المؤلفون: Ela Sachyani Keneth, Eyal Cohen, Youngjin Jang, Yossi Paltiel, Shira Yochelis, Lilach Saltoun Raz, Arthur Shapiro, Efrat Lifshitz, Shlomo Magdassi

المصدر: Sensors and Actuators A: Physical. 295:469-473

مصطلحات موضوعية: Materials science, Fabrication, Absorption spectroscopy, Infrared, chemistry.chemical_element, 02 engineering and technology, Carbon nanotube, 01 natural sciences, law.invention, Condensed Matter::Materials Science, Responsivity, law, 0103 physical sciences, Electrical and Electronic Engineering, Instrumentation, 010302 applied physics, business.industry, Detector, Metals and Alloys, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Quantum dot, Optoelectronics, 0210 nano-technology, business, Carbon

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8222de9ed290b6294dba9347dfa3a1c
https://doi.org/10.1016/j.sna.2019.06.039

المؤلفون: Chanha Park, Minhyung Hong, Sangjun Han, John C. Robinson, Jieun Lee, Tal Marciano, Zephyr Liu, Dana Klein, Dongsub Choi, Roie Volkovich, Ahlin Choi, Hao Mei, Eitan Hajaj, Dohwa Lee, Lilach Saltoun, Jung-Tae Lee, Eitan Herzel, Wayne (Wei) Zhou, Dongyoung Lee, Anna Golotsvan, Jeongpyo Lee, Honggoo Lee, Eran Amit, Sanghuck Jeon, Seongjae Lee

المصدر: Metrology, Inspection, and Process Control for Microlithography XXXIII.

مصطلحات موضوعية: Computer science, Robustness (computer science), Extreme ultraviolet lithography, Electronic engineering, Process control, NAND gate, Overlay, Dram, Metrology, Numerical aperture

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a8a0933a14a7bfd8a38c5715b72d8f3f
https://doi.org/10.1117/12.2515015

المؤلفون: Evgeni Gurevich, Yaron DeLeeuw, Dror Alumot, Mark Wagner, Yuval Lamhot, Ido Adam, Ze'ev Lindenfeld, Barak Bringoltz, Eltsafon Ashwal, James Manka, Dana Klein, Tom Leviant, Lilach Saltoun, Noga Sella, Yoel Feler, Xindong Gao, Tal Marciano, Bryan Chen, Tal Yaziv

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Spectral signature, business.industry, Computer science, media_common.quotation_subject, 02 engineering and technology, Overlay, 021001 nanoscience & nanotechnology, 01 natural sciences, Asymmetry, Metrology, 010309 optics, Wavelength, Optics, 0103 physical sciences, 0210 nano-technology, business, Algorithm, Computer Science::Distributed, Parallel, and Cluster Computing, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4a58e26b2721101931a995682b84bbcc
https://doi.org/10.1117/12.2219176

المؤلفون: Honggoo Lee, Yoonshik Kang, Sangjoon Han, Kyuchan Shim, Minhyung Hong, Seungyoung Kim, Jieun Lee, Dongyoung Lee, Eungryonh Oh, Ahlin Choi, Youngsik Kim, Marciano, Tal, Klein, Dana, Hajaj, Eitan M., Aharon, Sharon, Ben-Dov, Guy, Lilach, Saltoun, Serero, Dan, Golotsvan, Anna

المصدر: Proceedings of SPIE; 2018, Vol. 10585, p1-12, 12p

المؤلفون: Emil Polturak, Lilach Saltoun, Joan Adler

المصدر: Journal of Physics: Conference Series. 750:012011

مصطلحات موضوعية: Wavefront, History, Materials science, Computer simulation, business.industry, Geometry, Surface energy, Computer Science Applications, Education, Visualization, Crystal, Optics, Grain boundary, Crystallite, Wulff construction, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::77e0c39fe8bdd1c8590cd14ec9349a07
https://doi.org/10.1088/1742-6596/750/1/012011

المؤلفون: Ukraintsev, Vladimir A., Adan, Ofer, Lee, Honggoo, Kang, Yoonshik, Han, Sangjoon, Shim, Kyuchan, Hong, Minhyung, Kim, Seungyoung, Lee, Jieun, Lee, Dongyoung, Oh, Eungryong, Choi, Ahlin, Kim, Youngsik, Marciano, Tal, Klein, Dana, Hajaj, Eitan M., Aharon, Sharon, Ben-Dov, Guy, Lilach, Saltoun, Serero, Dan, Golotsvan, Anna

المصدر: Proceedings of SPIE; March 2018, Vol. 10585 Issue: 1 p1058532-1058532-12

المؤلفون: Joan Adler, Lilach Saltoun, Emil Polturak

المصدر: Journal of Physics: Conference Series; 2016, Vol. 750 Issue 1, p1-1, 1p