المؤلفون: Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z.

المصدر: physica status solidi (a) ; volume 208, issue 11, page 2552-2557 ; ISSN 1862-6300 1862-6319

الاتاحة: http://dx.doi.org/10.1002/pssa.201184253
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fpssa.201184253
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssa.201184253
https://onlinelibrary.wiley.com/doi/full-xml/10.1002/pssa.201184253

المؤلفون: Vladimirova, T. P.¹, Kyslovs'kyy, Ye. M.¹, Molodkin, V. B.¹, Olikhovskii, S. I.¹, Koplak, O. V.¹, Kochelab, E. V.¹

المصدر: Semiconductor Physics, Quantum Electronics & Optoelectronics. 2011, Vol. 14 Issue 4, p470-477. 8p. 2 Charts, 6 Graphs.

مصطلحات موضوعية: *SILICON crystals, *MICROSTRUCTURE, *MAGNETIC fields, *PHASE transitions, *X-ray diffraction, *HIGH resolution imaging, *SCATTERING (Physics)