المؤلفون: A. Pilotto, M. Antonelli, F. Arfelli, G. Biasiol, G. Cautero, M. Cautero, M. Colja, F. Driussi, D. Esseni, R.H. Menk, C. Nichetti, F. Rosset, L. Selmi, T. Steinhartova, P. Palestri

المصدر: Frontiers in Physics, Vol 10 (2022)

مصطلحات موضوعية: avalanche photodiodes, X-rays, modeling, Monte Carlo method, noise, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/fphy.2022.944206/full; https://doaj.org/toc/2296-424X

URL الوصول: https://doaj.org/article/5be4b55072454e00b68e307fcdfa4b9c

المؤلفون: L. J. Mele, P. Palestri, L. Selmi

المساهمون: Mele, L. J., Palestri, P., Selmi, L.

Relation: ispartofbook:Proceedings SIE-2021; SIE-2021; http://hdl.handle.net/11380/1285106

الاتاحة: http://hdl.handle.net/11380/1285106

المؤلفون: L, SELMI DATU

الاتاحة: http://dx.doi.org/10.31219/osf.io/h32j5

المؤلفون: D S Golubović, E Vianello, A Arreghini, F Driussi, M J Van Duuren, N Akil, L Selmi, D Esseni

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.diegm.uniud.it/driussi/pubblicazioni/articoli/sst8_7_075003.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1049.5388; http://www.diegm.uniud.it/driussi/pubblicazioni/articoli/sst8_7_075003.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.1049.5388
http://www.diegm.uniud.it/driussi/pubblicazioni/articoli/sst8_7_075003.pdf

المؤلفون: B. T. Lins, A. L. Selmi

المصدر: Brazilian Journal of Veterinary Research and Animal Science, Vol 41, Iss supl. (2004)

مصطلحات موضوعية: O artigo não apresenta palavras-chave., Animal culture, SF1-1100

وصف الملف: electronic resource

Relation: http://www.revistas.usp.br/bjvras/article/view/63570; https://doaj.org/toc/1413-9596; https://doaj.org/toc/1678-4456

URL الوصول: https://doaj.org/article/a01e345c33b8430a843f53d14bd7d5af

المؤلفون: A. G. Banks, G. R. Barbudo-Selmi, S. Terzella, A. L. Selmi, B. T. Lins, A. Simões

المصدر: Brazilian Journal of Veterinary Research and Animal Science, Vol 40, Iss supl. (2003)

مصطلحات موضوعية: O artigo não apresenta palavras-chave., Animal culture, SF1-1100

وصف الملف: electronic resource

Relation: http://www.revistas.usp.br/bjvras/article/view/63199; https://doaj.org/toc/1413-9596; https://doaj.org/toc/1678-4456

URL الوصول: https://doaj.org/article/6f9e5b37949942d5a8820b4584016273

المؤلفون: S. Terzella, G. R. Barbudo-Selmi, A. G. Banks, A. L. Selmi, B. T. Lins, A. Simões

المصدر: Brazilian Journal of Veterinary Research and Animal Science, Vol 40, Iss supl. (2003)

مصطلحات موضوعية: O artigo não apresenta palavras-chave, Animal culture, SF1-1100

Relation: http://www.revistas.usp.br/bjvras/article/view/63200; https://doaj.org/toc/1413-9596; https://doaj.org/toc/1678-4456; https://doaj.org/article/f8d63456d3b04d779c51dbe3b070dcde

الاتاحة: https://doi.org/10.11606/issn.2318-3659.v40isupl.p157-157
https://doaj.org/article/f8d63456d3b04d779c51dbe3b070dcde

المؤلفون: P. Palestri, Author(s) P. Palestri, L. Selmi, G. A. M. Hurkx, J.W. Slotboom, J. W. Slotboom, D. Terpstra, M. Peter, R. Woltjer, E. Sangiorgi

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/ur2000-806.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.58.1701; http://www.extra.research.philips.com/publ/rep/nl-ur/ur2000-806.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.58.1701
http://www.extra.research.philips.com/publ/rep/nl-ur/ur2000-806.pdf

المؤلفون: D. Esseni, BADAMI, Oves Mohamed Hussein, F. Driussi, D. Lizzit, M. Pala, P. Palestri, T. Rollo, L. Selmi, S. Venica

المساهمون: Esseni, D., Badami, Oves Mohamed Hussein, Driussi, F., Lizzit, D., Pala, M., Palestri, P., Rollo, T., Selmi, L., Venica, S.

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-3712-8; info:eu-repo/semantics/altIdentifier/wos/WOS:000610534600080; ispartofbook:IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2018 - Proceedings; 2nd IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2018; issue:Article number 8421501; firstpage:236; lastpage:238; numberofpages:3; info:eu-repo/grantAgreement/EC/FP7/317839; http://hdl.handle.net/11390/1136123; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85051482119; https://ieeexplore.ieee.org/document/8421501/

الاتاحة: http://hdl.handle.net/11390/1136123
https://doi.org/10.1109/EDTM.2018.8421501
https://ieeexplore.ieee.org/document/8421501/

المؤلفون: P. Palestri, C. Fiegna, L. Selmi, M.S. Peter, M. S. Peter Y

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/ur808-99.pdf.

مصطلحات موضوعية: bipolar transistor, collector profile, avalanche breakdown, launcher

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.4.4052; http://www.extra.research.philips.com/publ/rep/nl-ur/ur808-99.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.4.4052
http://www.extra.research.philips.com/publ/rep/nl-ur/ur808-99.pdf

المؤلفون: FIORI, GIANLUCA, IANNACCONE, GIUSEPPE, S. Fregonese, C. Maneux, T. Zimmer, V. Di Lecce, A. Gnudi, E. Gnani, S. Reggiani, G. Baccarani, S. Venica, F. Driussi, P. Palestri, L. Selmi, J. Dabrowski, G. Lippert, G. Lupina, S. Vaziri, M. Oestling, G. Ruhl, M. Lemme

المساهمون: Fiori, Gianluca, S., Fregonese, C., Maneux, T., Zimmer, V., Di Lecce, A., Gnudi, E., Gnani, S., Reggiani, G., Baccarani, S., Venica, F., Driussi, P., Palestri, L., Selmi, J., Dabrowski, G., Lippert, G., Lupina, S., Vaziri, M., Oestling, G., Ruhl, Iannaccone, Giuseppe, M., Lemme

Relation: ispartofbook:Proceedings of EU-Korea Workshop on Nanoelectronics; EU-Korea Workshop on Nanoelectronics (ICT 2015 - Innovate, Connect, Transform); http://hdl.handle.net/11568/797741

الاتاحة: http://hdl.handle.net/11568/797741

المؤلفون: O. Badami, F. Driussi, P. Palestri, L. Selmi, D. Esseni

المساهمون: Badami, O., Driussi, F., Palestri, P., Selmi, L., Esseni, D.

مصطلحات موضوعية: Computational modeling, Computer architecture, FinFET, Gallium arsenide, Logic gate, Scattering

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-3559-9; info:eu-repo/semantics/altIdentifier/wos/WOS:000424868900076; ispartofbook:Technical Digest - International Electron Devices Meeting, IEDM; Internetional Electron Device Meeting (IEDM); firstpage:314; lastpage:317; numberofpages:4; http://hdl.handle.net/11390/1123713; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85045212644

الاتاحة: http://hdl.handle.net/11390/1123713
https://doi.org/10.1109/IEDM.2017.8268382

المؤلفون: S. Strangio, F. Settino, P. Palestri, M. Lanuzza, F. Crupi, D. Essenia, L. Selmi

المساهمون: Strangio, S., Settino, F., Palestri, P., Lanuzza, M., Crupi, F., Essenia, D., Selmi, L.

مصطلحات موضوعية: Analog circuit, Digital circuit, Simulation, TCAD, Tunnel-FET, Electronic, Optical and Magnetic Material, Condensed Matter Physic, Electrical and Electronic Engineering, Materials Chemistry2506 Metals and Alloys

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000434705500009; volume:146; firstpage:50; lastpage:65; journal:SOLID-STATE ELECTRONICS; http://hdl.handle.net/11380/1166946; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85047652412; http://www.elsevier.com/wps/find/journaldescription.cws_home/103/description#description

الاتاحة: http://hdl.handle.net/11380/1166946
https://doi.org/10.1016/j.sse.2018.05.003
http://www.elsevier.com/wps/find/journaldescription.cws_home/103/description#description

المؤلفون: E. Caruso, J. Lin, K. F. Burke, K. Cherkaoui, D. Esseni, F. Gity, S. Monaghan, P. Palestri, P. Hurley, L. Selmi

المصدر: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

مصطلحات موضوعية: III-V semiconductors, C-V, Capacitance, Parameter extraction, Dielectric measurement, Gallium arsenide, TCAD simulations, Mathematical model, Border traps, Indium compounds, Technology CAD, MOSCAP, Analytical models, Condensed Matter::Quantum Gases, MOS capacitors, Capacitance-voltage curves, Multifrequency CV-curves, Border trap profiling, Capacitance-voltage characteristics, Interface states, Density of states, TCAD simulation, Dispersion, Al2O3/InGaAs stacks, Oxide capacitance, Hole traps, Dielectrics, Electron traps, III-V compounds, Sensitivity analysis, Trap volume

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::fa4ecbb5d902b15fea05cd9f6db99463
https://hdl.handle.net/11380/1163211

المؤلفون: A. Cristofoli, A. Dalla Costa, V. Cindro, F. Driussi, M. P. Giordani, P. Palestri, L. Selmi, Boscardin, Maurizio, Dalla Betta, Gian Franco, Giacomini, Gabriele, Povoli, Marco, Ronchin, Sabina, Vianello, Elisa

المساهمون: A., Cristofoli, A., Dalla Costa, Boscardin, Maurizio, V., Cindro, Dalla Betta, Gian Franco, F., Driussi, Giacomini, Gabriele, M. P., Giordani, P., Palestri, Povoli, Marco, Ronchin, Sabina, Vianello, Elisa, L., Selmi

مصطلحات موضوعية: 3D detector, device simulation, electrical characyerization, radiation damage

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781467301183; info:eu-repo/semantics/altIdentifier/isbn/9781467301190; info:eu-repo/semantics/altIdentifier/isbn/9781467301206; ispartofbook:Conference record of the 2011 NSS/MIC Conference; 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC/RTSD 2011); firstpage:518; lastpage:522; numberofpages:5; http://hdl.handle.net/11582/66398; http://dx.doi.org/10.1109/NSSMIC.2011.6154101

الاتاحة: http://hdl.handle.net/11582/66398
https://doi.org/10.1109/NSSMIC.2011.6154101

المؤلفون: BARLETTA, ANTONIO, ROSSI DI SCHIO, EUGENIA, L. Selmi

المساهمون: A. Barletta, E. Rossi di Schio, L. Selmi

مصطلحات موضوعية: THERMAL ENTRANCE, POROUS MEDIUM, SINUSOIDAL LAW, VISCOUS DISSIPATION

وصف الملف: ELETTRONICO

Relation: ispartofbook:Proceedings of the Third International Conference on Porous Media and its Applications in Science, Engineering and Industry; Third International Conference on Porous Media and its Applications in Science, Engineering and Industry; firstpage:1; lastpage:6; numberofpages:6; http://hdl.handle.net/11585/91274

الاتاحة: http://hdl.handle.net/11585/91274

المؤلفون: P. PALESTRI, C. ALEXANDER, A. ASENOV, G. BACCARANI, A. BOURNEL, M. BRACCIOLI, B. CHENG, P. DOLLFUS, A. ESPOSITO, D. ESSENI, A. GHETTI, C. FIEGNA, FIORI, GIANLUCA, V. AUBRY FORTUNA, IANNACCONE, GIUSEPPE, A. MARTINEZ, MAJKUSIAK B, S. MONFRAY, S. REGGIANI, C. RIDDET, J. SAINT MARTIN, E. SANGIORGI, A. SCHENK, L. SELMI, L. SILVESTRI, J. WALCZAK

المساهمون: P., Palestri, C., Alexander, A., Asenov, G., Baccarani, A., Bournel, M., Braccioli, B., Cheng, P., Dollfu, A., Esposito, D., Esseni, A., Ghetti, C., Fiegna, Fiori, Gianluca, V., AUBRY FORTUNA, Iannaccone, Giuseppe, A., Martinez, Majkusiak, B, S., Monfray, S., Reggiani, C., Riddet, J., SAINT MARTIN, E., Sangiorgi, A., Schenk, L., Selmi, L., Silvestri, J., Walczak

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781424437047; info:eu-repo/semantics/altIdentifier/wos/WOS:000272910200014; ispartofbook:Proceedings of ULIS 2009; 10th International Conference on the Ultimate Integration of Silicon, 2009. ULIS 2009.; firstpage:125; lastpage:128; numberofpages:4; http://hdl.handle.net/11568/135467; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-67650690638

الاتاحة: http://hdl.handle.net/11568/135467
https://doi.org/10.1109/ULIS.2009.4897554

المؤلفون: ROSSI DI SCHIO, EUGENIA, BARLETTA, ANTONIO, M. Geri, L. Selmi

المساهمون: E. Rossi di Schio, M. Geri, L. Selmi, A. Barletta

مصطلحات موضوعية: HEAT CONDUCTION, FLUID DYNAMICS, FULLY DEVELOPED FLOW, SEPARATION OF VARIABLES, EIGENVALUES

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/9788874883127; ispartofbook:XXVII Congresso Nazionale UIT sulla Trasmissione del Calore - Atti del Congresso; XXVII Congresso Nazionale UIT sulla Trasmissione del Calore; firstpage:89; lastpage:94; numberofpages:6; http://hdl.handle.net/11585/76511

الاتاحة: http://hdl.handle.net/11585/76511

المؤلفون: Serra, Nicola, P. Palestri, G. D. J. Smit, L. Selmi

المساهمون: Serra, Nicola, P., Palestri, G. D. J., Smit, L., Selmi

مصطلحات موضوعية: MOSFET, Monte Carlo method, ballistic transport, carrier mobility, silicon

Relation: ispartofbook:Proceedings of the 9th International Conference on Ultimate Integration on Silicon; IEEE International ULIS Conference 2008; firstpage:75; lastpage:78; numberofpages:4; http://hdl.handle.net/11582/13348; http://dx.doi.org/10.1109/ULIS.2008.4527144

الاتاحة: http://hdl.handle.net/11582/13348
https://doi.org/10.1109/ULIS.2008.4527144

المؤلفون: FIEGNA, CLAUDIO, BRACCIOLI, MARCO, SANGIORGI, ENRICO, S. C. Brugger, F. M. Bufler, P. Dollfus, V. Aubry Fortuna, C. Jungemann, B. Meinerzhagen, P. Palestri, S. Galdin Retailleau, A. Schenk, L. Selmi

المساهمون: TIBOR GRASSER, SIEGFRIED SELBERHERR, C. Fiegna, M. Braccioli, S. C. Brugger, F. M. Bufler, P. Dollfu, V. Aubry-Fortuna, C. Jungemann, B. Meinerzhagen, P. Palestri, S. Galdin-Retailleau, E. Sangiorgi, A. Schenk, L. Selmi

مصطلحات موضوعية: MOSFET, MONTE CARLO, DEVICE SIMULATION

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/9783211728604; info:eu-repo/semantics/altIdentifier/wos/WOS:000252105600014; ispartofbook:Simulation of Semiconductor Processes and Devices 2007; 12th International Conference on Simulation of Semiconductor -processes and Devices (SISPAD 2007); firstpage:57; lastpage:60; numberofpages:4; alleditors:TIBOR GRASSER, SIEGFRIED SELBERHERR; http://hdl.handle.net/11585/50906; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84901311609

الاتاحة: http://hdl.handle.net/11585/50906