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المؤلفون: Viðarsson, Arnar
المساهمون: Einar Örn Sveinbjörnsson, Raunvísindadeild (HÍ), Faculty of Physical Sciences (UI), Verkfræði- og náttúruvísindasvið (HÍ), School of Engineering and Natural Sciences (UI), Háskóli Íslands, University of Iceland
مصطلحات موضوعية: Aluminium Nitride (AlN), Metal-Insulator-Semiconductor (MIS) Capacitor, Metal-Oxide-Semiconductor-Field-Effect- Transistor (MOSFET), Silicon Dioxide (SiO2), High Power Electronics, Silicon Carbide (SiC), Thermal Dielectric Relaxation Current (TDRC), Metal-Oxide- Semiconductor (MOS) Capacitor, Capacitance Voltage (CV), Doktorsritgerðir, Conductance Spectroscopy, Aluminium Oxide (Al2O3), High-κ Dielectrics, Eðlisfræði
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2Dissertation/ Thesis
المؤلفون: Viðarsson, Arnar
المساهمون: Einar Örn Sveinbjörnsson, Raunvísindadeild (HÍ), Faculty of Physical Sciences (UI), Verkfræði- og náttúruvísindasvið (HÍ), School of Engineering and Natural Sciences (UI), Háskóli Íslands, University of Iceland
مصطلحات موضوعية: Silicon Carbide (SiC), Silicon Dioxide (SiO2), Aluminium Nitride (AlN), Aluminium Oxide (Al2O3), High-κ Dielectrics, High Power Electronics, Metal-Insulator-Semiconductor (MIS) Capacitor, Metal-Oxide- Semiconductor (MOS) Capacitor, Metal-Oxide-Semiconductor-Field-Effect- Transistor (MOSFET), Capacitance Voltage (CV), Conductance Spectroscopy, Thermal Dielectric Relaxation Current (TDRC), Eðlisfræði, Doktorsritgerðir
Relation: https://hdl.handle.net/20.500.11815/4155