المؤلفون: Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-joachim Wunderlich

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2011/ETS_DalirHEW2011.pdf.

مصطلحات موضوعية: Index Terms—Network-on-Chip, Graceful Degradation, Performability, Logic Diagnosis

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.396.2339; http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2011/ETS_DalirHEW2011.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.396.2339
http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2011/ETS_DalirHEW2011.pdf

المؤلفون: HONG-CHOU KAO, MING-FU TSAI, SHI-YU HUANG, CHENG-WEN WU, Wen-feng Chang, Shyue-kung Lu

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.iis.sinica.edu.tw/page/jise/2003/200307_02.pdf.

مصطلحات موضوعية: VLSI testing, fault diagnosis, logic diagnosis, fault model, fault simulation

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.103.1014; http://www.iis.sinica.edu.tw/page/jise/2003/200307_02.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.103.1014
http://www.iis.sinica.edu.tw/page/jise/2003/200307_02.pdf

المؤلفون: Sun, Zhenzhou, Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Todri-Sanial, Aida, Virazel, Arnaud, Auvray, Etienne

المساهمون: Conception et Test de Systèmes MICroélectroniques (SysMIC), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Grenoble (ST-GRENOBLE)

المصدر: ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863 ; ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519

مصطلحات موضوعية: failure analysis, Effect-Cause approach, CPT, logic diagnosis, intra-cell diagnosis, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Phoenix, AZ, United States

Relation: lirmm-00806863; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863

المؤلفون: Cook, Alejandro

مصطلحات موضوعية: BIST , logic diagnosis , Automotive failure analysis, ComputerApplications_COMPUTERSINOTHERSYSTEMS, Halbleiter , Diagnose , Kraftfahrzeug

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a169aa2692498fb87260583d4fa0cd3

المؤلفون: Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Etienne Auvray

المساهمون: Bosio, Alberto, Conception et Test de Systèmes MICroélectroniques (SysMIC), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), STMicroelectronics [Grenoble] (ST-GRENOBLE)

المصدر: 38th International Symposium for Testing and Failure Analysis
38th International Symposium for Testing and Failure Analysis, Nov 2012, United States. pp.509-519
HAL
Pure TUe
Scopus-Elsevier

مصطلحات موضوعية: Effect-Cause approach, logic diagnosis, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, intra-cell diagnosis, CPT, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, failure analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::05b51627e373907b689f9ada28508803
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863

المؤلفون: Kao, Hong-Chou, Tsai, Ming-Fu, Huang, Shi-Yu, Wu, Cheng-Wen, Chang, Wen-Feng, Lu, Shyue-Kung

المساهمون: 吳誠文

مصطلحات موضوعية: VLSI testing, fault diagnosis, logic diagnosis, fault model, fault simulation

Time: 101

وصف الملف: 151 bytes; application/octet-stream

Relation: Journal of Information Science and Engineering, Volume 19, Number 4, July 2003, p571-587; http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42016

الاتاحة: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42016

المؤلفون: Grastien, Alban, Anbulagan, Anbu

المصدر: IEEE Transactions on Automatic Control

مصطلحات موضوعية: Keywords: Empirical studies, Novel algorithm, Propositional satisfiability, Satisfiability algorithms, Satisfiability solvers, Second level, Two-level approach, Algorithms, Diagnosis, Discrete event simulation, Formal logic Diagnosis, Discrete event systems

Relation: http://hdl.handle.net/1885/75781; https://openresearch-repository.anu.edu.au/bitstream/1885/75781/5/13Grastien_Diagnosis_of_discrete_event_systems.pdf.jpg; https://openresearch-repository.anu.edu.au/bitstream/1885/75781/7/01_Grastien_Diagnosis_of_discrete_event_2013.pdf.jpg

الاتاحة: http://hdl.handle.net/1885/75781
https://doi.org/10.1109/TAC.2013.2275892
https://openresearch-repository.anu.edu.au/bitstream/1885/75781/5/13Grastien_Diagnosis_of_discrete_event_systems.pdf.jpg
https://openresearch-repository.anu.edu.au/bitstream/1885/75781/7/01_Grastien_Diagnosis_of_discrete_event_2013.pdf.jpg

المؤلفون: Cook, Alejandro

المساهمون: Wunderlich, Hans-Joachim

الاتاحة: http://data.europeana.eu/aggregation/europeana/2048441/item_P3FJZGP527FWVL3G3BSYU3EU2F7MYHWG

المؤلفون: Grastien, Alban, Anbulagan, Anbu

المصدر: IEEE Transactions on Automatic Control

مصطلحات الفهرس: Keywords: Empirical studies; Novel algorithm; Propositional satisfiability; Satisfiability algorithms; Satisfiability solvers; Second level; Two-level approach; Algorithms; Diagnosis; Discrete event simulation; Formal logic Diagnosis; Discrete event systems; Propositional satisfiability, Journal article

URL: http://hdl.handle.net/1885/75781