المؤلفون: Basolo, S., Berar, J.-F., Boudet, N., Breugnon, P., Caillot, B., Clemens, J.-C., Delpierre, P., Dinkespiler, B., Koudobine, I., Meessen, Ch., Menouni, M., Mouget, Ch., Pangaud, P., Potheau, R., Vigeolas, E.

المصدر: IEEE Symposium Conference Record Nuclear Science 2004. ; volume 7, page 4388-4391

الاتاحة: http://dx.doi.org/10.1109/nssmic.2004.1466858
http://xplorestaging.ieee.org/ielx5/9892/31439/01466858.pdf?arnumber=1466858

المؤلفون: Bérar, Jean-François, Boudet, Nathalie, Breugnon, P., Caillot, Bernard, Chantepie, B., Clemens, J.-C., Delpierre, P., Dinkespiller, B., Godiot, S., Meessen, Ch., Menouni, M., Morel, C., Pangaud, P., Vigeolas, E., Hustache, S., Medjoubi, K.

المساهمون: CRG & Grands instruments (NEEL - CRG), Institut Néel (NEEL), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS), Centre de Physique des Particules de Marseille (CPPM), Aix Marseille Université (AMU)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), imXgam

المصدر: ISSN: 0168-9002 ; EISSN: 1872-9576.

مصطلحات موضوعية: X-ray diffraction, Pixel, Small angle X-ray scattering, Synchrotron, Detector, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SDV.IB.IMA]Life Sciences [q-bio]/Bioengineering/Imaging

الاتاحة: https://in2p3.hal.science/in2p3-00379416
https://doi.org/10.1016/j.nima.2009.03.208

المؤلفون: Basolo, S., Berar, J.-F., Boudet, N., Breugnon, P., Caillot, B., Clemens, J.-C., Delpierre, P., Dinkespiler, B., Koudobine, I., Meessen, Ch., Menouni, M., Mouget, C., Pangaud, P., Potheau, R., Vigeolas, E.

المصدر: IEEE Symposium Conference Record Nuclear Science 2004; 2004, p4388-4391, 4p

المؤلفون: Basolo, S., Bérar, J.-F., Boudet, N., Breugnon, P., Caillot, B., Clemens, J.-C., Delpierre, P., Dinkespiler, B., Hustache, S., Koudobine, I., Meessen, Ch., Menouni, M., Mouget, C., Palancher, H., Pangaud, P., Potheau, R., Vigeolas, E.

المصدر: Journal of Synchrotron Radiation; Jan2007, Vol. 14 Issue 1, p151-157, 7p, 2 Color Photographs, 1 Diagram, 2 Charts, 5 Graphs

مصطلحات موضوعية: PHOTON detectors, DIFFRACTION patterns, OPTICAL properties of powders, PIXELS, ZEOLITES, X-rays, SEMICONDUCTORS