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1Conference
المؤلفون: Batude, P., Brunet, L., Fenouillet-Beranger, C., Andrieu, F., Colinge, J.-P., Lattard, D., Vianello, E., Thuries, S., Billoint, O., Vivet, P., Santos, C., Mathieu, B., Sklenard, B., Lu, C.-M. V., Micout, J., Deprat, F., Mercado, E. Avelar, Ponthenier, F., Rambal, N., Samson, M.-P., Casse, M., Hentz, S., Arcamone, J., Sicard, G., Hutin, L., Pasini, L., Ayres, A., Rozeau, O., Berthelon, R., Nemouchi, F., Rodriguez, P., Pin, J.-B., Larmagnac, D., Duboust, A., Ripoche, V., Barraud, S., Allouti, N., Barnola, S., Vizioz, C., Hartmann, J.-M., Kerdiles, S., Alba, P. Acosta, Beaurepaire, S., Beugin, V., Fournel, F., Besson, P., Loup, V., Gassilloud, R., Martin, F., Garros, X.
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) ; page 3.1.1-3.1.4
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2Conference
المؤلفون: Beneyton, R., Morin, P., Muthukrishnan, S., Larmagnac, D., Mayur, A., Richard, C.T.
المصدر: 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP), 2010; 2010, p80-85, 6p
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3ConferencePolysilicon nanowire NEMS fabricated at low temperature for above IC NEMS mass sensing applications.
المؤلفون: Ouerghi, I., Sansa, M., Ludurczak, W., Duraffourg, L., Benedetto, K., Besombes, P., Moffitt, T., Adams, B., Larmagnac, D., Gergaud, P., Poulain, C., Vidana, A. I., Ladner, C., Fabbri, J. M., Muyard, D., Rodriguez, G., Rabille, G., Pollet, O., Brianceau, P., Kerdiles, S.
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM); 1/1/2015, p1.4-18.3.4, 0p