المؤلفون: D. Zhou, E. Jin, J. Smyth, K. Takano, M. Dovek, T. Maletzky

المصدر: Journal of the Magnetics Society of Japan. 2011, 35(6):431

المؤلفون: Wenyu Chen, Zhenyao Tang, Akimasa Kaizu, Shohei Kawasaki, Kevin L.L. Man, Cathy S.Y. Mo, Tetsuya Roppongi, Moris M. Dovek

المصدر: 2022 IEEE 33rd Magnetic Recording Conference (TMRC).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f438a49c0f80d0c5000881c9ea98806b
https://doi.org/10.1109/tmrc56419.2022.9918546

المؤلفون: For Reviews, See C. F. Quate, In Highlights Ofthe 's, P. E. Russel, R. S. Becker, J. A. Golovchenko, B. S. Swartzentrouber, J. S. Foster, J. E. Frommer, P. C. Arnett, R. Emch, J. Nogami, M. M. Dovek, C. A. Lang, Y. Z. Li, L. Vazquez, R. Piner, R. P. Andres, I. -w. Lyo, Ph. Avouris, J. Chem Phys, L. J. Whitman, T. T. Tsong, Atom-probe Field Ion Microscopy (cambridge, G. Binnig, J. K. Gimzewski, R. Moller, Phys Rev B, Paul R. Renne, Asish, R. Basu

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.ees.rochester.edu/tims/publications/SiberiaScience.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.211.2814; http://www.ees.rochester.edu/tims/publications/SiberiaScience.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.211.2814
http://www.ees.rochester.edu/tims/publications/SiberiaScience.pdf

المؤلفون: E.-A. Salhi, M. Dovek, K. Takano, M. Sakai

المصدر: IEEE Transactions on Magnetics. 42:126-131

مصطلحات موضوعية: Physics, Condensed matter physics, Field (physics), business.industry, Isotropy, Electronic, Optical and Magnetic Materials, Magnetization, Magnetic anisotropy, Quality (physics), Optics, Perpendicular, Head (vessel), Electrical and Electronic Engineering, Anisotropy, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::63f94db87b218f74b1671caf481ef0ed
https://doi.org/10.1109/tmag.2005.861780

المؤلفون: Y. Liu, M. Dovek, P. Wang, W. Jose, L. Zhu

المصدر: Journal of Magnetism and Magnetic Materials. 310:e924-e926

مصطلحات موضوعية: Materials science, Magnetoresistance, digestive, oral, and skin physiology, Biasing, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Tunnel magnetoresistance, Lapping, Breakdown voltage, sense organs, Composite material, skin and connective tissue diseases, human activities, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e8f312b91394e22dfdf71d30c7fecbf5
https://doi.org/10.1016/j.jmmm.2006.10.969

المؤلفون: K. Takano, E.-A. Salhi, M. Sakai, M. Dovek

المصدر: IEEE Transactions on Magnetics. 41:2911-2913

مصطلحات موضوعية: Physics, Magnetization, Nuclear magnetic resonance, Field (physics), Acoustics, Node (physics), Head (vessel), Field strength, Domain decomposition methods, Electrical and Electronic Engineering, Micromagnetics, Yoke, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::23b6a48dedd19bc2ede8fded8486e0dc
https://doi.org/10.1109/tmag.2005.854742

المؤلفون: Po-Kang Wang, M. Dovek, Yue Liu

المصدر: Conference Record of the 2006 IEEE International Symposium on Electrical Insulation.

مصطلحات موضوعية: Barrier layer, Nuclear magnetic resonance, Materials science, Condensed matter physics, Magnetoresistance, Residual stress, Electric field, Stress relaxation, Space charge, Quantum tunnelling, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a81a58efd106cd6a59579bd294d017cd
https://doi.org/10.1109/elinsl.2006.1665306

المؤلفون: Jane Frommer, Jaquelin K. Spong, Lloyd LaComb, John S. Foster, M. M. Dovek

المصدر: Journal de Physique. 50:2139-2146

مصطلحات موضوعية: Microscope, business.industry, Chemistry, Transition temperature, Resolution (electron density), Neutron scattering, law.invention, Crystallography, Optics, Molecular geometry, law, Liquid crystal, Phase (matter), Scanning tunneling microscope, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0f1d8810427416c8cea99a7dde05ec44
https://doi.org/10.1051/jphys:0198900500150213900

المؤلفون: Calvin F. Quate, Nathan S. Lewis, Michael J. Heben, M. M. Dovek, Christoph A. Lang

المصدر: Review of Scientific Instruments. 59:2333-2336

مصطلحات موضوعية: Scanning Hall probe microscope, Materials science, Microscope, law, Scanning electron microscope, Electrode, Nanotechnology, Pyrolytic carbon, Scanning tunneling microscope, Electron microscope, Instrumentation, Electrochemical scanning tunneling microscope, law.invention

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9e2c15aded02b6d701fe08e9ad2f5ae4
https://doi.org/10.1063/1.1139957

المؤلفون: Nathan S. Lewis, Michael J. Heben, M. M. Dovek, Reginald M. Penner, Calvin F. Quate

المصدر: Journal of Microscopy. 152:651-661

مصطلحات موضوعية: Electrolysis, Histology, Chemistry, Faradaic current, Nanotechnology, Electrochemistry, Pathology and Forensic Medicine, Characterization (materials science), law.invention, law, Electrode, Microscopy, Scanning tunneling microscope, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7fb117ae2a34fe6ea71fbc4e9d6259c2
https://doi.org/10.1111/j.1365-2818.1988.tb01434.x

المؤلفون: C. F. Quate, M. M. Dovek, C. A. Lang

المصدر: Review of Scientific Instruments. 60:3109-3112

مصطلحات موضوعية: Materials science, business.industry, law.invention, Optics, Stack (abstract data type), law, Vacuum chamber, Work function, Graphite, Electron microscope, Scanning tunneling microscope, Spectroscopy, business, Instrumentation, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a04f9bb0895539bbdb0e19d949c42007
https://doi.org/10.1063/1.1140586

المؤلفون: C. A. Lang, Calvin F. Quate, Jun Nogami, M. M. Dovek

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Coalescence (physics), Monatomic gas, Materials science, Analytical chemistry, Surfaces and Interfaces, Epitaxy, Condensed Matter Physics, law.invention, Surfaces, Coatings and Films, Metal, law, visual_art, Monolayer, visual_art.visual_art_medium, Cluster (physics), Materials Chemistry, Mica, Scanning tunneling microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30dbe358f65653efc5c0c9c0fa9952bb
https://doi.org/10.1016/0167-2584(89)90133-3

المؤلفون: R. Emch, Jun Nogami, C. A. Lang, Calvin F. Quate, M. M. Dovek

المصدر: Journal of Applied Physics. 65:79-84

مصطلحات موضوعية: Surface diffusion, geography, geography.geographical_feature_category, Chemistry, business.industry, General Physics and Astronomy, Substrate (electronics), Epitaxy, Molecular physics, law.invention, Characterization (materials science), Optics, Terrace (geology), law, Mica, Scanning tunneling microscope, business, Surface reconstruction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c7e4af4bc5ae635a0771c2f9db196177
https://doi.org/10.1063/1.343379

المؤلفون: S. W. J. Kuan, T. R. Albrecht, Calvin F. Quate, R. Emch, M. M. Dovek, Curtis W. Frank, Roger Fabian W. Pease, P. Grütter, C. A. Lang

المصدر: Journal of Microscopy. 152:229-236

مصطلحات موضوعية: chemistry.chemical_classification, Acrylate, Histology, Materials science, Polymer, Pathology and Forensic Medicine, chemistry.chemical_compound, chemistry, Chemical engineering, Tacticity, Polymer chemistry, Monolayer, Graphite, Mica, Methyl methacrylate, Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8d4aeafe2dd48526d31bd5937c48a167
https://doi.org/10.1111/j.1365-2818.1988.tb01383.x

المؤلفون: Calvin F. Quate, C. A. Lang, Jun Nogami, M. M. Dovek, R. Emch

المصدر: Journal of Microscopy. 152:129-135

مصطلحات موضوعية: Histology, Microscope, business.industry, Substrate (electronics), Epitaxy, Pathology and Forensic Medicine, Characterization (materials science), law.invention, Optics, law, Surface modification, Mica, business, Lithography, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::885d25fc76c5c24329e3b52ef49d3df0
https://doi.org/10.1111/j.1365-2818.1988.tb01370.x

المؤلفون: T. R. Albrecht, Curtis W. Frank, Peter Grutter, S. W. J. Kuan, Calvin F. Quate, Roger Fabian W. Pease, C. A. Lang, M. M. Dovek

المصدر: Journal of Applied Physics. 64:1178-1184

مصطلحات موضوعية: chemistry.chemical_classification, Materials science, General Physics and Astronomy, Nanotechnology, Polymer, Microstructure, Atomic units, law.invention, Surface coating, chemistry, law, Monolayer, Thin film, Crystallization, Scanning tunneling microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f5bc88a4dc38498b5f6c903e2775605b
https://doi.org/10.1063/1.341881

المؤلفون: Jane Frommer, H. A. Mizes, Jaquelin K. Spong, Lloyd LaComb, John S. Foster, M. M. Dovek

المصدر: Nature. 338:137-139

مصطلحات موضوعية: Multidisciplinary, Microscope, Chemistry, Nanotechnology, Substrate (electronics), law.invention, law, Liquid crystal, Chemical physics, Microscopy, Molecule, Work function, Scanning tunneling microscope, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e0d6830f208d56b08793ee6912b5e2c0
https://doi.org/10.1038/338137a0

المؤلفون: C. A. Lang, Calvin F. Quate, M. M. Dovek, Mark D. Kirk, T. R. Albrecht, Douglas E. Smith

المصدر: Applied Physics Letters. 55:1727-1729

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), business.industry, Electrochemical scanning tunneling microscope, law.invention, Tunnel effect, Optics, law, Microelectronics, Optoelectronics, Nanometre, Graphite, Scanning tunneling microscope, business, Water vapor, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9fb1439861d74fb61fa243397c488686
https://doi.org/10.1063/1.102201

المؤلفون: M. M. Dovek, Jun Nogami, C. A. Lang, Calvin F. Quate

المصدر: Physical review. B, Condensed matter. 40(17)

مصطلحات موضوعية: Coalescence (physics), Materials science, business.industry, Layer by layer, Analytical chemistry, Crystal growth, Epitaxy, law.invention, Optics, law, Monolayer, Thin film, Scanning tunneling microscope, business, Surface reconstruction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc14e5ee17004b3167c1673d0860985c
https://pubmed.ncbi.nlm.nih.gov/9991815

المؤلفون: M. M. Dovek, Robert Sinclair, C. Vorst, A. H. Carim, Calvin F. Quate

المصدر: Science (New York, N.Y.). 237(4815)

مصطلحات موضوعية: Multidisciplinary, Materials science, business.industry, technology, industry, and agriculture, Scanning confocal electron microscopy, Analytical chemistry, Conductive atomic force microscopy, Dark field microscopy, law.invention, Scanning probe microscopy, law, Scanning transmission electron microscopy, Energy filtered transmission electron microscopy, Optoelectronics, Scanning tunneling microscope, business, Photoconductive atomic force microscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4a0ebb96bed2a69341ae493c840278b
https://pubmed.ncbi.nlm.nih.gov/17758564