المؤلفون: Asumi YAMADA, Hiroyuki OKADA, Hiroyuki TAMAKI, Masanori SAITO, Mitsuhiko IGARASHI, Takao KATO, Wataru ATSUTA, Yasuhisa SHINOZAKI, 五十嵐 三彦, 加藤 仁夫, 山田 明日美, 岡田 裕之, 熱田 亙, 玉木 大之, 篠崎 泰久, 齋藤 真規

المصدر: 日本口腔インプラント学会誌 / Journal of Japanese Society of Oral Implantology. 2022, 35(3):212

المؤلفون: Kazutoshi KOBAYASHI, Koji SHIBUTANI, Makoto YABUUCHI, Mitsuhiko IGARASHI, Yasumasa TSUKAMOTO, Yoshio TAKAZAWA, Yuuki UCHIDA

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2021, E104.A(11):1536

المؤلفون: Chiaki Komine, Hiroshi Murakami, Hiroya Gotouda, Hiroyuki Okada, Kentaro Igarashi, Megumi Fuse, Mitsuhiko Igarashi, Satoshi Uchibori, Tsuyoshi Kitagawa, Yasuhiko Kawai

المصدر: Journal of Oral Science. 2021, 63(1):92

المؤلفون: Hiroshi MURAKAMI, Hiroshi SUKEGAWA, Hiroyuki OKADA, Hiroyuki TAMAKI, Masanori SAITO, Mitsuhiko IGARASHI, Takao KATO, Toshiyuki MIZUGUCHI, 五十嵐 三彦, 加藤 仁夫, 助川 洋, 岡田 裕之, 村上 洋, 水口 稔之, 玉木 大之, 齋藤 真規

المصدر: 日本口腔インプラント学会誌 / Journal of Japanese Society of Oral Implantology. 2019, 32(4):324

المؤلفون: Aya Kitamura, Eiji Kitamura, Hiroshi Sukegawa, Hiroyuki Okada, Mitsuhiko Igarashi, Sen-Ichi Suzuki, Toshiyuki Mizuguchi, Yoshinori Tomomura, Yukie Takamura

المصدر: International Journal of Oral-Medical Sciences. 2018, 17(2):45

المؤلفون: Hiroyuki Okada, Masanori Saito, Mitsuhiko Igarashi, Takao Kato

المصدر: International Journal of Oral-Medical Sciences. 2018, 16(2):17

المؤلفون: Haruka Yanashima, Mitsuhiko Igarashi, Naomi Igarashi, 五十嵐 三彦, 五十嵐 尚美, 梁島 悠

المصدر: 老年歯科医学 / Ronen Shika Igaku. 2016, 31(2):141

المؤلفون: Hajime SAKURAI, Hiroyuki OKADA, Mitsuhiko IGARASHI, Naomi IGARASHI, Ryo TOYODA, Takao KATO, 五十嵐 三彦, 五十嵐 尚美, 加藤 仁夫, 岡田 裕之, 櫻井 甫, 豊田 亮

المصدر: 日本口腔インプラント学会誌 / Journal of Japanese Society of Oral Implantology. 2016, 29(1):20

المؤلفون: Mitsuhiko Igarashi

المصدر: International Journal of Oral-Medical Sciences. 2008, 7(1):7

المؤلفون: Kazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ebb38ceca20ce896f964da353eda85d6
https://doi.org/10.1109/irps48203.2023.10117873

المؤلفون: Yuuki Uchida, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi, Yoshio Takazawa, Mitsuhiko Igarashi, Makoto Yabuuchi

المصدر: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :1536-1545

مصطلحات موضوعية: Physics, Variation (linguistics), Applied Mathematics, Logic gate, Signal Processing, Electronic engineering, Static random-access memory, Ring oscillator, Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::06e79a94c7315a6c5d0cb4819c11ac77
https://doi.org/10.1587/transfun.2020kep0017

المؤلفون: Koji Shibutani, Yoshio Takazawa, Mitsuhiko Igarashi, Yuuki Uchida, Yasumasa Tsukamoto, Makoto Yabuuchi

المصدر: IRPS

مصطلحات موضوعية: Physics, Condensed matter physics, 020208 electrical & electronic engineering, 020206 networking & telecommunications, 02 engineering and technology, Ring oscillator, Standard deviation, Fin (extended surface), Square root, Temperature instability, Logic gate, 0202 electrical engineering, electronic engineering, information engineering, Static random-access memory, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::272c0d9011290b4893d8f18c1dfc6e8a
https://doi.org/10.1109/irps.2019.8720508

المؤلفون: Yasumasa Tsukamoto, Koji Shibutani, Koji Nii, Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa

المصدر: IRPS

مصطلحات موضوعية: Standard cell, Recovery effect, Reliability (semiconductor), Temperature instability, Logic gate, Ring oscillator, Maximum error, Reliability engineering, Mathematics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6848e7b47a46d2fe98682d7189320ba2
https://doi.org/10.1109/irps.2018.8353654

المؤلفون: Ryo Mori, Toshiharu Saito, Kazuki Fukuoka, Masaki Fujigaya, Toshihiro Hattori, Midori Nagayama, Mitsuhiko Igarashi, Takeshi Kataoka, Masaaki Taniguchi, Hiroshi Kishibe, Toshifumi Uemura, Koji Nii, Kohei Wakahara

المصدر: IEEE Journal of Solid-State Circuits. 50:92-101

مصطلحات موضوعية: Power management, Engineering, business.industry, Clock rate, Hardware_PERFORMANCEANDRELIABILITY, Threshold voltage, Dynamic demand, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, CPU core voltage, Static random-access memory, Electrical and Electronic Engineering, business, Voltage drop, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d04aac19b5a519ff1543deb8dfb771f
https://doi.org/10.1109/jssc.2014.2347353

المؤلفون: Yoshio Takazawa, Kan Takeuchi, Koji Shibutani, Yasumasa Tsukamoto, Mitsuhiko Igarashi

المصدر: A-SSCC

مصطلحات موضوعية: Standard cell, Materials science, Negative-bias temperature instability, business.industry, Transistor, NAND gate, Ring oscillator, law.invention, CMOS, law, Optoelectronics, Sensitivity (control systems), business, Miller effect

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ba664d1db99c23167810aeca80f2995
https://doi.org/10.1109/asscc.2017.8240251

المؤلفون: Hiroshi Murakami, Kentaro Igarashi, Megumi Fuse, Tsuyoshi Kitagawa, Mitsuhiko Igarashi, Satoshi Uchibori, Chiaki Komine, Hiroya Gotouda, Hiroyuki Okada, Yasuhiko Kawai, Murakami, Hiroshi, Igarashi, Kentaro, Fuse, Megumi, Kitagawa, Tsuyoshi, Igarashi, Mitsuhiko, Uchibori, Satoshi, Komine, Chiaki, Gotouda, Hiroya, Okada, Hiroyuki, Kawai, Yasuhiko

المصدر: Journal of Oral Science; 2021, Vol. 63 Issue 1, p92-97, 6p

مصطلحات موضوعية: MANDIBULAR fractures, PREOPERATIVE risk factors, LOGISTIC regression analysis, DENTAL implants, MANDIBLE, RETROSPECTIVE studies, COMPLICATIONS of prosthesis, LONGITUDINAL method

المؤلفون: Yuichiro Ishii, Makoto Yabuuchi, Miki Tanaka, Shinji Tanaka, Kazuki Fukuoka, Koji Nii, Mitsuhiko Igarashi

المصدر: 2016 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: Scheme (programming language), Power management, Engineering, Hardware_MEMORYSTRUCTURES, Thermal runaway, business.industry, CPU cache, Automotive industry, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Thermal control, 020202 computer hardware & architecture, Embedded system, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Static random-access memory, Standby power, business, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::61899756b02cbde7752985c1250607e5
https://doi.org/10.1109/vlsit.2016.7573395

المؤلفون: Yasuyuki Miyamoto, Mitsuhiko Igarashi, Kazuhito Furuya

المصدر: physica status solidi c. 5:70-73

مصطلحات موضوعية: Materials science, business.industry, Orders of magnitude (temperature), Intrinsic semiconductor, Transistor, Monte Carlo method, Biasing, Condensed Matter Physics, Cutoff frequency, law.invention, law, Optoelectronics, business, Current density, Common emitter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6951999d593f45a2f49e31c89cea7283
https://doi.org/10.1002/pssc.200776510

المؤلفون: Kazuhiro Tsukamoto, S. Imaoka, M. Inuishi, Tsutomu Yoshihara, Yasumasa Tsukamoto, Hirofumi Shinohara, H. Kawashima, Yasuo Yamaguchi, Makoto Yabuuchi, Y. Oda, Koichiro Ishibashi, Mitsuhiko Igarashi, M. Takeuchi, Shigeki Ohbayashi, H. Makino, Koji Nii

المصدر: IEEE Journal of Solid-State Circuits. 42:820-829

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, law.invention, Design for manufacturability, Nanoelectronics, CMOS, law, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, System on a chip, Static random-access memory, Electrical and Electronic Engineering, business, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fa2ac501b09dde208e5846e2cab9be0c
https://doi.org/10.1109/jssc.2007.891648

المؤلفون: Hiroaki Matsushita, Koji Shibutani, Kan Takeuchi, Takeshi Okagaki, Koji Nii, Mitsuhiko Igarashi

المصدر: ESSCIRC

مصطلحات موضوعية: Engineering, CMOS, business.industry, Electrical engineering, Optoelectronics, business, Die (integrated circuit), Fin (extended surface)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2b740b9c6d89268339622015474aab2b
https://doi.org/10.1109/esscirc.2015.7313841