يعرض 1 - 20 نتائج من 94 نتيجة بحث عن '"Lazzarino, Frederic"', وقت الاستعلام: 0.59s تنقيح النتائج
  1. 1
    Academic Journal

    المساهمون: IMEC (IMEC), Catholic University of Leuven = Katholieke Universiteit Leuven (KU Leuven), Laboratoire Hubert Curien (LabHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS)

    المصدر: ISSN: 0734-2101 ; Journal of Vacuum Science & Technology A ; https://hal.science/hal-04531012 ; Journal of Vacuum Science & Technology A, 2024, 42 (3), ⟨10.1116/6.0003380⟩.

    مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

  2. 2
  3. 3
    Conference
  4. 4
    Conference

    المساهمون: Altamirano-Sánchez, Efrain, Mohanty, Nihar

    المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XIII

  5. 5
    Conference

    المساهمون: Altamirano-Sánchez, Efrain, Mohanty, Nihar

    المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XIII

  6. 6
    Conference
  7. 7
    Conference

    المساهمون: Altamirano-Sánchez, Efrain, Mohanty, Nihar

    المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XIII

  8. 8
    Academic Journal
  9. 9
    Conference

    المساهمون: Altamirano-Sánchez, Efrain, Mohanty, Nihar

    المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XII

  10. 10
    Periodical
  11. 11
    Academic Journal
  12. 12
    Academic Journal
  13. 13
    Conference

    المساهمون: Bannister, Julie, Mohanty, Nihar

    المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XI

  14. 14
    Conference

    المساهمون: Bannister, Julie, Mohanty, Nihar

    المصدر: Advanced Etch Technology and Process Integration for Nanopatterning XI

  15. 15
    Conference
  16. 16
    Academic Journal
  17. 17
    Academic Journal

    المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Dec2022, Vol. 40 Issue 6, p1-14, 14p

  18. 18
    Conference

    المساهمون: Ronse, Kurt G., Gargini, Paolo A., Naulleau, Patrick P., Itani, Toshiro

    المصدر: Extreme Ultraviolet Lithography 2020

  19. 19
    Conference

    المساهمون: Adan, Ofer, Robinson, John C.

    المصدر: Metrology, Inspection, and Process Control for Microlithography XXXIV

  20. 20
    Conference