المؤلفون: Kenzo HIRAOKA, Mikio NARUSE, Yoshitoki IIJIMA, Yuji SAKAI, 境 悠治, 平岡 賢三, 成瀬 幹夫, 飯島 善時

المصدر: Ｘ線分析の進歩 / Advances in X-Ray Chemical Analysis, Japan. 2011, 42:221

المؤلفون: Kenzo HIRAOKA, Mikio NARUSE, Yoshitoki IIJIMA, Yuji SAKAI, 境 悠治, 平岡 賢三, 成瀬 幹夫, 飯島 善時

المصدر: Ｘ線分析の進歩 / Advances in X-Ray Chemical Analysis, Japan. 2012, 43:267

المؤلفون: Hiromitsu Furukawa, Hiroshi Jinnnai, Mikio Naruse, Miyoko Shimizu, Souhei Motoki, Toshio Nishi, Yukihiro Nisikawa, 元木 創平, 古河 弘光, 成瀬 幹夫, 清水 美代子, 西 敏夫, 西川 幸宏, 陣内 浩司

المصدر: Polymer Preprints, Japan. 2004, :4213

المؤلفون: Hideo NISHIOKA, Hiromitsu FURUKAWA, Katsumi KAWAMOTO, Mikio NARUSE, Miyoko SHIMIZU, Sohei MOTOKI, Yoshihiro OHKURA, 元木 創平, 古河 弘光, 大藏 善博, 川本 克巳, 成瀬 幹夫, 清水 美代子, 西岡 秀夫

المصدر: Polymer Preprints, Japan. 2004, :4211

المؤلفون: Kenzo HIRAOKA, Mikio NARUSE, Yoshitoki IIJIMA, Yuji SAKAI, 境 悠治, 平岡 賢三, 成瀬 幹夫, 飯島 善時

المصدر: 分析化学 / BUNSEKI KAGAKU. 2011, 60(1):51

المؤلفون: Kimiharu OKAMOTO, Mikio NARUSE

المصدر: Shinku. 1998, 41(11):921

المؤلفون: Mikio Naruse

المصدر: Okajimas Folia Anatomica Japonica. 1961, 37(4-5):291

المؤلفون: Yoshizo Kitami, Toshikatsu Kaneyama, Yoshio Bando, Yoshihiro Okura, Mikio Naruse, Masanori Mitome, Keiji Kurashima

المصدر: Microscopy of Semiconducting Materials 2001 ISBN: 9781351074629
Microscopy of Semiconducting Materials 2001
ResearcherID

مصطلحات موضوعية: Optics, Materials science, business.industry, Filter (video), law, Electron microscope, business, Omega, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b423f08a20a0b96cbf3b08e0693dfa91
https://doi.org/10.1201/9781351074629-9

المؤلفون: Toshihiko Kaneyama, Dmitri Golberg, Yoshihiro Okura, K. Kurashima, Mikio Naruse, Yoshizo Kitami, Masanori Mitome, M. Y. Bando

المصدر: Microscopy of Semiconducting Materials 2003 ISBN: 9781351074636

مصطلحات موضوعية: Materials science, Microscope, Electron, Molecular physics, Acceleration voltage, law.invention, Crystal, Transmission electron microscopy, law, visual_art, visual_art.visual_art_medium, Ceramic, Image resolution, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f8cb20a0c1bd2685d2ae8275a8592008
https://doi.org/10.1201/9781351074636-19

المؤلفون: Fumio Hosokawa, John L. Hutchison, Ron C. Doole, Takeshi Tomita, David J. H. Cockayne, Mikio Naruse, Nobuo Tanaka, C. J. D. Hetherington, Hidetaka Sawada, Toshikazu Honda, Peter Hartel, Toshikatsu Kaneyama, J.M. Titchmarsh, Max Haider, Angus I. Kirkland

مصطلحات موضوعية: Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e558de5ebc3ce8d4124fe81e7bf16ae8
https://ora.ox.ac.uk/objects/uuid:61007381-13aa-4da2-9c41-8cc5f3b44189

المؤلفون: Zentaro Akase, Daisuke Shindo, Takeshi Tomita, Yasukazu Murakami, Mikio Naruse, Masao Inoue

المصدر: Journal of Electron Microscopy. 54:509-513

مصطلحات موضوعية: Physics, Magnetic domain, Condensed matter physics, business.industry, Electron holography, Magnetic flux, Magnetic field, Magnetization, Optics, Domain wall (magnetism), Distortion, Magnet, business, Instrumentation, Computer Science::Databases

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5459a73ea92c1a2952a9f28c2a93443d
https://doi.org/10.1093/jmicro/dfi068

المؤلفون: Mikio Naruse, Keiji Kurashima, Masanori Mitome, Toshikatsu Kaneyama, Yoshio Bando, Dmitri Golberg, Yoshiaki Honda, Yoshihiro Okura

المصدر: Microscopy Research and Technique. 63:140-148

مصطلحات موضوعية: Conventional transmission electron microscope, Histology, Microscope, business.industry, Chemistry, Resolution (electron density), Low-voltage electron microscope, Nanotechnology, law.invention, Medical Laboratory Technology, Optics, law, Scanning transmission electron microscopy, Anatomy, Electron microscope, business, High-resolution transmission electron microscopy, Instrumentation, Image resolution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b5dc6fd84956955c034af3f1d61054f
https://doi.org/10.1002/jemt.20025

المؤلفون: Nobuo Tanaka, Kanji Yamada, Tokushi Kizuka, Shunji Deguchi, Mikio Naruse

المصدر: Journal of Electron Microscopy. 46:151-160

مصطلحات موضوعية: High resolution electron microscopy, Materials science, Surface scanning, Scanning confocal electron microscopy, Solid-state, Nanotechnology, Direct bonding, Instrumentation, Atomic units

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::797af5021e1e442534ca5dcc4845b014
https://doi.org/10.1093/oxfordjournals.jmicro.a023502

المؤلفون: Yasukazu Murakami, Zentaro Akase, Masao Inoue, K Tomita, Daisuke Shindo, Mikio Naruse

المصدر: Microscopy and Microanalysis. 11

مصطلحات موضوعية: In situ, Physics, Magnetic domain, Condensed matter physics, Lorentz microscopy, Stage (hydrology), Instrumentation, Electron holography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::09b290e819c865b5caf76a2e7191bc1f
https://doi.org/10.1017/s143192760550309x

المؤلفون: Takeshi Tomita, Peter Hartel, Fumio Hosokawa, Toshikazu Honda, Max Haider, Mikio Naruse

المصدر: Journal of electron microscopy. 52(1)

مصطلحات موضوعية: Physics, Microscope, business.industry, Resolution (electron density), law.invention, Lens (optics), Third order, Spherical aberration, Optics, law, Position (vector), business, Instrumentation, Single crystal, Yoke

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d3b99a2563f27be4985b842595d898a7
https://pubmed.ncbi.nlm.nih.gov/12741482

المؤلفون: Nobuo Tanaka, Shunji Deguchi, Mikio Naruse, Tokushi Kizuka

المصدر: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 4(3)

مصطلحات موضوعية: Conventional transmission electron microscope, Materials science, business.industry, Scanning confocal electron microscopy, Analytical chemistry, Dark field microscopy, Scanning probe microscopy, Electron tomography, Scanning transmission electron microscopy, Optoelectronics, Energy filtered transmission electron microscopy, High-resolution transmission electron microscopy, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4aa1c51a1a3cfb6b95e4ec8d4c250ab
https://pubmed.ncbi.nlm.nih.gov/9767658

المؤلفون: Toshikazu Honda, K Omoto, Michiyoshi Tanaka, Kenji Tsuda, Wataru Inami, Takeshi Tomita, Katsushige Tsuno, Masaki Mukai, Toshikatsu Kaneyama, Mikio Naruse, Masami Terauchi

المصدر: Microscopy and Microanalysis. 12:1206-1207

مصطلحات موضوعية: Conventional transmission electron microscope, Microscope, Materials science, business.industry, Scanning electron microscope, Low-voltage electron microscope, law.invention, Optics, law, Scanning transmission electron microscopy, 4Pi microscope, Electron microscope, business, Instrumentation, Environmental scanning electron microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::78864d991ccb23a1a5fcb2929976744b
https://doi.org/10.1017/s1431927606064816

المؤلفون: Katsushige Tsuno, Michiyoshi Tanaka, Kenji Tsuda, Takeshi Tomita, Mikio Naruse, Toshikatsu Kaneyama, Genovera Martinez, Toshikazu Honda, Damaschin Ioanoviciu, Masami Terauchi, Masaki Mukai

المصدر: Microscopy and Microanalysis. 10:858-859

مصطلحات موضوعية: Conventional transmission electron microscope, Microscope, Materials science, business.industry, Low-voltage electron microscope, law.invention, Optics, law, Scanning transmission electron microscopy, 4Pi microscope, Electron microscope, Electron beam-induced deposition, business, Instrumentation, Environmental scanning electron microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2598db912e9539826ec107f70e663954
https://doi.org/10.1017/s1431927604883648

المؤلفون: David J. H. Cockayne, Ron C. Doole, J.M. Titchmarsh, Peter Hartel, Hidetaka Sawada, Angus I. Kirkland, Mikio Naruse, Takeshi Tomita, C. J. D. Hetherington, Toshikazu Honda, John L. Hutchison, Max Haider

المصدر: Microscopy and Microanalysis. 10:1004-1005

مصطلحات موضوعية: Materials science, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c27a1218c01a4fce05cba6e54f443942
https://doi.org/10.1017/s1431927604884897

المؤلفون: S. Deguchi, Kimiharu Okamoto, M. Kersker, Mikio Naruse, K. Hasegawa, M. Kawazoe, Y. Ohkura

المصدر: Microscopy and Microanalysis. 9:1272-1273

مصطلحات موضوعية: Materials science, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7885e567f9180ce8ccb054da6bba1991
https://doi.org/10.1017/s1431927603446369