المؤلفون: J. M. Harris, L. G. Pearce, N. W. van Vonno, E. J. Thomson

المصدر: 2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9698a2c72b1615fc4bc5e67f1054e54b
https://doi.org/10.1109/nsrec45046.2021.9679355

المؤلفون: W. H. Newman, L. G. Pearce, E. J. Thomson, J. S. Gill, O. Mansilla, N. W. van Vonno

المصدر: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).

مصطلحات موضوعية: Buck converter, business.industry, Computer science, Dropout (communications), Regulator, Voltage regulator, Integrated circuit, Dual (category theory), law.invention, Control theory, law, Load regulation, Nondestructive testing, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6eac92b09d92bb42d200532c2eecf91
https://doi.org/10.1109/redw51883.2020.9325859

المؤلفون: E. J. Thomson, L. G. Pearce, W. H. Newman, N. W. van Vonno, A. Robinson

المصدر: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).

مصطلحات موضوعية: Set (abstract data type), Earth's orbit, Low earth orbit, Computer science, Node (networking), Physics::Space Physics, Real-time computing, Communications satellite, Geosynchronous orbit, Astrophysics::Earth and Planetary Astrophysics, Transceiver, CAN bus

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bc32c26d06313d8496600e92d79a4563
https://doi.org/10.1109/redw51883.2020.9325857

المؤلفون: N. W. van Vonno, W. H. Newman

المصدر: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).

مصطلحات موضوعية: Materials science, Absorbed dose, Total dose, Irradiation, Electronics, Dose rate, Low voltage, NMOS logic, Simulation, PMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3c13334afd2958b635cbdfcb789ec81b
https://doi.org/10.1109/redw51883.2020.9325856

المؤلفون: N. W. van Vonno, E. J. Thomson, L. G. Pearce, J. M. Harris

المصدر: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).

مصطلحات موضوعية: business.industry, Computer science, Nondestructive testing, Real-time computing, Logic testing, Successive approximation ADC, business, Test (assessment), Event (probability theory)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b2902ed92e05b170e42cea1ab5e35377
https://doi.org/10.1109/redw51883.2020.9325849

المؤلفون: N. W. Van Vonno, J. S. Gill, F. C. Ballou, H. G. Satterfield, L. G. Pearce, W. H. Newman

المصدر: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3ed22c15fe300b301cbc0e8b8e7a8194
https://doi.org/10.1109/radecs50773.2020.9857712

المؤلفون: W. H. Newman, N. W. Van Vonno, K. Bernard, D. Wackley, L. G. Pearce, E. J. Thomson

المصدر: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bca2fe03345a75eac679910fdbd3f9d3
https://doi.org/10.1109/radecs50773.2020.9857707

المؤلفون: J. M. Harris, L. G. Pearce, N. W. Van Vonno, E. J. Thomson

المصدر: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f846ed48de26610fea07bb73c3cabdaf
https://doi.org/10.1109/radecs50773.2020.9857683

المؤلفون: W.H. Newman, N. W. van Vonno, A. Robinson, S. D. Turner, L. G. Pearce, E. J. Thomson

المصدر: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5ffeed51402805acb253f5b6f74ffde0
https://doi.org/10.1109/radecs47380.2019.9745726

المؤلفون: J. S. Gill, N. W. van Vonno, F. C. Ballou, W. H. Newman

المصدر: 2019 IEEE Radiation Effects Data Workshop.

مصطلحات موضوعية: Physics, Radiation testing, Nuclear engineering, Total dose, Absorbed dose, Low dose rate, Radiation, Clipper (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::24b4921a3582b4cd9e8af64d5ed208ae
https://doi.org/10.1109/redw.2019.8906287

المؤلفون: N. W. van Vonno, J. S. Gill, W. H. Newman, F. C. Ballou

المصدر: 2019 IEEE Radiation Effects Data Workshop.

مصطلحات موضوعية: Physics, Radiation testing, Acceptance testing, Absorbed dose, Nuclear engineering, Total dose, Dose rate, Clipper (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2db2e4f6532430582c3d23a0611d5f87
https://doi.org/10.1109/redw.2019.8906612

المؤلفون: L. G. Pearce, W. H. Newman, N. W. van Vonno, Alexander Robinson, S. D. Turner, E. J. Thomson, B. Williams, O. Mansilla

المصدر: 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).

مصطلحات موضوعية: business.industry, Total dose, Absorbed dose, Environmental science, Current (fluid), Nuclear medicine, business, Event (probability theory)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0a20f5f954b55fc75d4c9181e25ef4ef
https://doi.org/10.1109/nsrec.2018.8584301

المؤلفون: E. J. Thomson, Serge Bernard, W. H. Newman, N. W. van Vonno, L. G. Pearce, J. Broline, O. Mansilla

المصدر: 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

مصطلحات موضوعية: business.industry, Computer science, media_common.quotation_subject, Automotive industry, Space industry, Quality (business), Space (commercial competition), Line (text file), Radiation, business, Automotive engineering, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::48d9dd454c193d3c75ab82b32077c6b0
https://doi.org/10.1109/radecs.2017.8696122

المؤلفون: H. W. Satterfield, F. C. Ballou, L. G. Pearce, N. W. van Vonno, E. J. Thomson, W. H. Newman, J. S. Gill

المصدر: 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

مصطلحات موضوعية: chemistry.chemical_compound, Materials science, Fabrication, chemistry, business.industry, Event (computing), Total dose, Optoelectronics, Gallium nitride, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a952f2ec527b9cc3aae99fe1fc7d62eb
https://doi.org/10.1109/radecs.2017.8696139

المؤلفون: O. Mansilla, N. W. van Vonno, W. H. Newman, E. J. Thomson, L. G. Pearce, J. S. Gill

المصدر: 2017 IEEE Radiation Effects Data Workshop (REDW).

مصطلحات موضوعية: Safe operating area, chemistry.chemical_compound, Materials science, chemistry, Event (computing), business.industry, Logic gate, Electronic engineering, Optoelectronics, Power semiconductor device, Gallium nitride, Power MOSFET, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::96a2bfa183bf43f52214d6c0b0abe339
https://doi.org/10.1109/nsrec.2017.8115470

المؤلفون: J. S. Gill, W. H. Newman, O. Mansilla, N. W. van Vonno, E. J. Thomson, L. G. Pearce

المصدر: 2017 IEEE Radiation Effects Data Workshop (REDW).

مصطلحات موضوعية: chemistry.chemical_compound, Materials science, chemistry, business.industry, Logic gate, Electronic engineering, Optoelectronics, Power semiconductor device, Gallium nitride, Power MOSFET, business, Displacement (vector)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eec8b322b2db914b59ad1725ae6baddd
https://doi.org/10.1109/nsrec.2017.8115469

المؤلفون: W. H. Newman, L. G. Pearce, N. W. van Vonno, E. J. Thomson, O. Mansilla

المصدر: 2017 IEEE Radiation Effects Data Workshop (REDW).

مصطلحات موضوعية: Materials science, business.industry, law, Bipolar process, Operational amplifier, Process (computing), Optoelectronics, Silicon on insulator, High voltage, Radiation, business, law.invention, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::853f93f491460e1c708f0dd058ea023d
https://doi.org/10.1109/nsrec.2017.8115471

المؤلفون: An-Lin He, N. W. van Vonno, Bharat L. Bhuva, Yi Ren, Richard Wong, Shi-Jie Wen, Gang Guo, Li Chen, Shuting Shi

المصدر: Journal of Electronic Testing. 30:149-154

مصطلحات موضوعية: Pulsed laser, Materials science, Proton, Nuclear Theory, Multiple methods, Calculated result, Electronic engineering, Physics::Accelerator Physics, Heavy ion, Transient (oscillation), Electrical and Electronic Engineering, Atomic physics, Nuclear Experiment, Event (particle physics), Pulse-width modulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::afc2bf5e811a529d49a36877fae21653
https://doi.org/10.1007/s10836-013-5431-7

المؤلفون: J. S. Gill, L. G. Pearce, F. C. Ballou, K. A. Scott, N. W. van Vonno

المصدر: 2016 IEEE Radiation Effects Data Workshop (REDW).

مصطلحات موضوعية: Engineering, Comparator, business.industry, Electrical engineering, Voltage regulator, Analog multiplier, law.invention, law, Modulation, Operational amplifier, Electronic engineering, Power MOSFET, business, Pulse-width modulation, Voltage reference

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8741b3e3d1d2c34fe06c2d166b07e654
https://doi.org/10.1109/nsrec.2016.7891711

المؤلفون: L. G. Pearce, A G Robinson, E. J. Thomson, N. W. van Vonno

المصدر: 2016 IEEE Radiation Effects Data Workshop (REDW).

مصطلحات موضوعية: Networking protocol, Engineering, business.industry, Event (computing), law, Total dose, Embedded system, Absorbed dose, Transceiver, Resistor, business, law.invention, CAN bus

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::556c6d652b1beb7b596b3943ccc6e447
https://doi.org/10.1109/nsrec.2016.7891744