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1Conference
المؤلفون: Lu, Bingrui, Hansen, Søren Engelberth, Weis, Thor August Schimmell, Giri, Rakshyakar, Arregui Bravo, Guillermo, Stobbe, Søren
المصدر: Lu , B , Hansen , S E , Weis , T A S , Giri , R , Arregui Bravo , G & Stobbe , S 2023 , ' Design and All-In-One Etch of Silicon Metalens for Near-Infrared Focusing ' , 2023 Micro and Nano Engineering Conference , Berlin , Germany , 25/09/2023 - 28/09/2023 .
وصف الملف: application/pdf
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2Book
المؤلفون: Yang, Zongyao, Feng, Bo, Xu, Chen, Lu, Bingrui, Chen, Yifang, Li, Wenhao
المصدر: Advances in Optoelectronic Technology and Industry Development ; page 232-238 ; ISBN 9780429283628
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3Academic Journal
المؤلفون: Feng, Bo, Zhu, Jingyuan, Xu, Chen, Wan, Jing, Gan, Zelong, Lu, Bingrui, Chen, Yifang
المصدر: Nanoscale Research Letters ; volume 14, issue 1 ; ISSN 1931-7573 1556-276X
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4Academic Journal
المؤلفون: Liu, Tao, Tong, Xujie, Tian, Shuoqiu, Xie, Yuying, Zhu, Mingsai, Feng, Bo, Pan, Xiaohang, Zheng, Rui, Wu, Shan, Zhao, Ding, Chen, Yifang, Lu, Bingrui, Qiu, Min
المساهمون: National Natural Science Foundation of China, Science and Technology Commission of Shanghai Municipality
المصدر: Nanoscale ; volume 14, issue 25, page 9045-9052 ; ISSN 2040-3364 2040-3372
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5Electronic Resource
المؤلفون: Lu, Bingrui
مصطلحات الفهرس: person
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6
المؤلفون: Jingyuan Zhu, Sun Zhijiang, Chen Yifang, Lu Bingrui
المصدر: ECS Journal of Solid State Science and Technology. 8:R114-R118
مصطلحات موضوعية: Materials science, business.industry, law, Extraction (chemistry), Process (computing), Optoelectronics, Photonics, business, Electronic, Optical and Magnetic Materials, Light-emitting diode, law.invention
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7Academic Journal
المؤلفون: Lanniel, Mathieu, Lu, Bingrui, Chen, Yifang, Allen, Stephanie, Buttery, Lee, Williams, Phil, Huq, Ejaz, Alexander, Morgan
المساهمون: BBSRC, Rutherford Appleton Laboratories
المصدر: Thin Solid Films ; volume 519, issue 6, page 2003-2010 ; ISSN 0040-6090
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8Academic Journal
المؤلفون: Yang, Zongyao, Feng, Bo, Lu, Bingrui, Chen, Yifang, Li, Wenhao, Zhang, Wei, Li, Tao
المساهمون: Fudan University CIOMP Joint Fund, SITP, National Natural Science Foundation of China
المصدر: Microelectronic Engineering ; volume 227, page 111327 ; ISSN 0167-9317
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9Conference
المؤلفون: Arsalan, M., Cao, X.Y., Lu, Bingrui, Chen, Yifang, Zaslavsky, Alexander, Cristoloveanu,, Sorin, Bawedin, Mayline, Wan, Jing
المساهمون: School of Information Science and Engineering, Fundan University, Fudan University Shanghai, School of Engineering (Brown Engineering), Brown University, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )
المصدر: 2018 S3S Proceedings
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
https://hal.science/hal-02010244
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2018, San Francisco, United States. pp.18.3, ⟨10.1109/S3S.2018.8640150⟩مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
جغرافية الموضوع: San Francisco, United States
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10Conference
المؤلفون: Liu, J., Cao, X.Y., Lu, Bingrui, Chen, Yifang, Zaslavsky, Alexander, Cristoloveanu,, Sorin, Bawedin, Mayline, Wan, Jing
المساهمون: School of Information Science and Engineering, Fundan University, Fudan University Shanghai, School of Engineering (Brown Engineering), Brown University, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )
المصدر: 2018 S3S Proceedings
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
https://hal.science/hal-02010253
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2018, San Francisco, United States. pp.18.5, ⟨10.1109/S3S.2018.8640169⟩مصطلحات موضوعية: Couplings, Substrates, Switches, Logic gates, Silicon-on-insulator, Lighting, Photodetectors, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
جغرافية الموضوع: San Francisco, United States
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11Academic Journal
المؤلفون: Deng, Jianan, Zong, Lingyi, Bao, Wenzhong, Zhu, Mingsai, Liao, Fuyou, Guo, Zhongxun, Xie, Yuying, Lu, Bingrui, Wan, Jing, Zhu, Jiahe, Peng, Ruwen, Chen, Yifang
المساهمون: National Natural Science Foundation of China, National Basic Research Program of China
المصدر: Advanced Optical Materials ; volume 7, issue 23 ; ISSN 2195-1071 2195-1071
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12Academic Journal
المؤلفون: Deng, Jianan, Zong, Lingyi, Zhu, Mingsai, Liao, Fuyou, Xie, Yuying, Guo, Zhongxun, Liu, Jian, Lu, Bingrui, Wang, Jianlu, Hu, Weida, Zhou, Peng, Bao, Wenzhong, Wan, Jing
المساهمون: Shanghai Rising-Star Program, National Basic Research Program of China
المصدر: Advanced Functional Materials ; volume 29, issue 46 ; ISSN 1616-301X 1616-3028
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13Academic Journal
المؤلفون: Deng, Jianan, Shao, Jinhai, Wan, Jing, Lu, Bingrui, Chen, Yifang
المساهمون: National Natural Science Foundation of China, Basic Research Project of Shanghai Science and Technology Innovation Action, Fudan University-CIOMP Joint Fund
المصدر: Microelectronic Engineering ; volume 208, page 54-59 ; ISSN 0167-9317
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14Academic Journal
المؤلفون: Feng, Bo, Zhu, Jingyuan, Lu, Bingrui, Liu, Feifei, Zhou, Lei, Chen, Yifang
المساهمون: Fudan University, National Natural Science Foundation of China, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Shanghai Municipality
المصدر: ACS Nano ; volume 13, issue 7, page 8433-8441 ; ISSN 1936-0851 1936-086X
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15
المؤلفون: Chen Yifang, Jianpeng Liu, Sichao Zhang, Lu Bingrui, Jinhai Shao, Jingyuan Zhu, Chen Xu
المصدر: ECS Journal of Solid State Science and Technology. 9:045006
مصطلحات موضوعية: Property (philosophy), Materials science, business.industry, Optical sensing, Comparison study, Optoelectronics, business, Electronic, Optical and Magnetic Materials
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16Periodical
المؤلفون: Pan, Xiaohang, Tian, Shuoqiu, Liu, Tao, Feng, Bo, Yuan, Wentao, Lu, Bingrui, Chen, Yifang
المصدر: Applied Optics; April 2022, Vol. 61 Issue: 10 p2490-2496, 7p
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17Academic Journal
المؤلفون: Deng, Jianan, Shao, Jinhai, Lu, Bingrui, Chen, Yifang, Zaslavsky, Alexander, Cristoloveanu, Sorin, Bawedin, Maryline, Wan, Jing
المساهمون: School of Information Science and Engineering, Fundan University, Fudan University Shanghai, School of Engineering (Brown Engineering), Brown University, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )
المصدر: ISSN: 2168-6734 ; IEEE Journal of the Electron Devices Society ; https://hal.science/hal-02007005 ; IEEE Journal of the Electron Devices Society, 2018, 6, pp.557-564. ⟨10.1109/JEDS.2017.2788403⟩.
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18Academic Journal
المؤلفون: Feng, Bo, Deng, Jianan, Lu, Bingrui, Xu, Chen, Wang, Yiwen, Wan, Jing, Chen, Yifang
المساهمون: National Natural Science Foundation of China, Shanghai STCSM project
المصدر: Microelectronic Engineering ; volume 195, page 139-144 ; ISSN 0167-9317
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19Academic Journal
المؤلفون: Huang, Xiaqi, Shao, Jinhai, ChialinTsou, Zhang, Sichao, Lu, Bingrui, Hao, Ling, Sun, Yan, Chen, Yifang
المساهمون: National Natural Science Foundation of China, STCSM
المصدر: Microelectronic Engineering ; volume 172, page 13-18 ; ISSN 0167-9317
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20Periodical
المؤلفون: Liu, Tao, Pan, Xiaohang, Feng, Bo, Yang, Zongyao, Chen, Yifang, Lu, Bingrui
المصدر: Applied Optics; May 2021, Vol. 60 Issue: 13 p3830-3835, 6p