نتائج البحث - "Lennaert Wouters"

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Academic Journal

Oil as an Enabler for Efficient Materials Removal in Three-Dimensional Scanning Probe Microscopy Applications

المؤلفون: Céline Noël, Lennaert Wouters, Kristof Paredis, Umberto Celano, Thomas Hantschel

المصدر: Frontiers in Mechanical Engineering, Vol 7 (2021)

مصطلحات موضوعية: SPM, oil, nanotomography, scalpel SPM, diamond tip, debris removal, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/fmech.2021.797962/full; https://doaj.org/toc/2297-3079

URL الوصول: https://doaj.org/article/43983875e50a447e96abfe2b98ff5660

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2

Academic Journal

Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements

المؤلفون: Hyeon-Su Kim, Nemanja Peric, Albert Minj, Lennaert Wouters, Jill Serron, Chiara Mancini, Serkan Koylan, Stefanie Sergeant, Thomas Hantschel

المساهمون: Kim, Hyeon-Su, Peric, Nemanja, Minj, Albert, Wouters, Lennaert, Serron, Jill, Mancini, Chiara, Koylan, Serkan, Sergeant, Stefanie, Hantschel, Thomas

مصطلحات موضوعية: RTS SPM, multi-tip SPM, Si tip, metal tip, diamond tip, probe chip, RTS scalpel SPM

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001199599700001; volume:35; firstpage:265703; numberofpages:10; journal:NANOTECHNOLOGY; https://hdl.handle.net/11573/1718916

الاتاحة: https://hdl.handle.net/11573/1718916
https://doi.org/10.1088/1361-6528/ad3744

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3

Local Enhancement of Dopant Diffusion from Polycrystalline Silicon Passivating Contacts

المؤلفون: Meriç Fırat, Lennaert Wouters, Pieter Lagrain, Felix Haase, Jana-Isabelle Polzin, Aditya Chaudhary, Gizem Nogay, Thibaut Desrues, Jan Krügener, Robby Peibst, Loic Tous, Hariharsudan Sivaramakrishnan Radhakrishnan, Jef Poortmans

المساهمون: Firat, Meric/0000-0002-6509-9668, Nogay, Gizem, POORTMANS, Jef, Radhakrishnan, Hariharsudan Sivaramakrishnan, Haase , Felix, Polzin, Jana-Isabelle, Desrues, Thibaut, Krugener, Jan, TOUS, Loic, Peibst, Robby, Wouters, Lennaert, FIRAT, Meric, Chaudhary, Aditya, Lagrain, Pieter, Publica

وصف الملف: Print-Electronic; application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f996b8d63b2075dcf2cd29326c0583a
https://lirias.kuleuven.be/handle/20.500.12942/699069

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4

Combining TCAD and advanced metrology techniques to support device integration towards N3

المؤلفون: Romain Ritzenthaler, Lennaert Wouters, Hans Mertens, Jerome Mitard, Kristof Paredis, Pierre Eyben, Naoto Horiguchi, Umberto Celano, Philippe Matagne, O. Richard, A. De Keersgieter, Ludovic Goux, Thomas Chiarella

المصدر: 2021 20th International Workshop on Junction Technology (IWJT).

مصطلحات موضوعية: Interconnection, Materials science, Emphasis (telecommunications), Process (computing), Calibration, Electronic engineering, Solid modeling, Device simulation, Characterization (materials science), Metrology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e178c29fdfa7f8c07876150a35bc7acc
https://doi.org/10.23919/iwjt52818.2021.9609513

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5

Dopant Activation Depth Profiling for Highly Doped Si:P By Scanning Spreading Resistance Microscopy (SSRM) and Differential Hall Effect Metrology (DHEM)

المؤلفون: Umberto Celano, Lennaert Wouters, Alexis Franquet, Valentina Spampinato, Paul van der Heide, Marc Schaekers, Abhijeet Joshi, Bulent M Basol

المصدر: ECS Meeting Abstracts. :1269-1269

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::683d35230ce33593e5771074178c8056
https://doi.org/10.1149/ma2022-01291269mtgabs

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6

Apparent size effects on dopant activation in nanometer-wide Si fins

المؤلفون: Ole Hansen, Henrik Hartmann Henrichsen, Dirch Hjorth Petersen, Paola Favia, Steven Folkersma, Lennaert Wouters, Lior Shiv, Peter F. Nielsen, Wilfried Vandervorst, Janusz Bogdanowicz

المصدر: Folkersma, S, Bogdanowicz, J, Favia, P, Wouters, L, Petersen, D H, Hansen, O, Henrichsen, H H, Nielsen, P F, Shiv, L & Vandervorst, W 2021, ' Apparent size effects on dopant activation in nanometer-wide Si fins ', Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, vol. 39, no. 2, 023202 . https://doi.org/10.1116/6.0000921

مصطلحات موضوعية: Fin, Materials science, Spreading resistance profiling, Dopant, business.industry, Annealing (metallurgy), Process Chemistry and Technology, Dopant Activation, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Metrology, Microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Instrumentation, Sheet resistance