المؤلفون: Ghamisi, Assef, Charter, Todd, Ji, Li, Rivard, Maxime, Lund, Gil, Najjaran, Homayoun

المصدر: Frontiers in Manufacturing Technology, 2024, 4, 1277152

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Artificial Intelligence, Computer Science - Machine Learning, Electrical Engineering and Systems Science - Image and Video Processing

URL الوصول: http://arxiv.org/abs/2307.07893

المؤلفون: Rivard, Maxime, Palardy-Sim, Marc, Roy, Steven, Lund, Gil, Zupan, Matthew, Benson, Mark, Padioleau, Christian, Beauchesne, André, Carignan, Louis-Philippe, Yousefpour, Ali, Lamouche, Guy

المساهمون: Soskind, Yakov, Busse, Lynda E.

المصدر: Photonic Instrumentation Engineering XI

الاتاحة: http://dx.doi.org/10.1117/12.3002630

المؤلفون: Ghamisi, Assef, Charter, Todd, Ji, Li, Rivard, Maxime, Lund, Gil, Najjaran, Homayoun

المصدر: Frontiers in Manufacturing Technology; 2024, p1-14, 14p

مصطلحات موضوعية: ANOMALY detection (Computer security), COMPUTER vision, MANUFACTURING defects, SUPERVISED learning, DEEP learning, FIBERS, ALGORITHMS

المؤلفون: Busse, Lynda E., Soskind, Yakov, Rivard, Maxime, Palardy-Sim, Marc, Roy, Steven, Lund, Gil, Zupan, Matthew, Benson, Mark, Padioleau, Christian, Beauchesne, André, Carignan, Louis-Philippe, Yousefpour, Ali, Lamouche, Guy

المصدر: Proceedings of SPIE; March 2024, Vol. 12893 Issue: 1 p128930O-128930O-6, 1160377p

المؤلفون: Roy, Steven, Palardy-Sim, Marc, Rivard, Maxime, Lamouche, Guy, Padioleau, Christian, Yousefpour, Ali, Lund, Gil, Zupan, Matt, Klakken, Marcus, Albers, Steve, Harper, Robert

مصطلحات موضوعية: Automated Fiber Placement, optical coherence tomography, measurement system analysis, spatially located 3D point cloud, machine vision, inspection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1674::2aef420dfb3d4df927e5fee14dc65ea6
https://nrc-publications.canada.ca/eng/view/object/?id=46bb1fa9-cc26-46db-91b1-41380b397a4f

المؤلفون: Rivard, Maxime, Palardy-Sim, Marc, Lamouche, Guy, Roy, Steven, Padioleau, Christian, Beauchesne, André, Levesque, Daniel, Boismenu, Francis, Dicaire, Louis-Guy, Boisvert, Jonathan, Peters, Shawn, Chen, Jihua, Octeau, Marc-André, Barroeta Robles, Julieta, Ferland, François, Tanguay, Martin, Hissett, Jay, Swope, David, Albers, Stephen, Harper, Robert, Wright, Ken, Buhrkuhl, Brad, Klakken, Marcus, Lund, Gil, Yousefpour, Ali

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______1674::35e10c81523faba3a843a11b2ffa6721
https://nrc-publications.canada.ca/eng/view/object/?id=242aee84-4095-444a-93c6-1d9797ec57da

المؤلفون: Rivard, Maxime, Palardy-Sim, Marc, Lamouche, Guy, Roy, Steven, Padioleau, Christian, Beauchesne, André, Levesque, Daniel, Boismenu, Francis, Dicaire, Louis-Guy, Boisvert, Jonathan, Peters, Shawn, Chen, Jihua, Octeau, Marc-André, Barroeta Robles, Julieta, Ferland, François, Tanguay, Martin, Hissett, Jay, Swope, David, Albers, Stephen, Harper, Robert, Wright, Ken, Buhrkuhl, Brad, Klakken, Marcus, Lund, Gil, Yousefpour, Ali

وصف الملف: text; 11 p.

Relation: SAMPE 2020 Virtual Series - Manufacturing Technology, International SAMPE Conference and Exhibition 2020 ["Manufacturing Technology" track within the SAMPE 2020 Virtual Series], Publication date: 2020-06-01; TP20-0000000258

الاتاحة: https://nrc-publications.canada.ca/eng/view/object/?id=242aee84-4095-444a-93c6-1d9797ec57da
https://nrc-publications.canada.ca/fra/voir/objet/?id=242aee84-4095-444a-93c6-1d9797ec57da

المؤلفون: Roy, Steven, Palardy-Sim, Marc, Rivard, Maxime, Lamouche, Guy, Padioleau, Christian, Yousefpour, Ali, Lund, Gil, Zupan, Matt, Klakken, Marcus, Albers, Steve, Harper, Robert

المصدر: SAMPE Journal; May/Jun2022, Vol. 58 Issue 3, p18-28, 11p

مصطلحات موضوعية: QUALITY control, ENGINEERING models, OPTICAL coherence tomography, INSPECTION & review, ENGINEERING tolerances, SYSTEM analysis

الشركة/الكيان: NATIONAL Research Council of Canada

المؤلفون: Palardy-Sim, Marc, Rivard, Maxime, Lamouche, Guy, Roy, Steven, Padioleau, Christian, Beauchesne, André, Levesque, Daniel, Dicaire, Louis-Guy, Boisvert, Jonathan, Peters, Shawn, Chen, Jihua, Octeau, Marc-André, Robles, Julieta Barroeta, Hissett, Jay, Swope, David, Albers, Stephen, Harper, Robert, Wright, Ken, Buhrkuhl, Brad, Klakken, Marcus, Lund, Gil, Yousefpour, Ali

وصف الملف: text

Relation: 6th Annual Composites and Advanced Materials Expo, 6th Annual Composites and Advanced Materials Expo, CAMX 2019, September 23 - 26, 2019, Anaheim, California, Publication date: 2019-09

الاتاحة: https://nrc-publications.canada.ca/eng/view/object/?id=d11319d9-b8fd-4ad6-ae42-10c1f7630aad
https://nrc-publications.canada.ca/fra/voir/objet/?id=d11319d9-b8fd-4ad6-ae42-10c1f7630aad