المؤلفون: Guglielma Vecchio, Pieter Blomme, Laurent Sourieau, H. Hody, Janko Versluis, Jan Van Houdt, Chi Lim Tan, Geert Van den bosch, Vasile Paraschiv, M. Ercken

المصدر: 2016 IEEE 8th International Memory Workshop (IMW).

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Extreme ultraviolet lithography, Electrical engineering, NAND gate, Dielectric, Flash (photography), Planar, Logic gate, Charge trap flash, Multiple patterning, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cca3fa09ee5485ec9ad4d24c5411368a
https://doi.org/10.1109/imw.2016.7495282