المؤلفون: Yang, Giyoung, Jung, Hakchul, Lim, Jinyoung, Seo, Jaewoo, Kim, Ingyum, Yu, Jisu, You, Hyeoungyu, Kong, Jeongsoon, Kim, Garoom, Jeong, Minjae, Park, Chanhee, An, Sera, Rim, Woojin, Kim, Hayoung, Lee, Dalhee, Baek, Sanghoon, Jung, Jonghoon, Song, Taejoong, Kye, Jongwook

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

الاتاحة: http://dx.doi.org/10.1109/vlsitechnologyandcir46769.2022.9830450
http://xplorestaging.ieee.org/ielx7/9830116/9830138/09830450.pdf?arnumber=9830450

المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Kim, Mijoung, Lee, Dalhee, Kim, Gunrae, Lee, Seungbae, Song, Taesjoong, Rhee, Hwasung, Lee, Brandon, Choi, Jaehee

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps46558.2021.9405101
http://xplorestaging.ieee.org/ielx7/9405068/9405088/09405101.pdf?arnumber=9405101