المؤلفون: Kim, Hyunsok, Jeong, Ikhyun, Hong, Baikkyu, Ham, Sejung, Kim, Dongsu, Lim, Dongsuk, Lee, Kangmin, Lee, Jeongpyo, Jung, Minho, Oh, Nanglyeom, Choi, Dongsub, Spielberg, Hedvi, Bachar, Ohad

المساهمون: Robinson, John C., Sendelbach, Matthew J.

المصدر: Metrology, Inspection, and Process Control XXXVII

الاتاحة: http://dx.doi.org/10.1117/12.2670420

المؤلفون: LEE, JEONGPYO

مصطلحات موضوعية: Computer Applications-3D, Computer Applications-Detection, diagnosis, Arteriosclerosis, Vascular, Interventional vascular, CT-Angiography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3f9f113aa98f9e88baabe90c4a8705ec

المؤلفون: Levinski, Vladimir, Paskover, Yuri, Aharon, Sharon, Negri, Daria, Gutman, Nadav, Kothakapu, Nireekshan Reddy, Lee, Jeongpyo, Spielberg, Hedvi, Lee, DongYoung, Kim, Hyunjun, Park, Sukwon, Kim, Bohye, Jang, Hongseok, Lee, Honggoo, Lee, Sangho

المساهمون: Robinson, John C., Sendelbach, Matthew J.

المصدر: Metrology, Inspection, and Process Control XXXVI

الاتاحة: http://dx.doi.org/10.1117/12.2613981

المؤلفون: Kim, Ealgoo, Ngoc, Quy Trinh, Lee, Jeongpyo, Song, Seungwoo, Park, Jaehong, Kwon, Jingoo, Ok, Soonsuk, Choi, Jangdon, Chae, Kwihan

المصدر: SAE Transactions, 2007 Jan 01. 116, 195-201.

URL الوصول: https://www.jstor.org/stable/44719884

المؤلفون: Verner, Alexander, Kim, Hyunsok, Jeong, Ikhyun, Koo, Seungwoo, Lee, Dongjin, Lee, Honggoo, Ophir, Boaz, Bachar, Ohad, Yerushalmi, Liran, Jeon, Sanghuck, Choi, DongSub, Lee, Jeongpyo

المساهمون: Adan, Ofer, Robinson, John C.

المصدر: Metrology, Inspection, and Process Control for Microlithography XXXIV

الاتاحة: http://dx.doi.org/10.1117/12.2551850

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Kim, Hyunsok, Jeong, Ikhyun, Hong, Baikkyu, Ham, Sejung, Kim, Dongsu, Lim, Dongsuk, Lee, Kangmin, Lee, Jeongpyo, Jung, Minho, Oh, Nanglyeom, Choi, Dongsub, Spielberg, Hedvi, Bachar, Ohad

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963O-124963O-7, 1124675p

المؤلفون: Lee, Jeongpyo¹ (AUTHOR) jp.lee.life@gmail.com, Park, Kyungeun¹ (AUTHOR), Kim, Youngok¹ (AUTHOR) kimyoungok@kw.ac.kr

المصدر: Sensors (14248220). Jun2022, Vol. 22 Issue 12, pN.PAG-N.PAG. 14p.

مصطلحات موضوعية: *DEEP learning, *POSTURE, *LOCALIZATION (Mathematics), *CONVOLUTIONAL neural networks, *RADAR

المؤلفون: Park, Heesung, Park, Daehee, Lee, Jeongpyo

المصدر: HCI International 2019 – Late Breaking Posters ; Communications in Computer and Information Science ; page 113-118 ; ISSN 1865-0929 1865-0937 ; ISBN 9783030307110 9783030307127

الاتاحة: http://dx.doi.org/10.1007/978-3-030-30712-7_15
https://link.springer.com/content/pdf/10.1007/978-3-030-30712-7_15

المؤلفون: Yun, Younguk, Lee, Jeongpyo, An, Deockhyeon, Kim, Sangsoo, Kim, Youngok

المصدر: 2018 5th NAFOSTED Conference on Information and Computer Science (NICS) ; page 124-127

الاتاحة: http://dx.doi.org/10.1109/nics.2018.8606852
http://xplorestaging.ieee.org/ielx7/8590212/8606799/08606852.pdf?arnumber=8606852

المؤلفون: Park, Heesung, Lee, Jeongpyo, Bae, Sowoon, Park, Daehee, Lee, Yenah

المصدر: Human Systems Engineering and Design ; Advances in Intelligent Systems and Computing ; page 249-255 ; ISSN 2194-5357 2194-5365 ; ISBN 9783030020521 9783030020538

الاتاحة: http://dx.doi.org/10.1007/978-3-030-02053-8_38
http://link.springer.com/content/pdf/10.1007/978-3-030-02053-8_38

المؤلفون: Park, Hyowon, Lee, Honggoo, Han, Sangjun, Hong, Minhyung, Kim, Seungyoung, Lee, Jieun, Lee, Dongyoung, Oh, Eungryong, Choi, Ahlin, Lee, Jeongpyo, Choi, DongSub, Pandev, Stilian, Kim, Nakyoon, Jeon, Sanghuck, Robinson, John, Liang, Waley

المساهمون: Adan, Ofer, Ukraintsev, Vladimir A.

المصدر: Metrology, Inspection, and Process Control for Microlithography XXXII

الاتاحة: http://dx.doi.org/10.1117/12.2300946

المؤلفون: Cheng, Aaron, Lee, Honggoo, Choi, DongSub, Jeon, Sanghuck, Lee, Jungtae, Lee, Seong Jae, Liu, Zephyr, Lee, Jeongpyo, Peled, Einat, Amit, Eran, Lamhot, Yuval, Svizher, Alexander, Klein, Dana, Marchelli, Anat, Volkovich, Roie, Yaziv, Tal, Han, Sangjun, Hong, Minhyung, Kim, Seungyoung, Lee, Jieun, Lee, Dongyoung, Oh, Eungryong, Choi, Ahlin, Lee, Do-Hwa

المساهمون: Adan, Ofer, Ukraintsev, Vladimir A.

المصدر: Metrology, Inspection, and Process Control for Microlithography XXXII

الاتاحة: http://dx.doi.org/10.1117/12.2300507

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Levinski, Vladimir, Paskover, Yuri, Aharon, Sharon, Negri, Daria, Gutman, Nadav, Nireekshan Reddy, K., Lee, Jeongpyo, Spielberg, Hedvi, Lee, Dongyoung, Kim, Hyunjun, Park, Sukwon, Kim, Bohye, Jang, Hongseok, Lee, Honggoo, Lee, Sangho

المصدر: Proceedings of SPIE; May 2022, Vol. 12053 Issue: 1 p120531Z-120531Z-8, 1084788p

المؤلفون: Honggoo Lee, Sangjun Han, Minhyung Hong, Jieun Lee, Dongyoung Lee, Ahlin Choi, Chanha Park, Lee, Dohwa, Lee, Jungtae, Lee, Jeongpyo, Choi, DongSub, Jeon, Sanghuck, Liu, Zephyr, Hao Mei, Marciano, Tal, Hajaj, Eitan, Saltoun, Lilach, Klein, Dana, Amit, Eran, Golotsvan, Anna

المصدر: Proceedings of SPIE; 1/22/2019, Vol. 10959, p1-10, 10p

المؤلفون: Adan, Ofer, Robinson, John C., Verner, Alexander, Kim, Hyunsok, Jeong, Ikhyun, Koo, Seungwoo, Lee, Dongjin, Lee, Honggoo, Ophir, Boaz, Bachar, Ohad, Yerushalmi, Liran, Jeon, Sanghuck, Choi, Dongsub, Lee, Jeongpyo

المصدر: Proceedings of SPIE; March 2020, Vol. 11325 Issue: 1 p113251Z-113251Z-6, 1019266p

المؤلفون: Ukraintsev, Vladimir A., Adan, Ofer, Lee, Honggoo, Han, Sangjun, Hong, Minhyung, Lee, Jieun, Lee, Dongyoung, Choi, Ahlin, Park, Chanha, Lee, Dohwa, Lee, Seongjae, Lee, Jungtae, Lee, Jeongpyo, Choi, DongSub, Jeon, Sanghuck, Liu, Zephyr, Mei, Hao, Marciano, Tal, Hajaj, Eitan, Saltoun, Lilach, Klein, Dana, Amit, Eran, Golotsvan, Anna, Zhou, Wayne, Herzel, Eitan, Volkovich, Roie, Robinson, John C.

المصدر: Proceedings of SPIE; May 2019, Vol. 10959 Issue: 1 p109591E-109591E-10, 10849520p

المؤلفون: Ukraintsev, Vladimir A., Adan, Ofer, Lee, Honggoo, Han, Sangjun, Hong, Minhyung, Kim, Seungyoung, Lee, Jieun, Lee, DongYoung, Oh, Eungryong, Choi, Ahlin, Park, Hyowon, Liang, Waley, Choi, DongSub, Kim, Nakyoon, Lee, Jeongpyo, Pandev, Stilian, Jeon, Sanghuck, Robinson, John C.

المصدر: Proceedings of SPIE; March 2018, Vol. 10585 Issue: 1 p105851D-105851D-9, 952669p

المؤلفون: Park, Kyungeun, Lee, Jeongpyo, Kim, Youngok

المصدر: Electronics (2079-9292); Sep2021, Vol. 10 Issue 17, p2166, 1p

مصطلحات موضوعية: CONTINUOUS wave radar, CONVOLUTIONAL neural networks, DEEP learning

المؤلفون: Kim, Sung-Hyun, Hong, So-Hye, Lee, Jin Hee, Lee, Dong Han, Jung, Kikyung, Yang, Jun-Young, Shin, Hyo-Sook, Lee, JeongPyo, Jeong, Jayoung, Oh, Jae-Ho, Tanguay, Robyn L.

المصدر: Toxics; Mar2021, Vol. 9 Issue 3, p62-62, 1p

مصطلحات موضوعية: NANOPARTICLES, GRAPHENE, MATERIALS testing, ANIMAL experimentation, TEST methods

المؤلفون: Kim, Sung-Hyun, Lee, Dong Han, Lee, Jin Hee, Yang, Jun-Young, Shin, Hyo-Sook, Lee, JeongPyo, Jung, Kikyung, Jeong, Jayoung, Oh, Jae-Ho, Lee, Jong Kwon

المصدر: Toxics; Dec2020, Vol. 8 Issue 4, p122, 1p

مصطلحات موضوعية: CARBON nanotubes, MULTIWALLED carbon nanotubes, SINGLE walled carbon nanotubes, DOUBLE walled carbon nanotubes, SKIN, ZETA potential, TEST methods