المؤلفون: Yan, Zhixing, Liu, Gao, Qi, Nianzun, Nielsen, Morten Rahr, Jørgensen, Asger Bjørn, Meyer, Stefan, Rannestad, Bjørn, Bech, Michael Møller, Zhao, Hongbo, Munk-Nielsen, Stig

المصدر: Yan , Z , Liu , G , Qi , N , Nielsen , M R , Jørgensen , A B , Meyer , S , Rannestad , B , Bech , M M , Zhao , H & Munk-Nielsen , S 2024 , Design Consideration of an Isolated Gate Driver With Discrete Miller Clamp for Parallel Medium-Voltage SiC MOSFET Modules . in 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) . IEEE (Institute of Electrical and Electronics Engineers) , pp. 4649-4653 , 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) ....

مصطلحات موضوعية: Crosstalk, Gate Driver, Medium-Voltage, Miller Clamp, Parallel Devices, Silicon Carbide

وصف الملف: application/pdf

Relation: urn:ISBN:9798350351330

الاتاحة: https://vbn.aau.dk/da/publications/58aa87b6-b3ca-43b9-89b8-16f8da91abea
https://doi.org/10.1109/IPEMC-ECCEAsia60879.2024.10567193
https://vbn.aau.dk/ws/files/752255803/Design_Consideration_of_an_Isolated_Gate_Driver_With_Discrete_Miller_Clamp_for_Parallel_Medium-Voltage_SiC_MOSFET_Modules.pdf

المؤلفون: Ambegoda, Lahiru

المساهمون: Informaatioteknologian ja viestinnän tiedekunta - Faculty of Information Technology and Communication Sciences, Tampere University

مصطلحات موضوعية: active Miller clamp, double pulse testing, IGBT gate drivers, IGBT parasitic components, parasitic turn-on, unipolar supply, Master's Programme in Electrical Engineering, power electronics

وصف الملف: fulltext

Relation: https://trepo.tuni.fi/handle/10024/158893; URN:NBN:fi:tuni-202406167225

الاتاحة: https://trepo.tuni.fi/handle/10024/158893

المؤلفون: Curbow, William Austin

المصدر: Graduate Theses and Dissertations

مصطلحات موضوعية: gate signal modeling, die-to-die interactions, miller clamp, parameter variance, parasitic inductance, power packaging, SiC power module, Electronic Devices and Semiconductor Manufacturing, OS and Networks, Power and Energy, VLSI and Circuits, Embedded and Hardware Systems

وصف الملف: application/pdf

Relation: https://scholarworks.uark.edu/etd/3189; https://scholarworks.uark.edu/context/etd/article/4739/viewcontent/Curbow_uark_0011O_13421.pdf

الاتاحة: https://scholarworks.uark.edu/etd/3189
https://scholarworks.uark.edu/context/etd/article/4739/viewcontent/Curbow_uark_0011O_13421.pdf

المؤلفون: Gui, Yingying

Thesis Advisors: Electrical Engineering, Burgos, Rolando, Boroyevich, Dushan, Ngo, Khai D.

مصطلحات موضوعية: Gate driver design, Gallium nitride, Desaturation detection, Miller clamp, Shortcircuit robustness

وصف الملف: ETD; application/pdf

الاتاحة: http://hdl.handle.net/10919/83516