المؤلفون: Chittoor Parthasarathy, S. Naudet, Alain Bravaix, Abhishek Jain, Florian Cacho, Vincent Huard, S. Mhira, A. Benhassain

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES), Yncréa Méditerrané

المصدر: Psicologia: Teoria e Pesquisa
Psicologia: Teoria e Pesquisa, 2017, IEEE International Symposium on
Testing and Robust System Design (IOLTS), ⟨10.1109/IOLTS.2017.8046204⟩
IOLTS

مصطلحات موضوعية: Digital electronics, Engineering, business.industry, Control (management), Automotive industry, Control engineering, Reliability engineering, Compensation (engineering), [SPI]Engineering Sciences [physics], Margin (machine learning), Control system, Process control, MESH: NBTI, timing degradation, in-situ monitors, adaptive voltage scaling, control loop, DTMC, energy efficiency, business, Computer-aided software engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b21e6f242882112236f5658ad0cb898
https://hal.science/hal-03654374

المؤلفون: Mhira, Souhir, Huard, Vincent, Benhassain, Ahmed, Cacho, Florian, Naudet, Sylvain, Jain, Abhishek, Parthasarathy, Chittoor, Bravaix, Alain

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Crolles (ST-CROLLES), Yncréa Méditerrané

المصدر: ISSN: 0102-3772 ; EISSN: 1806-3446.

مصطلحات موضوعية: MESH: NBTI, timing degradation, in-situ monitors, adaptive voltage scaling, control loop, DTMC, energy efficiency, [SPI]Engineering Sciences [physics]

Relation: hal-03654374; https://hal.science/hal-03654374

الاتاحة: https://hal.science/hal-03654374
https://doi.org/10.1109/IOLTS.2017.8046204