المؤلفون: Wang, Y.-C., Slater, T.J.A., Leteba, G.M., Roseman, A.M., Race, C.P., Young, N.P., Kirkland, A.I., Lang, C.I., Haigh, S.J.

وصف الملف: application/pdf

Relation: https://orca.cardiff.ac.uk/id/eprint/147214/1/acs.nanolett.8b03768.pdf; Wang, Y.-C., Slater, T.J.A. https://orca.cardiff.ac.uk/view/cardiffauthors/A2713468N.html orcid:0000-0003-0372-1551 orcid:0000-0003-0372-1551, Leteba, G.M., Roseman, A.M., Race, C.P., Young, N.P., Kirkland, A.I., Lang, C.I. and Haigh, S.J. 2019. Imaging three-dimensional elemental inhomogeneity in Pt-Ni nanoparticles using spectroscopic single particle reconstruction. Nano Letters 19 (2) , pp. 732-738. 10.1021/acs.nanolett.8b03768 https://doi.org/10.1021/acs.nanolett.8b03768 file https://orca.cardiff.ac.uk/id/eprint/147214/1/acs.nanolett.8b03768.pdf

الاتاحة: https://orca.cardiff.ac.uk/id/eprint/147214/
https://doi.org/10.1021/acs.nanolett.8b03768
https://orca.cardiff.ac.uk/id/eprint/147214/1/acs.nanolett.8b03768.pdf

المؤلفون: Murooka, Y., Bryan, W., Clarke, J., Ellis, M., Kirkland, A.I., Maskell, S., McKenzie, J., Layla Mehdi, B., Dwayne Miller, R.J., Noakes, T.C.Q., Robinson, I., Schroeder, S.L.M., van Thor, J., Welsch, C., Browning, N.D.

وصف الملف: text

Relation: https://eprints.whiterose.ac.uk/203325/1/Murooka_20230221_MM2023_RUEDI_ExtremeCondition_Session_sub.pdf; Murooka, Y., Bryan, W., Clarke, J. et al. (12 more authors) (2023) The Design of Relativistic Ultrafast Electron Diffraction and Imaging (RUEDI) Facility for Materials in Extremes. Microscopy and Microanalysis, 29 (1). pp. 1487-1488. ISSN 1431-9276

الاتاحة: https://eprints.whiterose.ac.uk/203325/
https://eprints.whiterose.ac.uk/203325/1/Murooka_20230221_MM2023_RUEDI_ExtremeCondition_Session_sub.pdf
https://academic.oup.com/mam/article/29/Supplement_1/1487/7228707?login=false

المؤلفون: Mir, J.A., Clough, R., MacInnes, R., Gough, C., Plackett, R., Shipsey, I., Sawada, H., MacLaren, I., Ballabriga, R., Maneuski, D., O'Shea, V., McGrouther, D., Kirkland, A.I.

وصف الملف: text

Relation: https://eprints.gla.ac.uk/143680/1/143680.pdf; Mir, J.A. et al. (2017) Characterisation of the Medipix3 detector for 60 and 80 keV electrons. Ultramicroscopy , 182, pp. 44-53. (doi:10.1016/j.ultramic.2017.06.010 )

الاتاحة: https://eprints.gla.ac.uk/143680/
https://eprints.gla.ac.uk/143680/1/143680.pdf

المؤلفون: Alfonso, A.J.D’, Morgan, A.J., Yan, A.W., Wang, P., Sawada, H., Kirkland, A.I., Allen, L.J.

المصدر: Microscopy and Microanalysis ; volume 20, issue S3, page 374-375 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927614003596
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927614003596

المؤلفون: Wang, P., Batey, D.J., Rodenburg, J.M., Sawada, H., Kirkland, A.I.

المصدر: Microscopy and Microanalysis ; volume 19, issue S2, page 706-707 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927613005527
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927613005527

المؤلفون: Haigh, S.J., Jiang, B., Alloyeau, D., Kisielowski, C., Kirkland, A.I.

المساهمون: EPSRC, JEOL (UK) Ltd., Soft Matter program of the U.S. Department of Energy under, Office of Science, Office of Basic Energy Sciences, Scientific User Facilities Division, of the U.S. Department of Energy

المصدر: Ultramicroscopy ; volume 133, page 26-34 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2013.04.012
https://api.elsevier.com/content/article/PII:S0304399113001186?httpAccept=text/xml
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المؤلفون: Jefferson, D. A., Kirkland, A.I., Reller, Armin, Tang, D., Williams, T.B., Thou, W.

Relation: https://opus.bibliothek.uni-augsburg.de/opus4/frontdoor/index/index/docId/59166; 84-338-1593-8

الاتاحة: https://opus.bibliothek.uni-augsburg.de/opus4/frontdoor/index/index/docId/59166

المؤلفون: Nellist, P.D., Cosgriff, E.C., Behan, G., Kirkland, A.I.

المصدر: Microscopy and Microanalysis ; volume 14, issue 1, page 82-88 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927608080057
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927608080057

المؤلفون: Liberti, E., Lozano, J.G., Pérez Osorio, M.A., Roberts, M.R., Bruce, P.G., Kirkland, A.I.

المساهمون: EPSRC

المصدر: Ultramicroscopy ; volume 210, page 112914 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2019.112914
https://api.elsevier.com/content/article/PII:S0304399119302797?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0304399119302797?httpAccept=text/plain

المؤلفون: Ando, S., Angulo, J., Batchelor, D., Corrochano, E. Bayro, Beeli, C., Bobisch, C., Möller, R., Bociort, F., Bosch, E., Lazic, I., Bredies, K., Broers, A., Chandra, N., Ghosh, R., Rodriguez, A. Cornejo, Agustin, F. Granados, Edee, K., Edgcombe, C., Elorza, J., Forbes, R.G., Gai, P.L., Boyes, E.D., Haschke, M., Herring, R., McMorran, B., Isaacson, M.S., Ishizuka, K., Jensen, K., Shiffler, D., Luginsland, J., Jourlin, M., Kaiser, U., Kirk, T., Kirkland, A.I., Clough, R., Mir, J., Koch, C.T., Krivanek, O.L., Kroupa, M., Lencová, B., Lichte, H., Matsuya, M., Monsoriu, J.A., Muray, L., Nepijko, S.A., Dyukov, V.G., Schönhense, G., O'Keefe, M.A., Paganin, D., Gureyev, T.

المصدر: Particles and Waves in Electron Optics and Microscopy ; Advances in Imaging and Electron Physics ; page xv-xvii ; ISSN 1076-5670

الاتاحة: http://dx.doi.org/10.1016/s1076-5670(16)30053-2
https://api.elsevier.com/content/article/PII:S1076567016300532?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1076567016300532?httpAccept=text/plain

المؤلفون: Clough, R., Kirkland, A.I.

المصدر: Advances in Imaging and Electron Physics ; page 1-42 ; ISSN 1076-5670

الاتاحة: http://dx.doi.org/10.1016/bs.aiep.2016.09.001
https://api.elsevier.com/content/article/PII:S1076567016300908?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1076567016300908?httpAccept=text/plain

المؤلفون: Mir, J.A., Clough, R., MacInnes, R., Gough, C., Plackett, R., Shipsey, I., Sawada, H., MacLaren, I., Ballabriga, R., Maneuski, D., O'Shea, V., McGrouther, D., Kirkland, A.I.

المصدر: Ultramicroscopy. 182

مصطلحات موضوعية: Physics::Instrumentation and Detectors, Detectors and Experimental Techniques

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid_dedup__::48156f3940fe21483ca98d380d0e900f
https://pubmed.ncbi.nlm.nih.gov/28654827

المؤلفون: Cosgriff, E.C., Nellist, P.D., D'Alfonso, A.J., Findlay, S.D., Behan, G., Wang, P., Allen, L.J., Kirkland, A.I.

المصدر: Advances in Imaging and electron Physics ; Advances in Imaging and Electron Physics ; page 45-76 ; ISSN 1076-5670

الاتاحة: http://dx.doi.org/10.1016/s1076-5670(10)62002-2

المؤلفون: Allen, C.S. (author), Liberti, E. (author), Kim, J.S. (author), Xu, Q. (author), Fan, Y. (author), He, K. (author), Robertson, A.W. (author), Zandbergen, H.W. (author), Warner, J.H. (author), Kirkland, A.I. (author)

مصطلحات موضوعية: graphene, phonons, electron beams, selected area electron diffraction, vibration testing

Relation: Journal of Applied Physics, 118 (7), 2015--0021-8979; http://resolver.tudelft.nl/uuid:d2a9fda7-16b9-46a7-9e8f-2f5415de3e52

الاتاحة: http://resolver.tudelft.nl/uuid:d2a9fda7-16b9-46a7-9e8f-2f5415de3e52

المؤلفون: Van Aert, Sandra, Bals, Sara, Chang, L.Y., den Dekker, Arjan, Kirkland, A.I., Van Dyck, Dirk, Van Tendeloo, Gustaaf

المصدر: EMC 2008 14th European Microscopy Congress 15 September 2008, Aachen, Germany : volume 1: instrumentation and methods / Luysberg, Martina [edit.] ; 978-3-540-85154-7

مصطلحات موضوعية: Physics

الاتاحة: https://hdl.handle.net/10067/1368650151162165141

المؤلفون: Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J.

المساهمون: Engineering and Physical Sciences Research Council in the UK (EPRSC)

المصدر: Ultramicroscopy ; volume 135, page 126-135 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2013.08.005
https://api.elsevier.com/content/article/PII:S0304399113002118?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0304399113002118?httpAccept=text/plain

المؤلفون: Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J.

المساهمون: Engineering and Physical Sciences Research Council in the UK (EPRSC)

المصدر: Ultramicroscopy ; volume 135, page 136-141 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2013.08.006
https://api.elsevier.com/content/article/PII:S030439911300212X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S030439911300212X?httpAccept=text/plain

المؤلفون: Takeguchi, M., Hashimoto, A., Mitsuishi, K., Zhang, X., Shimojo, M., Wang, P., Peter, N.D., Kirkland, A.I.

المصدر: Microscopy and Microanalysis ; volume 18, issue S2, page 332-333 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927612003510
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927612003510

المؤلفون: Moldovan, G., Sikharulidze, I., Matheson, J., Derbyshire, G., Kirkland, A.I., Abrahams, J.P.

المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ; volume 681, page 21-24 ; ISSN 0168-9002

الاتاحة: http://dx.doi.org/10.1016/j.nima.2012.03.033
https://api.elsevier.com/content/article/PII:S0168900212003221?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0168900212003221?httpAccept=text/plain

المؤلفون: Ciston, J., Kim, J.S., Haigh, S.J., Kirkland, A.I., Marks, L.D.

المصدر: Ultramicroscopy ; volume 111, issue 7, page 901-911 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2010.12.003
https://api.elsevier.com/content/article/PII:S0304399110003359?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0304399110003359?httpAccept=text/plain