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1Academic JournalSuppressing Threshold Voltage Drift in Sub-2 nm In 2 O 3 Transistors With Improved Thermal Stability
المؤلفون: Lin, Kris K. H., Teng, Li-Cheng, Weng, Tzu-Ting, Lin, Tzu-Jie, Lin, Jian-Cun, Wang, Shin-Yuan, Ho, Po-Hsun, Woon, Wei-Yen, Kei, Chi-Chung, Chou, Tsung-Te, Chien, Chao-Hsin, Lien, Der-Hsien
المساهمون: National Science and Technology Council
المصدر: IEEE Electron Device Letters ; volume 45, issue 1, page 60-63 ; ISSN 0741-3106 1558-0563
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2Periodical
المؤلفون: Lin, Kris K. H., Teng, Li-Cheng, Weng, Tzu-Ting, Lin, Tzu-Jie, Lin, Jian-Cun, Wang, Shin-Yuan, Ho, Po-Hsun, Woon, Wei-Yen, Kei, Chi-Chung, Chou, Tsung-Te, Chien, Chao-Hsin, Lien, Der-Hsien
المصدر: IEEE Electron Device Letters; January 2024, Vol. 45 Issue: 1 p60-63, 4p
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5Dissertation/ Thesis
المؤلفون: Lin, Jian Cun, 林建村
Thesis Advisors: Liao, Ri Jing, 廖日京