المؤلفون: Schloesser, T., Jakubowski, F., Kluge, J. v., Graham, A., Slesazeck, S., Popp, M., Baars, P., Muemmler, K., Moll, P., Wilson, K., Buerke, A., Koehler, D., Radecker, J., Erben, E., Zimmermann, U., Vorrath, T., Fischer, B., Aichmayr, G., Agaiby, R., Pamler, W., Schuster, T., Bergner, W., Mueller, W.

المصدر: 2008 IEEE International Electron Devices Meeting

الاتاحة: http://dx.doi.org/10.1109/iedm.2008.4796820
http://xplorestaging.ieee.org/ielx5/4786613/4796592/04796820.pdf?arnumber=4796820

المؤلفون: Killat, D., Umbach, F., Kluge, J. v., Schmitz, R., Langheinrich, W.

المصدر: ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference; 1996, p111-114, 4p