المؤلفون: Scott, R.S., Pattanayak, D.N., Kohl, J.E., Adler, M.S., Ahle, R.S., Wildi, E.J.

المصدر: Technical Digest., International Electron Devices Meeting ; page 800-803

الاتاحة: http://dx.doi.org/10.1109/iedm.1988.32932
http://xplorestaging.ieee.org/ielx2/713/1415/00032932.pdf?arnumber=32932

المؤلفون: Kohl, J.E., Gammel, J.C., Hartman, A.R., Hirsch, M.D., Riley, T.J., Scott, R.S.

المصدر: 1982 International Electron Devices Meeting; 1982, p484-487, 4p

المؤلفون: Weston, H.T., Becke, H.W., Berthold, J.E., Gammel, J.C., Hartman, A.R., Kohl, J.E., Shibib, M.A., Smith, R.K., Wong, Y.H.

المصدر: 1982 International Electron Devices Meeting; 1982, p85-88, 4p

المؤلفون: Hartman, A.R., Berthold, J.E., Riley, T.J., Kohl, J.E., Yiu-Huen Wong, Weston, H.T., Scott, R.S.

المصدر: 1981 International Electron Devices Meeting; 1981, p250-253, 4p

المؤلفون: Scott, R.S., Pattanayak, D.N., Kohl, J.E., Adler, M.S., Ahle, R.S., Wildi, E.J.

المصدر: Technical Digest, International Electron Devices Meeting; 1988, p800-803, 4p

المؤلفون: Abram, I., Hochstrasser, R.M., Kohl, J.E., Semack, M.G., White, David

المصدر: Chemical Physics Letters ; volume 52, issue 1, page 1-4 ; ISSN 0009-2614

الاتاحة: http://dx.doi.org/10.1016/0009-2614(77)85107-5
https://api.elsevier.com/content/article/PII:0009261477851075?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0009261477851075?httpAccept=text/plain

المؤلفون: Kohl, J.E., Sakuma, H.

المصدر: 1984 International Electron Devices Meeting; 1984, p257-257, 1p