المؤلفون: Savinsky, N. G., Melesov, N. S., Parshin, E. O., Vasiliev, S. V., Bachurin, V. I., Churilov, A. B.

المصدر: Bulletin of the Russian Academy of Sciences: Physics; Jun2020, Vol. 84 Issue 6, p732-735, 4p

المؤلفون: Bachurin, V. I.¹ (AUTHOR) vibachurin@mail.ru, Melesov, N. S.¹ (AUTHOR), Parshin, E. O.¹ (AUTHOR), Rudy, A. S.¹ (AUTHOR), Churilov, A. B.¹ (AUTHOR)

المصدر: Technical Physics Letters. Jun2019, Vol. 45 Issue 6, p609-612. 4p.

مصطلحات موضوعية: *RUTHERFORD backscattering spectrometry, *THIN films, *DEPTH profiling, *MULTILAYERED thin films, *ATOMIC mass, *QUALITY control

المؤلفون: Bachurin, V. I., Melesov, N. S., Mironenko, A. A., Parshin, E. O., Rudy, A. S., Simakin, S. G., Churilov, A. B.

المصدر: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Mar2019, Vol. 13 Issue 2, p300-305, 6p

المؤلفون: Sobolev, N. A., Kalyadin, A. E., Sakharov, V. I., Serenkov, I. T., Shek, E. I., Parshin, E. O., Melesov, N. S., Simakin, C. G.

المصدر: Semiconductors; Feb2019, Vol. 53 Issue 2, p156-159, 4p

مصطلحات موضوعية: GERMANIUM, LUMINESCENCE, PHOTOLUMINESCENCE, IONS, CHLORINE, SOLID solutions, SILICON

المؤلفون: Sobolev, N. A., Aleksandrov, O. V., Sakharov, V. I., Serenkov, I. T., Shek, E. I., Kalyadin, A. E., Parshin, E. O., Melesov, N. S.

المصدر: Semiconductors; Feb2019, Vol. 53 Issue 2, p153-155, 3p

مصطلحات موضوعية: GERMANIUM, SILICON, IONS, AMORPHIZATION, ANNEALING of metals, SEMIMETALS