المؤلفون: Stewart, Colin A., Antillon, Edwin A., Sudmanns, Markus, El-Awady, Jaafar A., Knipling, Keith E., Callahan, Patrick G., Rowenhorst, David J., Fonda, Richard W.

المساهمون: US Naval Research Laboratory, Office of Naval Research, National Science Foundation

المصدر: Acta Materialia ; volume 272, page 119918 ; ISSN 1359-6454

الاتاحة: http://dx.doi.org/10.1016/j.actamat.2024.119918
https://api.elsevier.com/content/article/PII:S1359645424002714?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1359645424002714?httpAccept=text/plain

المؤلفون: Callahan, Patrick G., Beaudry, David, Michi, Richard, Zhou, Ryan, Stewart, Colin A., Knipling, Keith E.

المصدر: Metallurgical & Materials Transactions. Part A; Dec2024, Vol. 55 Issue 12, p4796-4808, 13p

مصطلحات موضوعية: SCANNING transmission electron microscopy, ATOM-probe tomography, LAVES phases (Metallurgy), BODY centered cubic structure, THERMODYNAMIC equilibrium

المؤلفون: De Gregorio, Bradley T, Lock, Evgeniya, Knipling, Keith, Cho, Hans

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 111-112 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1093/micmic/ozad067.048
https://academic.oup.com/mam/article-pdf/29/Supplement_1/111/50933341/ozad067.048.pdf

المؤلفون: Chu, Kevin, Antillon, Edwin, Stewart, Colin, Knipling, Keith, Callahan, Patrick, Wu, Sanne, Rowenhorst, David, McDowell, David L.

المساهمون: Office of Naval Research

المصدر: Acta Materialia ; volume 261, page 119385 ; ISSN 1359-6454

الاتاحة: http://dx.doi.org/10.1016/j.actamat.2023.119385
https://api.elsevier.com/content/article/PII:S1359645423007152?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1359645423007152?httpAccept=text/plain

المؤلفون: Knipling, Keith Edward.

الاتاحة: http://scholar.lib.vt.edu/theses/available/etd-02252003-110749

المؤلفون: Knipling, Keith Edward

Thesis Advisors: Materials Science and Engineering, Dowling, Norman E., Kampe, Stephen L., Reynolds, William T. Jr.

مصطلحات موضوعية: High-cycle fatigue, low-cycle fatigue, Ti-6Al-4V

وصف الملف: application/pdf

Relation: Thesis.pdf

الاتاحة: http://hdl.handle.net/10919/41290
http://scholar.lib.vt.edu/theses/available/etd-02252003-110749/

المؤلفون: De Gregorio, Bradley T, Lock, Evgeniya, Knipling, Keith, Cho, Hans

المصدر: Microscopy and Microanalysis ; volume 28, issue S1, page 2054-2056 ; ISSN 1435-8115 1431-9276

الاتاحة: https://doi.org/10.1017/s1431927622007954
https://academic.oup.com/mam/article-pdf/28/S1/2054/48823259/mam2054.pdf

المؤلفون: Beaudry, David C., Waters, Michael J., Valentino, Gianna M., Foley, Daniel L., Anber, Elaf, Rakita, Yevgeny, Brandenburg, Charlie J., Couzinié, Jean-Philippe, Perrière, Loïc, Aoki, Toshihiro, Knipling, Keith E., Callahan, Patrick G., Redemann, Benjamin W.Y., McQueen, Tyrel M., Opila, Elizabeth J., Rondinelli, James M., Taheri, Mitra L.

المصدر: Science Advances ; volume 10, issue 38 ; ISSN 2375-2548

الاتاحة: http://dx.doi.org/10.1126/sciadv.ado9697
https://www.science.org/doi/pdf/10.1126/sciadv.ado9697

المؤلفون: Stewart, Colin A., Fonda, Richard W., Knipling, Keith E.

المساهمون: Office of Naval Research

المصدر: Scripta Materialia ; volume 200, page 113903 ; ISSN 1359-6462

الاتاحة: http://dx.doi.org/10.1016/j.scriptamat.2021.113903
https://api.elsevier.com/content/article/PII:S1359646221001834?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1359646221001834?httpAccept=text/plain

المؤلفون: Wang, Fulin, Balbus, Glenn H., Xu, Shuozhi, Su, Yanqing, Shin, Jungho, Rottmann, Paul F., Knipling, Keith E., Stinville, Jean-Charles, Mills, Leah H., Senkov, Oleg N., Beyerlein, Irene J., Pollock, Tresa M., Gianola, Daniel S.

المساهمون: National Science Foundation, Office of Naval Research, U.S. Air Force

المصدر: Science ; volume 370, issue 6512, page 95-101 ; ISSN 0036-8075 1095-9203

الاتاحة: https://doi.org/10.1126/science.aba3722
https://syndication.highwire.org/content/doi/10.1126/science.aba3722
https://www.science.org/doi/pdf/10.1126/science.aba3722

المؤلفون: Knipling, Keith, Michi, Richard, Beaudry, David

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 438-439 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927619002927
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619002927

المؤلفون: Knipling, Keith, Callahan, Patrick, Beaudry, David, Taheri, Mitra

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 1498-1499 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1093/micmic/ozad067.770
https://academic.oup.com/mam/article-pdf/29/Supplement_1/1498/50933662/ozad067.770.pdf

المؤلفون: Kotulak, Nicole A., Nolde, Jill A., Katz, Michael B., Twigg, Mark E., Knipling, Keith E., Lubyshev, Dmitri, Fastenau, Joel M., Liu, Amy W. K., Aifer, Edward H.

المصدر: Journal of Applied Physics; Jul2020, Vol. 128 Issue 1, p1-7, 7p, 2 Diagrams, 4 Graphs

مصطلحات موضوعية: ATOM-probe tomography, THREE-dimensional imaging, PHYSICS

المؤلفون: Kotulak, Nicole A., Twigg, Mark E., Mahadik, Nadeemullah A., Tomasulo, Stephanie, Bonanno, P. L., Pereira, N. R., Knipling, Keith, Yakes, Michael K.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 398-399 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927618002489
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618002489

المؤلفون: Knipling, Keith E.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 2204-2205 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927618011509
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618011509

المؤلفون: Knipling, Keith, Meisenkothen, Fred, Steel, Eric B.

الاتاحة: http://dx.doi.org/10.6028/nist.sp.2100-03

المؤلفون: Knipling, Keith E., Tharpe, Joshua L., Liaw, Peter K.

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 726-727 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927617004299
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617004299

المؤلفون: Kotulak, Nicole A., Knipling, Keith, Hirst, Louise C., Tomasulo, Stephanie, Abell, Josh, Gonzalez, Maria, Yakes, Michael K., Meyer, Jerry R., Walters, Robert J.

المصدر: Microscopy and Microanalysis ; volume 23, issue S1, page 718-719 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927617004251
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927617004251

المؤلفون: Stewart, Colin A, Fonda, Richard W, Knipling, Keith E, Callahan, Patrick G, Lambert, Paul K

المصدر: Microscopy and Microanalysis ; volume 28, issue S1, page 312-313 ; ISSN 1435-8115 1431-9276

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927622002021
https://academic.oup.com/mam/article-pdf/28/S1/312/48823245/mam0312.pdf

المؤلفون: Callahan, Patrick G, Knipling, Keith E, Beaudry, D

المصدر: Microscopy and Microanalysis ; volume 28, issue S1, page 702-703 ; ISSN 1435-8115 1431-9276

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927622003270
https://academic.oup.com/mam/article-pdf/28/S1/702/48823219/mam0702.pdf