المؤلفون: Lopes, Israel, C, Pouget, Vincent, Wrobel, Frédéric, Saigné, Frédéric, Touboul, Antoine, Roed, Ketil

المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), University of Oslo (UiO)

المصدر: IEEE Latin American Test Symposium (LATS) 2020 ; https://hal.science/hal-03251533 ; IEEE Latin American Test Symposium (LATS) 2020, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093681⟩

مصطلحات موضوعية: Radiation effects, System-level testing, System-on-chip testing, [SPI.TRON]Engineering Sciences [physics]/Electronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Brazil

Time: Maceio, Brazil

Relation: hal-03251533; https://hal.science/hal-03251533; https://hal.science/hal-03251533/document; https://hal.science/hal-03251533/file/Lopes_al.pdf

الاتاحة: https://hal.science/hal-03251533
https://hal.science/hal-03251533/document
https://hal.science/hal-03251533/file/Lopes_al.pdf
https://doi.org/10.1109/LATS49555.2020.9093681

المؤلفون: Peña Fernández, Manuel, Lindoso Muñoz, Almudena, Entrena Arrontes, Luis Alfonso, Lopes, Israel C., Pouget, Vincent

المساهمون: Comunidad de Madrid

مصطلحات موضوعية: ARM, Error diagnosis, Fault tolerance, Laser fault injection, Microprocessor trace, Electrónica, Ingeniería Mecánica

Relation: Comunidad de Madrid. IND2017/TIC-7776; Gobierno de España. PID2019-106455GB-C21; Peña-Fernández, M., et al. Microprocessor error diagnosis by trace monitoring under laser testing. In:IEEE transactions on nuclear science, 68(8), Aug. 2021, Pp. 1651-1659; 1558-1578 (online); http://hdl.handle.net/10016/35163; 1651; 1659; IEEE TRANSACTIONS ON NUCLEAR SCIENCE; 68; AR/0000028793

الاتاحة: http://hdl.handle.net/10016/35163
https://doi.org/10.1109/TNS.2021.3067554

المؤلفون: Lopes, Israel C., Pouget, Vincent, Wrobel, Frederic, Saigne, Frederic, Touboul, Antoine, Roed, Ketil

المصدر: 2020 IEEE Latin-American Test Symposium (LATS)

الاتاحة: http://dx.doi.org/10.1109/lats49555.2020.9093681
http://xplorestaging.ieee.org/ielx7/9088113/9093665/09093681.pdf?arnumber=9093681

المؤلفون: Lopes, Israel C., Kastensmidt, Fernanda Lima, Susin, Altamiro Amadeu

المصدر: 2017 18th IEEE Latin American Test Symposium (LATS) ; page 1-6

الاتاحة: http://dx.doi.org/10.1109/latw.2017.7906770
http://xplorestaging.ieee.org/ielx7/7899159/7906734/07906770.pdf?arnumber=7906770