المؤلفون: Cancelliere, Rocco, Molinara, Mario, Licheri, Antonio, Maffucci, Antonio, Micheli, Laura

المساهمون: Ministero dell'Università e della Ricerca

المصدر: Digital Discovery ; ISSN 2635-098X

الاتاحة: https://doi.org/10.1039/d4dd00318g
http://pubs.rsc.org/en/content/articlepdf/2025/DD/D4DD00318G

المؤلفون: Capua, Giulia Di, Porpora, Francesco, Milano, Filippo, Oliva, Nunzio, Maffucci, Antonio

المساهمون: Capua, Giulia Di, Porpora, Francesco, Milano, Filippo, Oliva, Nunzio, Maffucci, Antonio

مصطلحات موضوعية: Li-ion batterie, Behavioral Modeling, Genetic Programming, Multi-Objective Optimization

Relation: volume:12; firstpage:108275; lastpage:108290; numberofpages:16; journal:IEEE ACCESS; https://hdl.handle.net/11580/108963; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85200254342

الاتاحة: https://hdl.handle.net/11580/108963
https://doi.org/10.1109/access.2024.3434716

المؤلفون: chiariello, andrea gaetano, Di Capua, Giulia, Maffucci, Antonio, Femia, Nicola

المصدر: SPI, 2024 IEEE 28th Workshop on Signal and Power Integrity, Lisbon, Portugal, 12-15 May 2024

Relation: https://doi.org/10.1109/SPI60975.2024.10539215; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.13898934; https://doi.org/10.5281/zenodo.13898935; oai:zenodo.org:13898935

الاتاحة: https://doi.org/10.5281/zenodo.13898935

المؤلفون: Phung, Gia Ngoc, Arz, Uwe, Pham, Thi Dao, Allal, Djamel, Lahbacha, Khitem, Miele, Gianfranco, Maffucci, Antonio

المصدر: IEEE SPI, 2023 IEEE 27th Workshop on Signal and Power Integrity, Aveiro (Portugal), 07-10 May 2023

مصطلحات موضوعية: thin-film microstriplines, parasitic effects, EM simulations

Relation: https://doi.org/10.1109/SPI57109.2023.10145555; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.10548538; https://doi.org/10.5281/zenodo.10548539; oai:zenodo.org:10548539

الاتاحة: https://doi.org/10.5281/zenodo.10548539

المؤلفون: Di Capua Giulia, Maffucci Antonio, Capriglione Domenico, Di Mambro Gennaro, Femia Nicola, Oliva Nunzio, De Guglielmo Luca

المساهمون: IEEE, DI CAPUA, Giulia, Maffucci, Antonio, Capriglione, Domenico, DI MAMBRO, Gennaro, Femia, Nicola, Oliva, Nunzio, De Guglielmo, Luca

مصطلحات موضوعية: Behavioral Modeling, Electromagnetic Compatibility, Finite Element Analysi, Measurement, Mutual Inductance, Wireless Power Transfer

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-7053-9; ispartofbook:2024 IEEE International Symposium on Measurements and Networking, M and N 2024 - Proceedings; 7th IEEE International Symposium on Measurements and Networking, M and N 2024; volume:1; firstpage:1; lastpage:6; numberofpages:6; https://hdl.handle.net/11580/110063; https://ieeexplore.ieee.org/document/10615335

الاتاحة: https://hdl.handle.net/11580/110063
https://doi.org/10.1109/MN60932.2024.10615335
https://ieeexplore.ieee.org/document/10615335

المؤلفون: Chiariello Andrea Gaetano, Di Capua Giulia, Maffucci Antonio, Femia Nicola

المساهمون: IEEE, Chiariello Andrea, Gaetano, Di Capua, Giulia, Maffucci, Antonio, Femia, Nicola

مصطلحات موضوعية: Coupling, Crosstalk, EM modeling, Signal Integrity, Switch mode power supply, Transmission line models

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-8293-8; info:eu-repo/semantics/altIdentifier/wos/WOS:001239294400023; ispartofbook:SPI 2024 - 28th IEEE Workshop on Signal and Power Integrity, Proceedings; 28th IEEE Workshop on Signal and Power Integrity, SPI 2024; volume:PP; firstpage:1; lastpage:4; numberofpages:4; https://hdl.handle.net/11386/4887505; https://ieeexplore.ieee.org/document/10539215

الاتاحة: https://hdl.handle.net/11386/4887505
https://doi.org/10.1109/SPI60975.2024.10539215
https://ieeexplore.ieee.org/document/10539215

المؤلفون: Di Tinno, Alessio, Cancelliere, Rocco, Mantegazza, Pietro, Cataldo, Antonino, Paddubskaya, Alesia, Ferrigno, Luigi, Kuzhir, Polina, Maksimenko, Sergey, Shuba, Mikhail, Maffucci, Antonio, Bellucci, Stefano, Micheli, Laura

المساهمون: Di Tinno, Alessio, Cancelliere, Rocco, Mantegazza, Pietro, Cataldo, Antonino, Paddubskaya, Alesia, Ferrigno, Luigi, Kuzhir, Polina, Maksimenko, Sergey, Shuba, Mikhail, Maffucci, Antonio, Bellucci, Stefano, Micheli, Laura

مصطلحات موضوعية: carbon-based nanomaterial, graphene nanoplatelet, organic pollutant, quinone, screen-printed electrode, voltammetry

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/pmid/35631001; info:eu-repo/semantics/altIdentifier/wos/WOS:000801804400001; volume:12; issue:10; journal:NANOMATERIALS; info:eu-repo/grantAgreement/EC/H2020/823878; http://hdl.handle.net/11580/91379; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85132070063

الاتاحة: http://hdl.handle.net/11580/91379
https://doi.org/10.3390/nano12101779

المؤلفون: Molinara, Mario, Cancelliere, Rocco, Di Tinno, Alessio, Ferrigno, Luigi, Shuba, Mikhail, Kuzhir, Polina, Maffucci, Antonio, Micheli, Laura

المساهمون: Molinara, Mario, Cancelliere, Rocco, Di Tinno, Alessio, Ferrigno, Luigi, Shuba, Mikhail, Kuzhir, Polina, Maffucci, Antonio, Micheli, Laura

مصطلحات موضوعية: carbon nanotube, convolutional neural network, cyclic voltammetry, pollutant detection, screen-printed electrode, Hydroquinone, Water, Benzoquinone, Nanotubes, Carbon, Deep Learning, Environmental Pollutants

Relation: info:eu-repo/semantics/altIdentifier/pmid/36298383; info:eu-repo/semantics/altIdentifier/wos/000873710100001; volume:22; issue:20; journal:SENSORS; info:eu-repo/grantAgreement/EC/H2020/823878; https://hdl.handle.net/11580/94501; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85140648052

الاتاحة: https://hdl.handle.net/11580/94501
https://doi.org/10.3390/s22208032

المؤلفون: Lahbacha, Khitem, Di Capua, Giulia, Miele, Gianfranco, Maffucci, Antonio, Pham, Thi Do, Allal, Djamel, Phung, Gia Ngoc, Arz, Uwe

المصدر: IEEE SPI 2023, 2023 IEEE 27th Workshop on Signal and Power Integrity, Aveiro (Portugal), 07-10 May 2023

Relation: https://doi.org/10.1109/SPI57109.2023.10145525; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.10548982; https://doi.org/10.5281/zenodo.10548983; oai:zenodo.org:10548983

الاتاحة: https://doi.org/10.5281/zenodo.10548983

المؤلفون: Lahbacha, Khitem, Maffucci, Antonio

المصدر: 2024 IEEE 8th Forum on Research and Technologies for Society and Industry Innovation (RTSI) ; page 243-247

الاتاحة: http://dx.doi.org/10.1109/rtsi61910.2024.10761874
http://xplorestaging.ieee.org/ielx8/10761112/10761063/10761874.pdf?arnumber=10761874

المؤلفون: Pham, Thi Dao, Ngoc Phung, Gia, Lahbacha, Khitem, Maffucci, Antonio, Miele, Gianfranco, Arz, Uwe, Allal, Djamel

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10646002
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646002.pdf?arnumber=10646002

المؤلفون: Capua, Giulia Di, Maffucci, Antonio, Femia, Nicola, Chiariello, Andrea Gaetano

المصدر: 2024 20th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/smacd61181.2024.10745380
http://xplorestaging.ieee.org/ielx8/10745284/10745377/10745380.pdf?arnumber=10745380

المؤلفون: Lahbacha, Khitem, Di Capua, Giulia, Miele, Gianfranco, Maffucci, Antonio, Chiariello, Andrea Gaetano, Pham, Thi Dao, Allal, Djamel

المساهمون: European Union

المصدر: 2024 IEEE International Symposium on Measurements & Networking (M&N) ; page 1-6

الاتاحة: http://dx.doi.org/10.1109/mn60932.2024.10615657
http://xplorestaging.ieee.org/ielx8/10615257/10615262/10615657.pdf?arnumber=10615657

المؤلفون: Baah, Marian, Rahman, Afifa, Sibilia, Sarah, Trezza, Gianmarco, Ferrigno, Luigi, Micheli, Laura, Maffucci, Antonio, Soboleva, Ekaterina, Svirko, Yuri, Kuzhir, Polina

المساهمون: Department of Physics and Mathematics, activities

مصطلحات موضوعية: graphitic films, electrical impedance spectroscopy, environmental sensor

Relation: Nanotechnology; http://dx.doi.org/10.1088/1361-6528/ac3861; 075207; 33; https://erepo.uef.fi/handle/123456789/26788

الاتاحة: https://erepo.uef.fi/handle/123456789/26788

المؤلفون: Delgado, Alberto, Di Capua, Giulia, Stoyka, Kateryna, Shi, Lixin, Femia, Nicola, Maffucci, Antonio, Ventre, Salvatore, Alou, Pedro, Oliver, Jesus Angel, Cobos, Jose Antonio

المساهمون: University of Salerno through the Project “Sistemi di Carica Induttiva di Veicoli Elettrici”

المصدر: IEEE Access ; volume 10, page 7476-7488 ; ISSN 2169-3536

الاتاحة: http://dx.doi.org/10.1109/access.2021.3138239
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09663390.pdf?arnumber=9663390

المؤلفون: Lagouanelle, Paul, Di Capua, Giulia, Femia, Nicola, Freschi, Fabio, Maffucci, Antonio, Pichon, Lionel, Ventre, Salvatore

المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Dipartimento di Energia Torino (DENERG), Politecnico di Torino = Polytechnic of Turin (Polito), Dipartimento di Ingegneria Elettrica e dell'Informazione "Maurizio Scarano" Cassino (DIEI), University of Cassino and Southern Lazio Cassino, Department of Information Engineering, Electrical Engineering and Applied Mathematics (DIEM), Università degli Studi di Salerno = University of Salerno (UNISA)

المصدر: International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design ; https://hal.science/hal-03296266 ; International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2021, Erfurt (virtual), Germany

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Erfurt (virtual), Germany

الاتاحة: https://hal.science/hal-03296266
https://hal.science/hal-03296266v1/document
https://hal.science/hal-03296266v1/file/SMACD_Mutual_inductance_article.pdf

المؤلفون: Lahbacha, Khitem, Ngoc Phung, Gia, Dao Pham, Thi, Arz, Uwe, Di Capua, Giulia, Maffucci, Antonio, Miele, Gianfranco, Allal, Djamel

المصدر: Components, Packaging, and Manufacturing Technology, IEEE Transactions on; November 2024, Vol. 14 Issue: 11 p2032-2042, 11p

المؤلفون: Allal, Djamel, Bannister, Richard, Buisman, Koen, Capriglione, Domenico, Di Capua, Giulia, Garcia-Patron, Martin, Gatzweiler, Thomas, Gellersen, Frauke, Harzheim, Thomas, Heuermann, Holger, Hoffmann, Johannes, Izbrodin, Alexander, Kuhlmann, Karsten, Lahbacha, Khitem, Maffucci, Antonio, Miele, Gianfranco, Mubarak, Faisal, Salter, Martin, Pham, Thi-Dao, Sayegh, Ahmed, Singh, Dilbagh, Stein, Friederike, Zeier, Markus

المصدر: 2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, 18-20 July 2022

مصطلحات موضوعية: FPGA, Signal Integrity, Power Integrity, Passive Inter-Modulation, Metrological Characterization

Relation: https://doi.org/10.1109/MN55117.2022.9887740; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.7899777; https://doi.org/10.5281/zenodo.7899778; oai:zenodo.org:7899778

الاتاحة: https://doi.org/10.5281/zenodo.7899778

المؤلفون: Di Capua, Giulia, Femia, Nicola, Stoyka, Kateryna, Di Mambro, Gennaro, Maffucci, Antonio, Ventre, Salvatore, Villone, Fabio

المساهمون: EU-H2020-EMPIR Project, Universita degli Studi di Salerno

المصدر: IEEE Transactions on Industrial Electronics ; volume 68, issue 3, page 2196-2206 ; ISSN 0278-0046 1557-9948

الاتاحة: http://dx.doi.org/10.1109/tie.2019.2962432
http://xplorestaging.ieee.org/ielx7/41/9271830/08994192.pdf?arnumber=8994192

المؤلفون: Miele, Gianfranco, Bellucci, Stefano, Cataldo, Antonino, Di Tinno, Alessio, Ferrigno, Luigi, Maffucci, Antonio, Micheli, Laura, Sibilia, Sarah

المساهمون: Italian Ministry of University and Research through the Smart Distributed System Project, Project “2D material-based low cost SENSor of aggressive substancEs (2DSENSE),”, NATO under the SPS Programme, Italian Ministry of University and Research through the Project “C4E—Monitoraggio degli sversamenti illegali attraverso l’impiego sinergico di tecnologie avanzate”

المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 70, page 1-12 ; ISSN 0018-9456 1557-9662

الاتاحة: http://dx.doi.org/10.1109/tim.2021.3089247
http://xplorestaging.ieee.org/ielx7/19/9259274/09454515.pdf?arnumber=9454515