yu. Mikhnevich

المصدر: Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 19, Iss 4, Pp 37-42 (2021)

مصطلحات موضوعية: hardware random number generator, noise diode, random number generator testing, nist statistical test suite, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://doklady.bsuir.by/jour/article/view/3106; https://doaj.org/toc/1729-7648

URL الوصول: https://doaj.org/article/4a4a2029a4d944a6a2116c388307b6a8

المؤلفون: Mariam Sulaiman, Nidaa Hassan

المصدر: Engineering and Technology Journal, Vol 36, Iss 1B, Pp 48-52 (2018)

مصطلحات موضوعية: captcha, chaotic map, jacobian elliptic chebyshev rational map, nist statistical test suite, pseudo-random bits generator, Science, Technology

وصف الملف: electronic resource

Relation: https://etj.uotechnology.edu.iq/article_175347_9f68d7e7d9d03b1d9f993e12140eea6f.pdf; https://doaj.org/toc/1681-6900; https://doaj.org/toc/2412-0758

URL الوصول: https://doaj.org/article/941fe374936049f092c755b1d6a8f795

المؤلفون: Md. Selim Al Mamun, Fatema Akhter

المصدر: Symmetry; Volume 12; Issue 8; Pages: 1202

مصطلحات موضوعية: finite field, primitive polynomial, quadratic residue, pseudo random binary sequence, NIST statistical test suite

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/sym12081202

الاتاحة: https://doi.org/10.3390/sym12081202

المؤلفون: Lina Ding, Chunyuan Liu, Yanpeng Zhang, Qun Ding

المصدر: Symmetry; Volume 11; Issue 7; Pages: 853

مصطلحات موضوعية: lightweight stream cipher, chaotic sequence, NFSR, entropy analysis, FPGA, NIST statistical test

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/sym11070853

الاتاحة: https://doi.org/10.3390/sym11070853

المؤلفون: Dridi, Fethi, El Assad, Safwan, Elhadj Youssef, Wajih, Machhout, Mohsen

المساهمون: Université de Monastir - University of Monastir (UM), Institut d'Électronique et des Technologies du numéRique (IETR), Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS)

المصدر: International Conference on Internet of Things, Embedded Systems and Communications (IINTEC'2019) ; https://hal.science/hal-02430552 ; International Conference on Internet of Things, Embedded Systems and Communications (IINTEC'2019), Dec 2019, Hammamet, Tunisia. [F.Dridi et al] 4 p ; http://www.iintec.org/

مصطلحات موضوعية: Chaos, Cryptographic, Pseudo Chaotic Number Generator, Internet of Things (IoT), hardware implementation, FPGA, NIST statistical test, [SPI]Engineering Sciences [physics], [SPI.OTHER]Engineering Sciences [physics]/Other

جغرافية الموضوع: Hammamet, Tunisia

Relation: hal-02430552; https://hal.science/hal-02430552

الاتاحة: https://hal.science/hal-02430552

المؤلفون: Al Mamun, Md. Selim, Akhter, Fatema

المصدر: Symmetry

مصطلحات موضوعية: finite field, primitive polynomial, quadratic residue, pseudo random binary sequence, NIST statistical test suite

Relation: https://ousar.lib.okayama-u.ac.jp/files/public/6/60730/20200917115340950461/fulltext.pdf; https://ousar.lib.okayama-u.ac.jp/60730

الاتاحة: https://ousar.lib.okayama-u.ac.jp/files/public/6/60730/20200917115340950461/fulltext.pdf
https://ousar.lib.okayama-u.ac.jp/60730

المؤلفون: Fethi Dridi, Wajih El Hadj Youssef, Safwan El Assad, Mohsen Machhout

المساهمون: Charlier, Sandrine, Université de Monastir - University of Monastir (UM), Institut d'Électronique et des Technologies du numéRique (IETR), Université de Nantes (UN)-Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), Nantes Université (NU)-Université de Rennes 1 (UR1), Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS)

المصدر: International Conference on Internet of Things, Embedded Systems and Communications (IINTEC'2019)
International Conference on Internet of Things, Embedded Systems and Communications (IINTEC'2019), Dec 2019, Hammamet, Tunisia. [F.Dridi et al] 4 p
IINTEC

مصطلحات موضوعية: [SPI.OTHER]Engineering Sciences [physics]/Other, Computer science, [SPI] Engineering Sciences [physics], Chaotic, Cryptographic, Cryptography, 02 engineering and technology, Computer Science::Hardware Architecture, [SPI]Engineering Sciences [physics], NIST statistical test, VHDL, 0202 electrical engineering, electronic engineering, information engineering, Field-programmable gate array, MATLAB, Throughput (business), FPGA, computer.programming_language, Cryptographic primitive, business.industry, [SPI.OTHER] Engineering Sciences [physics]/Other, 020207 software engineering, Internet of Things (IoT), CHAOS (operating system), Embedded system, Chaos, 020201 artificial intelligence & image processing, Pseudo Chaotic Number Generator, hardware implementation, business, computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e28c47b5d74d5ad7009dfd779cbc995c
https://hal.science/hal-02430552

المؤلفون: Hirosuke YAMAMOTO, Kenji HAMANO

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2010, E93.A(7):1346

المؤلفون: Suchomelová, Radka

المساهمون: Malina, Lukáš, Dobiáš, Patrik

المصدر: SUCHOMELOVÁ, R. Generování náhodných čísel na čipových kartách [online]. Brno: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. 2023.

مصطلحات موضوعية: Čipové karty, smart karty, BasicCard, JavaCard, náhodná čísla, testování generátorů náhodných čísel, NIST Statistical Test Suite, Smart cards, Random numbers, Random number generators testing

وصف الملف: application/pdf; application/zip; text/html

Relation: http://hdl.handle.net/11012/211012

الاتاحة: http://hdl.handle.net/11012/211012

المؤلفون: AVAROÄžLU, ERDÄ°NÇ

المصدر: Turkish Journal of Electrical Engineering and Computer Sciences

مصطلحات موضوعية: Pseudorandom number generator, Arnold cat map, NIST statistical test, scale index, statistical complexity measure, autocorrelation, Computer Engineering, Computer Sciences, Electrical and Computer Engineering

وصف الملف: application/pdf

Relation: https://journals.tubitak.gov.tr/elektrik/vol25/iss1/48; https://journals.tubitak.gov.tr/context/elektrik/article/2443/viewcontent/elk_25_1_48_1507_253.pdf

الاتاحة: https://journals.tubitak.gov.tr/elektrik/vol25/iss1/48
https://doi.org/10.3906/elk-1507-253
https://journals.tubitak.gov.tr/context/elektrik/article/2443/viewcontent/elk_25_1_48_1507_253.pdf

المؤلفون: AVAROĞLU, ERDİNÇ

المصدر: Volume: 25, Issue: 1 633-643 ; 1300-0632 ; 1303-6203 ; Turkish Journal of Electrical Engineering and Computer Science

مصطلحات موضوعية: Pseudorandom number generator,Arnold cat map,NIST statistical test,scale index,statistical complexity measure,autocorrelation

وصف الملف: application/pdf

Relation: https://dergipark.org.tr/tr/download/article-file/433451; https://dergipark.org.tr/tr/pub/tbtkelektrik/issue/35781/400335

الاتاحة: https://dergipark.org.tr/tr/pub/tbtkelektrik/issue/35781/400335

المؤلفون: Erdinç Avaroğlu

المصدر: Volume: 25, Issue: 1 633-643
Turkish Journal of Electrical Engineering and Computer Science

مصطلحات موضوعية: Discrete mathematics, Pseudorandom number generator, General Computer Science, Autocorrelation, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, Pseudorandom number generator,Arnold cat map,NIST statistical test,scale index,statistical complexity measure,autocorrelation, Combinatorics, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Statistical analysis, Electrical and Electronic Engineering, 010301 acoustics, Mathematics

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ee8560634629f5334803855161d515bf
https://dergipark.org.tr/tr/pub/tbtkelektrik/issue/35781/400335

المؤلفون: Fatma E. Ibrahim, M. I. Moussa, H. M. Abdalkader

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://research.ijcaonline.org/volume97/number16/pxc3897634.pdf.

مصطلحات موضوعية: Security, Information Hiding. Keywords DNA Cryptography, Amino Acid, OTP, NIST Statistical Test

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.679.5061; http://research.ijcaonline.org/volume97/number16/pxc3897634.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.679.5061
http://research.ijcaonline.org/volume97/number16/pxc3897634.pdf

المؤلفون: Wendy Rotz, Eric Falk, Daniel Wood, Jeri Mulrow

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.amstat.org/sections/srms/proceedings/y2001/proceed/00109.pdf.

مصطلحات موضوعية: Key Words, DIEHARD, Access, RAT-STATS, Random Number Generator, Excel, ACL, NIST Statistical Test Suite

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.626.2263; http://www.amstat.org/sections/srms/proceedings/y2001/proceed/00109.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.626.2263
http://www.amstat.org/sections/srms/proceedings/y2001/proceed/00109.pdf

المؤلفون: Wendy Rotz, Eric Falk, Archana Joshee

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.amstat.org/sections/srms/proceedings/y2004/files/Jsm2004-000710.pdf.

مصطلحات موضوعية: Key Words, RNG, Excel, SAS, DIEHARD, NIST statistical test suite

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.495.5068; http://www.amstat.org/sections/srms/proceedings/y2004/files/Jsm2004-000710.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.495.5068
http://www.amstat.org/sections/srms/proceedings/y2004/files/Jsm2004-000710.pdf

المؤلفون: Dąbal, P., Pełka, R.

المصدر: Elektronika : konstrukcje, technologie, zastosowania.

مصطلحات موضوعية: pseudorandom generator, NIST statistical test, chaos, FPGA, FDNR, generator pseudolosowy, test statystyczny NIST

URL الوصول: http://yadda.icm.edu.pl/baztech/element/bwmeta1.element.baztech-550d5d22-8eaa-4675-a85c-be5917721756

المؤلفون: Dąbal, P., Pełka, R.

المصدر: Elektronika : konstrukcje, technologie, zastosowania.

مصطلحات موضوعية: generator pseudolosowy, test statystyczny NIST, chaos, FPGA, pseudorandom generator, NIST statistical test

URL الوصول: http://yadda.icm.edu.pl/baztech/element/bwmeta1.element.baztech-article-BWAN-0020-0065