المؤلفون: Pengcheng Zhang, Xuewu Zhou, Patrizio Pelliccione, Hareton Leung

المصدر: IEEE Access, Vol 5, Pp 21791-21805 (2017)

مصطلحات موضوعية: Multi-label, metamorphic testing, metamorphic relation, label count vector, RBF neural network, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8055540/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/00a7e95b3402499dbc55e6927ed47d13

المؤلفون: Zhang, Pengcheng, Zhou, Xuewu, Pelliccione, Patrizio, Leung, Hareton

المصدر: IEEE Access.

مصطلحات موضوعية: Software Engineering, Programvaruteknik, Multi-label, Metamorphic testing, Metamorphic relation, Label count vector, RBF neural network

URL الوصول: https://gup.ub.gu.se/publication/257297