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المؤلفون: S.N. Paisner, T.D. Fornes, K.A. Gilbert, N.D. Huffman
المصدر: 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium.
مصطلحات موضوعية: Materials science, business.industry, Particle packing, Interface (computing), Thermal, Thermal management of electronic devices and systems, Adhesive, Electronics, Current (fluid), Process engineering, business