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1Academic Journal
المؤلفون: Claus Richter, Karl-heinz Leitz, Markus C. Knauer
المساهمون: The Pennsylvania State University CiteSeerX Archives
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.575.9840; http://www.optik.uni-erlangen.de/osmin/research/download.php?papid=137
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2Academic Journal
المؤلفون: Markus C. Knauer
المساهمون: The Pennsylvania State University CiteSeerX Archives
مصطلحات موضوعية: Optical metrology, surface normal, deflectometry, specular surfaces, calibration, stereo
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.602.1905; http://www.optik.uni-erlangen.de/osmin/upload/pdf/MCK_PMD_photonics04.pdf
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3
المؤلفون: Markus C. Knauer, Jürgen Kaminski, Claus Richter, Odrej Hybl, Christian Faber, Gerd Häusler
المصدر: tm - Technisches Messen. 76:175-181
مصطلحات موضوعية: Optics, Materials science, business.industry, Surface measurement, Specular surface, Electrical and Electronic Engineering, business, Instrumentation
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4
المؤلفون: Markus C. Knauer, Claus Richter, Gerd Häusler
المصدر: Laser Technik Journal. 3:33-37
مصطلحات موضوعية: Habitat, Computer science, Computer Science::Networking and Internet Architecture, ComputerSystemsOrganization_SPECIAL-PURPOSEANDAPPLICATION-BASEDSYSTEMS, 3d sensor, Natural (archaeology), Remote sensing, Variety (cybernetics)
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5
المؤلفون: K. Veit, Markus C. Knauer, Gerd Häusler, C. Kranitzky, Christian Faber, S. Peterhänsel, Claus Richter
المصدر: Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest.
مصطلحات موضوعية: Physics, Computer science, business.industry, Physicist, Metrology, Interferometry, Optics, Simplicity (photography), Scalability, Metre, Nanometre, Point (geometry), business, Digital holography, Source encoding
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6
المؤلفون: Markus C. Knauer, Claus Richter, Christian Faber, Gerd Häusler, Klaus Veit, S. Peterhänsel, C. Kranitzky
المصدر: Fringe 2009 ISBN: 9783642030505
مصطلحات موضوعية: Optics, Materials science, Fringe pattern, business.industry, Metre, Nanometre, Optical power, High numerical aperture, business, Metrology
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7
المؤلفون: Svenja Ettl, Jürgen Kaminski, Gerd Häusler, Markus C. Knauer
المصدر: Applied optics. 47(12)
مصطلحات موضوعية: Computer science, Materials Science (miscellaneous), FOS: Physical sciences, Object (computer science), Measure (mathematics), Industrial and Manufacturing Engineering, Information efficiency, Numerical integration, Robustness (computer science), Radial basis function, Sensitivity (control systems), Business and International Management, Shape reconstruction, Algorithm, Optics (physics.optics), Physics - Optics
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8
المؤلفون: Markus C. Knauer, Gerd Häusler, Svenja Lowitzsch, Jürgen Kaminski
المصدر: Fringe 2005 ISBN: 3540260374
مصطلحات موضوعية: Physics, Optics, business.industry, Computer graphics (images), Full field, Specular reflection, business
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9
المؤلفون: Markus C. Knauer, Jürgen Kaminski, Gerd Häusler
المصدر: Optical Metrology in Production Engineering.
مصطلحات موضوعية: Surface (mathematics), Physics, Optics, business.industry, Measuring principle, Measure (physics), Phase (waves), Calibration, Specular reflection, Curvature, business, Normal
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10
المؤلفون: Gerd Haeusler, Markus C. Knauer, Peter Andretzky, F. Kiesewetter
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, White light interferometry, genetic structures, medicine.diagnostic_test, Spectrometer, business.industry, Signal, law.invention, Interferometry, Optics, Signal-to-noise ratio, Optical coherence tomography, law, Astronomical interferometer, medicine, Radar, business
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11Academic Journal
المؤلفون: Svenja Lowitzsch, Jürgen Kaminski, Markus C. Knauer, Gerd Häusler
المساهمون: The Pennsylvania State University CiteSeerX Archives
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.330.8149; http://www.optik.uni-erlangen.de/osmin/research/download.php?papid=110
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12Academic Journal
المؤلفون: Markus C. Knauer, Claus Richter, Peter Vogt, Gerd Häusler
المساهمون: The Pennsylvania State University CiteSeerX Archives
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.575.5092; http://www.dgao-proceedings.de/download/109/109_a24.pdf
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13Academic Journal
المؤلفون: Svenja Ettl, Jürgen Kaminski, Markus C. Knauer, Gerd Häusler
المساهمون: The Pennsylvania State University CiteSeerX Archives
المصدر: http://arxiv.org/pdf/0710.4278v1.pdf.
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.248.5568; http://arxiv.org/pdf/0710.4278v1.pdf
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14Academic Journal
المؤلفون: Gerd Häusler, Claus Richter, Karl-heinz Leitz, Markus C. Knauer
المساهمون: The Pennsylvania State University CiteSeerX Archives
المصدر: http://arxiv.org/pdf/0710.4505v2.pdf.
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.248.3964; http://arxiv.org/pdf/0710.4505v2.pdf
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15Academic Journal
المؤلفون: Gerd Häusler, Claus Richter, Karl-heinz Leitz, Markus C. Knauer
المساهمون: The Pennsylvania State University CiteSeerX Archives
المصدر: http://arxiv.org/pdf/0710.4505v1.pdf.
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.246.3173; http://arxiv.org/pdf/0710.4505v1.pdf
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16
المؤلفون: Karl-Heinz Leitz, Claus Richter, Gerd Häusler, Markus C. Knauer
المصدر: Optics Letters. 33:396
مصطلحات موضوعية: Novel technique, Optics, Materials science, business.industry, Resolution (electron density), Nanometre, Sensitivity (control systems), Depth of field, Lateral resolution, Specular reflection, business, Atomic and Molecular Physics, and Optics, Information efficiency