-
1Academic Journal
المؤلفون: Lubaszewski, Marcelo Soares, Mir, Salvador, Kolarik, Vladimir, Nielsen, Christian, Courtois, Bernard
مصطلحات موضوعية: Boundary scan, Fully differential circuits, Mixedsignal test, Safety applications, Self-checking systems, Circuitos integrados, Microeletrônica
وصف الملف: application/pdf
Relation: IEEE transactions on very large scale integration (VLSI) systems. New York, N. Y. Vol. 8, no. 2 (Apr. 2000), p. 113-128; http://hdl.handle.net/10183/27566; 000295747
الاتاحة: http://hdl.handle.net/10183/27566
-
2
المؤلفون: Salvador Mir, V. Kolarik, Marcelo Lubaszewski, Bernard Courtois, C. Nielsen
المساهمون: DELET, Univ. Federal do Rio Grande do Sul (UFRGS), Univ. Federal do Rio Grande do Sul, Porto Alegre, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2000, 8(2): April, pp.113-28. ⟨10.1109/92.831432⟩
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 1999, 2, pp.1058-1061 vol.2. ⟨10.1109/92.831432⟩
Repositório Institucional da UFRGS
Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGSمصطلحات موضوعية: Engineering, Boundary scan, switched-capacitor-biquadratic-filter, IEEE-Std.-1149.1-digital-test-bus, 02 engineering and technology, analog-linear-circuits, hard-fault-model, 0202 electrical engineering, electronic engineering, information engineering, erroneous-behavior, strongly-code-disjoint, Self-checking systems, Electronic circuit, double-rail-error-indication, Mixed-signal integrated circuit, linear-FD-implementations, output-deviation, Microeletrônica, 020202 computer hardware & architecture, 310-Hz, Hardware and Architecture, Safety applications, PACS 85.42, design-methodology, 100-mV, Frequency band, Integrated circuit design, Electronic engineering, Common-mode signal, circuit-outputs, functional-block, Electrical and Electronic Engineering, self-checking-fully-differential-circuits, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Circuitos integrados, periodical-off-line-test, checker-threshold, business.industry, common-mode, soft-fault-model, Amplifier, 020208 electrical & electronic engineering, totally-self-checking-goal, 40-mV, mixed-signal-circuits, Clock feedthrough, Fully differential circuits, business, Software, Mixedsignal test, concurrent-monitoring
وصف الملف: application/pdf