المؤلفون: A. V. Pokoev, Lisa Belkacemi, François Jomard, Vladimir A. Esin, Daniel Gärtner, Andrey A. Fedotov, Sergiy V. Divinski, Aloke Paul, Cecilie Duhamel, Julia V. Osinskaya, Juliana Schell

المصدر: Diffusion Foundations. 29:31-73

مصطلحات موضوعية: Secondary ion mass spectrometry, Diffraction, Materials science, TRACER, Direct methods, Multicomponent systems, Sensitivity (control systems), Diffusion (business), Rutherford backscattering spectrometry, Computational physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b007fe8660d7f159fa7e252b64fa31d
https://doi.org/10.4028/www.scientific.net/df.29.31