المؤلفون: Department of Chemical Engineering, University of Florida, P.O. Box 116005, Gainesville, FL 32611, USA ( host institution ), Johnson, J.W. ( author ), LaRoch, J.R. ( author ), Ren, F. ( author ), Gila, B.P. ( author ), Overberg, M.E. ( author ), Abernathy, C.R. ( author ), Chyi, J.-I. ( author ), Chuo, C.C. ( author ), Nee, T.E. ( author ), Lee, C.M. ( author ), Lee, K.P. ( author ), Park, S.S. ( author ), Park, Y.J. ( author ), Pearton, S.J. ( author )

وصف الملف: Pages 405-410

Relation: Solid State Electronics; S0038-1101(01)00059-4; SSE; 2713; http://ufdc.ufl.edu/LS00509528/00001

الاتاحة: https://doi.org/10.1016/S0038-1101(01)00059-4
http://ufdc.ufl.edu/LS00509528/00001

المؤلفون: Department of Chemical Engineering, University of Florida, Gainesville, FL 32611, USA ( host institution ), Zhang, A.P ( author ), Dang, G ( author ), Ren, F ( author ), Han, J ( author ), Cho, H ( author ), Pearton, S.J ( author ), Chyi, J.-I ( author ), Nee, T.-E ( author ), Lee, C.M ( author ), Chuo, C.C ( author ), Chu, S.N.G ( author )

وصف الملف: Pages 1157-1161

Relation: Solid State Electronics; S0038-1101(00)00059-9; SSE; 2433; http://ufdc.ufl.edu/LS00509516/00001

الاتاحة: https://doi.org/10.1016/S0038-1101(00)00059-9
http://ufdc.ufl.edu/LS00509516/00001