المؤلفون: Claudia M. Aguilar-Melo, Julia L. Rodríguez, Isaac Chairez, Iván Salgado, J. A. Andraca Adame, J. A. Galaviz-Pérez, Jorge Vazquez-Arenas, Tatyana Poznyak

المصدر: Catalysts; Volume 10; Issue 8; Pages: 884

مصطلحات موضوعية: naproxen, catalytic ozonation, nickel oxide films, mineralization, reaction kinetics

وصف الملف: application/pdf

Relation: Photocatalysis; https://dx.doi.org/10.3390/catal10080884

الاتاحة: https://doi.org/10.3390/catal10080884

المؤلفون: Ramiz A. Mohammed Al-Ansari

المصدر: Iraqi Journal of Physics, Vol 14, Iss 29 (2019)

مصطلحات موضوعية: Optical properties, Nickel Oxide films, NiO:Cu, structural properties., Physics, QC1-999

وصف الملف: electronic resource

Relation: https://ijp.uobaghdad.edu.iq/index.php/physics/article/view/223; https://doaj.org/toc/2070-4003; https://doaj.org/toc/2664-5548

URL الوصول: https://doaj.org/article/68efe0625aaa405fa755ffd24bf22403

المؤلفون: Benedet M., Maccato C., Pagot G., Invernizzi C., Sada C., Di Noto V., Rizzi G. A., Fois E., Tabacchi G., Barreca D.

المساهمون: Benedet, M., Maccato, C., Pagot, G., Invernizzi, C., Sada, C., Di Noto, V., Rizzi, G. A., Fois, E., Tabacchi, G., Barreca, D.

مصطلحات موضوعية: NICKEL-OXIDE FILMS, ATOMIC LAYER DEPOSITION, X-RAY PHOTOEMISSION, OPTICAL-PROPERTIES, PRECURSORS, CVD, TEMPERATURE, COMPLEXES, MOCVD

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001141140000001; volume:127; issue:45; firstpage:22304; lastpage:22314; numberofpages:11; journal:JOURNAL OF PHYSICAL CHEMISTRY. C; https://hdl.handle.net/11577/3502145; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85178376592

الاتاحة: https://hdl.handle.net/11577/3502145
https://doi.org/10.1021/acs.jpcc.3c05067
https://pubs.acs.org/doi/10.1021/acs.jpcc.3c05067

المؤلفون: Cosar, Mustafa Burak, Icli, Kerem Cagatay, Özenbaş, Ahmet Macit

مصطلحات موضوعية: Nickel-oxide films, Optical-properties, Parameters, Thickness

Relation: Cosar M. B. , Icli K. C. , ÖZENBAŞ A. M. , "Plasma assisted low temperature electron beam deposited NiO thin films for electro-optic applications", JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, cilt.36, 2018; 85042865106; https://hdl.handle.net/11511/30202; 36; WOS:000432372400028

الاتاحة: https://hdl.handle.net/11511/30202
https://doi.org/10.1116/1.5013126

المؤلفون: Hao-long Chen, Yang-ming Lu, Weng-sing Hwang

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.jim.or.jp/journal/e/pdf3/46/04/872.pdf?origin%3Dpublication_detail.

مصطلحات موضوعية: nickel oxide films, thickness, hall effect, structural, electrical

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.654.4567; http://www.jim.or.jp/journal/e/pdf3/46/04/872.pdf?origin%3Dpublication_detail

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.654.4567
http://www.jim.or.jp/journal/e/pdf3/46/04/872.pdf?origin%3Dpublication_detail

المؤلفون: Hao-Long Chen, Weng-Sing Hwang, Yang-Ming Lu

المصدر: MATERIALS TRANSACTIONS. 2005, 46(4):872

المؤلفون: Rodolfo Rosa, Aldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi

المصدر: Microscopy Today 22 (2014): 28–35. doi:10.1017/S1551929514000674
info:cnr-pdr/source/autori:Aldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi, and Rodolfo Rosa/titolo:Quantitative X-ray microanalysis of thin NiO films by Monte Carlo and Cliff-Lorimer methods/doi:10.1017%2FS1551929514000674/rivista:Microscopy Today/anno:2014/pagina_da:28/pagina_a:35/intervallo_pagine:28–35/volume:22

مصطلحات موضوعية: extrapolation method, Materials science, analytical electron microscopy, General Computer Science, nickel-oxide films, k-factors, Non-blocking I/O, Monte Carlo method, Analytical chemistry, FIB-thinned wedge lamella, Monte Carlo simulation, bilayers, X ray microanalysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c2aa7fdd38ea3af8acdd97d8c45fba65
https://doi.org/10.1017/s1551929514000054

المؤلفون: Rodolfo Rosa, Aldo Armigliato

المساهمون: A. Armigliato, R. Rosa

المصدر: Microscopy and Microanalysis. 15:99-105

مصطلحات موضوعية: BILAYERS, Materials science, Monte Carlo method, Non-blocking I/O, Analytical chemistry, chemistry.chemical_element, ANALYTICAL ELECTRON MICROSCOPY, Microanalysis, Carbon, Nanostructures, NICKEL-OXIDE FILMS, MONTE CARLO SIMULATION, Carbon film, chemistry, Nickel, Transmission electron microscopy, Thin film, Monte Carlo Method, Instrumentation, Layer (electronics), Electron Probe Microanalysis

وصف الملف: STAMPA

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::61c870fd6dcabbb825a6c61851f6ea70
https://doi.org/10.1017/s1431927609090199

المؤلفون: Xiaowei Wei, Pan Yang, Zhihua Zhou, Jian Wang

المصدر: Nanoscale Research Letters

مصطلحات موضوعية: Materials science, Nano Express, Gas sensing device, business.industry, Non-blocking I/O, Nanochemistry, Nanotechnology, Sensitivity and selectivity, Condensed Matter Physics, Porous structure, Amorphous solid, Semiconductor, Materials Science(all), Chemical engineering, Nickel oxide films, Specific surface area, Particle, General Materials Science, business, Porosity, Single crystal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44da8e69b0350eda311ec7aa8d079ae4
https://pubmed.ncbi.nlm.nih.gov/25852413

المؤلفون: Reddy, YAK Reddy, Y. Ashok Kumar, Ajitha, B Ajitha, B., Reddy, PS Reddy, P. Sreedhara, Reddy, MSP Reddy, M. Siva Pratap, Lee, JH Lee, Jung-Hee

مصطلحات موضوعية: PULSED-LASER DEPOSITION, NICKEL-OXIDE FILMS, P-TYPE NIO, RAMAN-SCATTERING, GROWTH, ABSORPTION, SURFACE, SILVER, SNO2

الاتاحة: http://hdl.handle.net/10203/191088
https://doi.org/10.1007/s13391-014-3351-z

المؤلفون: Wang, Jian, Yang, Pan, Wei, Xiaowei, Zhou, Zhihua

مصطلحات موضوعية: Nickel oxide films, Porous structure, Gas sensing device, Sensitivity and selectivity

Relation: http://www.nanoscalereslett.com/content/10/1/119

الاتاحة: http://www.nanoscalereslett.com/content/10/1/119

المؤلفون: Lee, JW Lee, Jeong-Woo, Ahn, TB Ahn, Tae-Bin, Kim, JH Kim, Jong-Hun, Ko, JM Ko, Jang-Myoun, Kim, JD Kim, Jong-Duk

مصطلحات موضوعية: NICKEL-OXIDE FILMS, ELECTROCHEMICAL PROPERTIES, NANOCRYSTALLINE NIO, ELECTRODE MATERIAL, CAPACITANCE, RUO2, HYDROXIDE, CARBON, SIZE, NANOCOMPOSITE

الاتاحة: http://hdl.handle.net/10203/99052

المؤلفون: A. Armigliato, ROSA, RODOLFO

المساهمون: A. Armigliato, R. Rosa

مصطلحات موضوعية: ANALYTICAL ELECTRON MICROSCOPY, MONTE CARLO SIMULATION, NICKEL-OXIDE FILMS, BILAYERS

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/pmid/19284891; info:eu-repo/semantics/altIdentifier/wos/WOS:000264861800003; volume:15; firstpage:99; lastpage:105; numberofpages:7; journal:MICROSCOPY AND MICROANALYSIS; http://hdl.handle.net/11585/75700; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-66349126372

الاتاحة: http://hdl.handle.net/11585/75700
https://doi.org/10.1017/S1431927609090199

المؤلفون: Srinivasan, Venkat, Weidner, John W

المصدر: Faculty Publications

مصطلحات موضوعية: nickel oxide films, capacitor, charge-storage mechanism, Chemical Engineering

وصف الملف: application/pdf

Relation: https://scholarcommons.sc.edu/eche_facpub/109; https://scholarcommons.sc.edu/context/eche_facpub/article/1108/viewcontent/27.pdf

الاتاحة: https://scholarcommons.sc.edu/eche_facpub/109
https://scholarcommons.sc.edu/context/eche_facpub/article/1108/viewcontent/27.pdf