المؤلفون: Po-Hao Tseng, Yu-Hsuan Lin, Tian-Cih Bo, Feng-Ming Lee, Yu-Yu Lin, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Keh-Chung Wang, Chih-Yuan Lu

المصدر: 2022 International Electron Devices Meeting (IEDM).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::383940e7232d41d9f5da93fbde170718
https://doi.org/10.1109/iedm45625.2022.10019556

المؤلفون: Po-Hao Tseng, Yu-Hsuan Lin, Feng-Ming Lee, Tian-Cig Bo, Yung-Chun Li, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Keh-Chung Wang, Chih-Yuan Lu

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9dcf21c0f48d7fceae6fcc9ccbd04ed7
https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830405

المؤلفون: Yun-Yuan Wang, Yu-Hsuan Lin, Dai-Ying Lee, Cheng-Hsien Lu, Ming-Liang Wei, Po-Hao Tseng, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Keh-Chung Wang, Chih-Yuan Lu

المصدر: Japanese Journal of Applied Physics. 62:SC1085

مصطلحات موضوعية: General Engineering, General Physics and Astronomy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::35744ee64a3cc9c97dedf44e0a500531
https://doi.org/10.35848/1347-4065/acbc2c

المؤلفون: Yu-Hsuan Lin, Chen Liang-Yu, Hsiang-Lan Lung, Chih-Yuan Lu, Kuang-Yeu Hsieh, Chih-Chang Hsieh, Yun-Yuan Wang, Han-Wen Hu, Yung-Chun Li, Feng-Ming Lee, Po-Hao Tseng, Keh-Chung Wang, Ming-Hsiu Lee

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Scheme (programming language), Flexibility (engineering), Computer architecture, Computer science, Reliability (computer networking), Encoding (memory), Logic gate, Key (cryptography), NAND gate, computer, Coding (social sciences), computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ad90089213cd1f98a2705dcde5a59360
https://doi.org/10.1109/iedm13553.2020.9372035

المؤلفون: Keh-Chung Wang, Teng-Hao Yeh, Min-Feng Hung, Chia-Tze Huang, Tzu-Hsuan Hsu, Hang-Ting Lue, Guan-Ru Lee, Chieh Roger Lo, Meng-Yen Wu, Pishan Tseng, Chia-Jung Chiu, Cheng-Lin Sung, Kuan-Yuan Shen, Wei-Chen Chen, Chih-Yuan Lu, Kuang-Yeu Hsieh

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, business.industry, Computer science, Transistor, High density, Flash memory, law.invention, Non-volatile memory, Flash (photography), law, Memory architecture, Architecture, Storage class memory, business, Computer hardware

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84b796b776dcbcaa786e141d1a9ff40f
https://doi.org/10.1109/iedm13553.2020.9372101

المؤلفون: Keh-Chung Wang, Po-Hao Tseng, Ming-Hsiu Lee, Yu-Hsuan Lin, Chih-Yuan Lu, Wei-Chen Chen, Dai-Ying Lee, Kuang-Yeu Hsieh

المصدر: Japanese Journal of Applied Physics. 61:SC1003

مصطلحات موضوعية: High security, Physics and Astronomy (miscellaneous), business.industry, Computer science, Embedded system, Physical unclonable function, General Engineering, Self-reference, General Physics and Astronomy, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18762b938d0b4e9daf4064f1153b374d
https://doi.org/10.35848/1347-4065/ac3a8d

المؤلفون: Keh-Chung Wang, Kuang-Yeu Hsieh, Hsiang-Lan Lung, Chih-Yuan Lu, Dai-Ying Lee, Ming-Liang Wei, Ming-Hsiu Lee, Chao-Hung Wang, Yu-Hsuan Lin

المصدر: Japanese Journal of Applied Physics. 59:SGGB15

مصطلحات موضوعية: Non-volatile memory, Physics and Astronomy (miscellaneous), business.industry, Computer science, Embedded system, General Engineering, General Physics and Astronomy, business, Neural network system

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::127b11e36f187becb070c9f09a9ed8c2
https://doi.org/10.35848/1347-4065/ab769a

المؤلفون: Kuang-Yeu Hsieh, Yu-Yu Lin, Feng-Ming Lee, Yu-Hsuan Lin, Ming-Hsiu Lee, Dai-Ying Lee

المصدر: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

مصطلحات موضوعية: Materials science, business.industry, Memory window, Computer data storage, Optoelectronics, Limiting, Atmospheric temperature range, business, Thermal conduction, Cell resistance, Resistive random-access memory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::95ddf8edf6977f9aa8870cc407201dfa
https://doi.org/10.1109/icsict.2018.8564807

المؤلفون: Chao-Hung Wang, Kuang-Hao Chiang, Yu-Hsuan Lin, Jau-Yi Wu, Yung-Han Ho, Erh-Kun Lai, Dai-Ying Lee, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Chih-Yuan Lu

المصدر: 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/vlsi-tsa.2017.7942470
http://xplorestaging.ieee.org/ielx7/7937567/7942432/07942470.pdf?arnumber=7942470

المؤلفون: Chih-Yuan Lu, Bing-Yue Tsui, Kuang-Yeu Hsieh, Kuo-Pin Chang, Hang-Ting Lue, Yi-Hsuan Hsiao, Wei-Chen Chen

المصدر: IEEE Transactions on Device and Materials Reliability. 15:136-141

مصطلحات موضوعية: Materials science, business.industry, Reading (computer), Audio time-scale/pitch modification, Electrical engineering, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, Threshold voltage, Flash (photography), Interference (communication), Hardware_GENERAL, Logic gate, Hardware_INTEGRATEDCIRCUITS, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Hardware_LOGICDESIGN, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a4bf46b19a8d262fae748863eb4bb09
https://doi.org/10.1109/tdmr.2015.2398193

المؤلفون: Yen-Hao Shih, Yi-Hsuan Hsiao, Wei-Chen Chen, Chih-Yuan Lu, Kuo-Pin Chang, Kuang-Yeu Hsieh, Hang-Ting Lue, Bing-Yue Tsui

المصدر: IEEE Transactions on Electron Devices. 61:2064-2070

مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, law.invention, Flash (photography), Reliability (semiconductor), Thin-film transistor, law, Logic gate, Optoelectronics, Grain boundary, Electrical and Electronic Engineering, business, Gate equivalent

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::507d1d5cff5f593a538efa28d000ce29
https://doi.org/10.1109/ted.2014.2318716

المؤلفون: Wei-Chen Chen, Kuang-Yeu Hsieh, Hang-Ting Lue, Chih-Yuan Lu, Yi-Hsuan Hsiao, Bing-Yue Tsui

المصدر: IEEE Electron Device Letters. 36:1015-1017

مصطلحات موضوعية: Materials science, business.industry, Transistor, NAND gate, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Flash (photography), Stack (abstract data type), law, Saturation current, Logic gate, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Word (computer architecture)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::452a00c8ab82c43495feb570adb3192d
https://doi.org/10.1109/led.2015.2468723

المؤلفون: Kuang-Yeu Hsieh, Hang-Ting Lue, Chia-Jung Chiu, Chih-Yuan Lu

المصدر: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, NAND gate, Curvature, Gallium arsenide, Flash (photography), chemistry.chemical_compound, chemistry, Stack (abstract data type), Etching (microfabrication), Thin-film transistor, Optoelectronics, business, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::433a239a6700cc6b18daab4344d0c7db
https://doi.org/10.1109/icsict.2016.7999062

المؤلفون: Chih-Yuan Lu, Jau-Yi Wu, Erh-Kun Lai, Yu-Hsuan Lin, Chao-Hung Wang, Dai-Ying Lee, Feng-Ming Lee, Yu-Yu Lin, Ming-Hsiu Lee, Kuang-Yeu Hsieh, Po-Hao Tseng, Kuang-Hao Chiang

المصدر: 2016 IEEE 8th International Memory Workshop (IMW).

مصطلحات موضوعية: 010302 applied physics, Materials science, Pulse duration, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Resistive random-access memory, Reliability (semiconductor), Electric field, 0103 physical sciences, Electronic engineering, Constant current, 0210 nano-technology, Reset (computing), Lithography, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d8a56c53f9ce3b822508e0a97c21bbb8
https://doi.org/10.1109/imw.2016.7493564

المؤلفون: Erh-Kun Lai, Tseung-Yuen Tseng, Feng-Ming Lee, Ming-Hsiu Lee, Dai-Ying Lee, Hsiang-Lan Lung, Chih-Yuan Lu, Kuang-Hao Chiang, Tien-Yen Wang, Yu-Yu Lin, Yu-Hsuan Lin, Kuang-Yeu Hsieh, Jau-Yi Wu

المصدر: 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

مصطلحات موضوعية: 010302 applied physics, Scheme (programming language), Engineering, business.industry, Control (management), Electrical engineering, 01 natural sciences, Power (physics), Resistive random-access memory, Set (abstract data type), Reliability (semiconductor), 0103 physical sciences, Electronic engineering, business, Reset (computing), Algorithm, computer, Voltage, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fa738ceaf9c8d168d507a3c0ed29df88
https://doi.org/10.1109/vlsi-tsa.2016.7480501

المؤلفون: Sheng-Chih Lai, Kuang-Yeu Hsieh, Rich Liu, Pei-Ying Du, Hang-Ting Lue, Tzu-Hsuan Hsu, Szu-Yu Wang, Chih-Yuan Lu

المصدر: IEEE Transactions on Device and Materials Reliability. 10:222-232

مصطلحات موضوعية: Approximation theory, Materials science, business.industry, Time evolution, NAND gate, Electron, Dielectric, Blocking (statistics), Electronic, Optical and Magnetic Materials, Flash (photography), Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c71ff162da621ea5895abec0cc5c72ee
https://doi.org/10.1109/tdmr.2010.2041665

المؤلفون: Lee Feng-Min, Hsiang-Lan Lung, Chih-Yuan Lu, Kuang-Yeu Hsieh, Keh Chung Wang, Ming-Hsiu Lee, Hsu Kai-Chieh, Yu-Yu Lin, Po-Hao Tseng

المصدر: Japanese Journal of Applied Physics. 57:04FE04

مصطلحات موضوعية: 021110 strategic, defence & security studies, Physics and Astronomy (miscellaneous), Computer science, Physical unclonable function, 0211 other engineering and technologies, General Engineering, General Physics and Astronomy, Hamming distance, 02 engineering and technology, 020202 computer hardware & architecture, Compensation (engineering), Resistive random-access memory, Identification (information), Control theory, 0202 electrical engineering, electronic engineering, information engineering, Bit error rate, State (computer science), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::795ee3625451f20083c22ca3db7ec636
https://doi.org/10.7567/jjap.57.04fe04

المؤلفون: Sheng-Chih Lai, Tzu-Hsuan Hsu, Yi-Hsuan Hsiao, Rich Liu, Chih-Yuan Lu, Hang-Ting Lue, Ya-Chin King, Kuang-Yeu Hsieh

المصدر: IEEE Transactions on Electron Devices. 56:1235-1242

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Circuit design, Transconductance, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Subthreshold slope, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7c361f85402b6647d855fbb2561ee851
https://doi.org/10.1109/ted.2009.2018713

المؤلفون: Chih-Yuan Lu, Rich Liu, Kuang-Yeu Hsieh

المصدر: Microelectronic Engineering. 86:283-286

مصطلحات موضوعية: Computer science, business.industry, Electrical engineering, NAND gate, Logic level, Integrated circuit, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Flash memory, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Flash (photography), law, Charge trap flash, Node (circuits), Electrical and Electronic Engineering, business, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::77e990c01b950ec322b33e9d6583c7f6
https://doi.org/10.1016/j.mee.2008.08.007

المؤلفون: Rich Liu, Kuang-Yeu Hsieh, Szu-Yu Wang, Chih-Yuan Lu, Hang-Ting Lue, Pei-Ying Du

المصدر: IEEE Transactions on Electron Devices. 55:2218-2228

مصطلحات موضوعية: Materials science, business.industry, Electron capture, Oxide, Charge (physics), Electron, Nitride, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Tunnel effect, chemistry, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Quantum tunnelling, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b246b5e802aeed81e7063f6c35da0cb3
https://doi.org/10.1109/ted.2008.925926