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1Report
المؤلفون: Chouprik, Anastasia, Guberna, Elizaveta, Mutaev, Islam, Margolin, Ilya, Guberna, Evgeny, Rybin, Maxim
مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Mesoscale and Nanoscale Physics
URL الوصول: http://arxiv.org/abs/2501.05877
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2Academic Journal
المؤلفون: Chouprik, Anastasia, Mikheev, Vitalii, Margolin, Ilya, Kalika, Elizaveta, Spiridonov, Maxim, Negrov, Dmitrii
المساهمون: Russian Science Foundation
المصدر: Advanced Electronic Materials ; volume 10, issue 5 ; ISSN 2199-160X 2199-160X
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3Academic Journal
المؤلفون: Guberna, Elizaveta, Margolin, Ilya, Kalika, Elizaveta, Zarubin, Sergei, Zhuk, Maksim, Chouprik, Anastasia
المصدر: ACS Applied Materials & Interfaces; 1/10/2024, Vol. 16 Issue 1, p975-984, 10p
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4Academic Journal
المؤلفون: Guberna, Elizaveta, Margolin, Ilya, Kalika, Elizaveta, Zarubin, Sergei, Zhuk, Maksim, Chouprik, Anastasia
المساهمون: Russian Science Foundation, Ministry of Science and Higher Education of the Russian Federation
المصدر: ACS Applied Materials & Interfaces ; volume 16, issue 1, page 975-984 ; ISSN 1944-8244 1944-8252
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5Academic Journal
المؤلفون: Margolin, Ilya1 (AUTHOR), Korostylev, Evgeny1 (AUTHOR), Kalika, Elizaveta1 (AUTHOR), Negrov, Dmitrii1 (AUTHOR), Chouprik, Anastasia1 (AUTHOR) chouprik.aa@mipt.ru
المصدر: Acta Materialia. Jan2025, Vol. 284, pN.PAG-N.PAG. 1p.
مصطلحات موضوعية: *HAFNIUM oxide films, *HAFNIUM oxide, *SMART materials, *INDUSTRIAL electronics, *CRYSTAL lattices
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6Academic Journal
المؤلفون: Guberna, Elizaveta, Chouprik, Anastasia, Kirtaev, Roman, Zarubin, Sergei, Margolin, Ilya, Spiridonov, Maxim, Negrov, Dmitrii
المساهمون: Russian Science Foundation
المصدر: physica status solidi (RRL) – Rapid Research Letters ; volume 16, issue 2 ; ISSN 1862-6254 1862-6270
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8
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9Academic Journal
المؤلفون: Guberna, Elizaveta, Chouprik, Anastasia, Kirtaev, Roman, Zarubin, Sergei, Margolin, Ilya, Spiridonov, Maxim, Negrov, Dmitrii
المصدر: Physica Status Solidi - Rapid Research Letters; Feb2022, Vol. 16 Issue 2, p1-11, 11p
مصطلحات موضوعية: ION implantation, PIEZORESPONSE force microscopy, HAFNIUM oxide, ION sources, ION beams, RAPID thermal processing, ION bombardment, FERROELECTRIC thin films