المؤلفون: Kim, Jungsik, Lee, Hun Whee, Chung, Goo Hyeok

المصدر: Journal of Organizational Change Management, 2023, Vol. 37, Issue 1, pp. 92-115.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/JOCM-05-2023-0160

المؤلفون: Suh, Minki, Ryu, Minsang, Ha, Jonghyeon, Bang, Minji, Lee, Dabok, Lee, Hojoon, Sagong, Hyunchul, Kim, Jungsik

المساهمون: IC Design Education Center, Leaders in INdustry-university Cooperation 3.0, National Research Foundation of Korea

المصدر: IEEE Access ; volume 12, page 155119-155124 ; ISSN 2169-3536

الاتاحة: http://dx.doi.org/10.1109/access.2024.3481472
http://xplorestaging.ieee.org/ielx8/6287639/10380310/10719998.pdf?arnumber=10719998

المؤلفون: Bang, Minji, Ha, Jonghyeon, Suh, Minki, Lee, Dabok, Ryu, Minsang, Han, Jin-Woo, Sagong, Hyunchul, Lee, Hojoon, Kim, Jungsik

المساهمون: Electronic Design Automation (EDA) Tool Program of the IC Design Education Center (IDEC), Republic of Korea, National Research Foundation of Korea (NRF) through the Korean Government, “Leaders in Industry-university Cooperation 3.0” Project through the Ministry of Education and National Research Foundation of Korea

المصدر: IEEE Access ; volume 12, page 130347-130355 ; ISSN 2169-3536

الاتاحة: http://dx.doi.org/10.1109/access.2024.3457750
http://xplorestaging.ieee.org/ielx8/6287639/10380310/10676981.pdf?arnumber=10676981

المؤلفون: Ahn, Seok Hwan, Kim, Jungsik, Amanov, Auezhan

المساهمون: Tampere University, Materials Science and Environmental Engineering

مصطلحات موضوعية: 216 Materials engineering

وصف الملف: fulltext

Relation: 1037; 14; https://trepo.tuni.fi/handle/10024/160787

الاتاحة: https://trepo.tuni.fi/handle/10024/160787
https://doi.org/10.3390/met14091037

المؤلفون: Lee, Gyeongyeop, Suh, Minki, Ryu, Minsang, Lee, Yunjong, Han, Jin-Woo, Kim, Jungsik

المساهمون: Electronic Design Automation (EDA) Tool Program of the IC Design Education Center (IDEC), Republic of Korea, “Leaders in INdustry-university Cooperation 3.0”, Ministry of Education and the National Research Foundation of Korea

المصدر: IEEE Access ; volume 11, page 97456-97465 ; ISSN 2169-3536

الاتاحة: http://dx.doi.org/10.1109/access.2023.3312926
http://xplorestaging.ieee.org/ielx7/6287639/10005208/10243015.pdf?arnumber=10243015

المؤلفون: Ahn, Seok-Hwan, Kim, Jungsik, Amanov, Auezhan

المصدر: Metals (2075-4701); Sep2024, Vol. 14 Issue 9, p1037, 17p

مصطلحات موضوعية: HEAT treatment, CORROSION resistance, TRIBOLOGY, SURFACE morphology, STEEL

المؤلفون: Yoon, Gilsang, Ko, Donghyun, Park, Jounghun, Kim, Donghwi, Kim, Jungsik, Lee, Jeong-Soo

المساهمون: Samsung Electronics Company Ltd., BK21 FOUR Program

المصدر: IEEE Access ; volume 10, page 62423-62428 ; ISSN 2169-3536

الاتاحة: http://dx.doi.org/10.1109/access.2022.3182397
http://xplorestaging.ieee.org/ielx7/6287639/9668973/09794704.pdf?arnumber=9794704

المؤلفون: Park, Jounghun, Yoon, Gilsang, Go, Donghyun, Kim, Donghwi, Chul Sagong, Hyun Chul, Kim, Jungsik, Lee, Jeong-Soo

المصدر: IEEE Transactions on Electron Devices; October 2024, Vol. 71 Issue: 10 p6040-6048, 9p

المؤلفون: Kim, Donghwi, Yoon, Gilsang, Go, Donghyun, Park, Jounghun, Kim, Jungsik, Lee, Jeong-Soo

المساهمون: Samsung-POSTECH Research Center (SPRC) through Samsung Electronics, National Research and Development Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT

المصدر: IEEE Transactions on Electron Devices ; volume 71, issue 8, page 4644-4648 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2024.3416085
http://xplorestaging.ieee.org/ielx8/16/10609410/10595997.pdf?arnumber=10595997

المؤلفون: Bae, Hagyoul, Lee, Geon Bum, Yoo, Jaewook, Lee, Khwang-Sun, Ku, Ja-Yun, Kim, Kihyun, Kim, Jungsik, Ye, Peide D., Park, Jun-Young, Choi, Yang-Kyu

المساهمون: Jeonbuk National University, Ministry of Education, National Research Foundation of Korea, National Research Foundation, Siemens EDA, Ministry of Science, ICT and Future Planning

المصدر: Solid-State Electronics ; volume 215, page 108882 ; ISSN 0038-1101

الاتاحة: http://dx.doi.org/10.1016/j.sse.2024.108882
https://api.elsevier.com/content/article/PII:S0038110124000315?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0038110124000315?httpAccept=text/plain

المؤلفون: Kim, Kihyun, Kim, Jungsik

المساهمون: National Research Foundation of Korea

المصدر: AIP Advances ; volume 11, issue 2 ; ISSN 2158-3226

الاتاحة: http://dx.doi.org/10.1063/5.0041444
https://pubs.aip.org/aip/adv/article-pdf/doi/10.1063/5.0041444/12993794/025137_1_online.pdf

المؤلفون: Park, Iksoo, Choi, Jaeyong, Kim, Jungsik, Kong, Byoung Don, Lee, Jeong-Soo

المصدر: Micromachines; Apr2024, Vol. 15 Issue 4, p481, 7p

مصطلحات موضوعية: FIELD-effect transistors, VERTICAL drains, NANOWIRES, QUANTUM confinement effects, ELECTRON tunneling, QUANTUM tunneling, NUMERICAL analysis

المؤلفون: Park, Jounghun, Yoon, Gilsang, Go, Donghyun, Kim, Donghwi, An, Ukju, Kim, Jongwoo, Kim, Jungsik, Lee, Jeong-Soo

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48203.2023.10117868
http://xplorestaging.ieee.org/ielx7/10117589/10117581/10117868.pdf?arnumber=10117868

المؤلفون: Lee, Hong, Kim, Jungsik, Ryu, Yeonjae

المصدر: Journal of Creative Behavior. Jun 2015 49(2):77-93.

Peer Reviewed: Y

Page Count: 17

Descriptors: Theories, Creativity, Measures (Individuals), Comparative Analysis, Factor Analysis

المؤلفون: LEE, JEONG SOO, PARK, IKSOO, KIM, JUNGSIK, LEE, DONGHUN

المساهمون: LEE, JEONG SOO, PARK, IKSOO, KIM, JUNGSIK, LEE, DONGHUN

Relation: 제29회 한국반도체학술대회; https://oasis.postech.ac.kr/handle/2014.oak/116298; 66291

الاتاحة: https://oasis.postech.ac.kr/handle/2014.oak/116298

المؤلفون: LEE, JEONG SOO, GO, DONG HYUN, YOON, GIL SANG, PARK, JOUNG HUN, KIM, JUNGSIK

المساهمون: LEE, JEONG SOO, GO, DONG HYUN, YOON, GIL SANG, PARK, JOUNG HUN, KIM, JUNGSIK

Relation: 제29회 한국반도체학술대회; https://oasis.postech.ac.kr/handle/2014.oak/110330; 61913

الاتاحة: https://oasis.postech.ac.kr/handle/2014.oak/110330

المؤلفون: LEE, JEONG SOO, KIM, DONGHWI, GILSANG, YOON, GO, DONGHYUN, PARK, JOUNG HUN, KIM, JUNGSIK

المساهمون: LEE, JEONG SOO, KIM, DONGHWI, GILSANG, YOON, GO, DONGHYUN, PARK, JOUNG HUN, KIM, JUNGSIK

Relation: 제29회 한국반도체학술대회; https://oasis.postech.ac.kr/handle/2014.oak/110329; 61914

الاتاحة: https://oasis.postech.ac.kr/handle/2014.oak/110329

المؤلفون: Kim, Jungsik, Lee, Hun Whee, Chung, Goo Hyeok

المصدر: Journal of Organizational Change Management ; volume 37, issue 1, page 92-115 ; ISSN 0953-4814

الاتاحة: http://dx.doi.org/10.1108/jocm-05-2023-0160
https://www.emerald.com/insight/content/doi/10.1108/JOCM-05-2023-0160/full/xml
https://www.emerald.com/insight/content/doi/10.1108/JOCM-05-2023-0160/full/html

المؤلفون: PARK, JOUNGHUN, HAN, JIN-WOO, YOON, GILSANG, GO, DONGHYUN, KIM, DONGHWI, KIM, JUNGSIK, LEE, JEONG SOO

المساهمون: PARK, JOUNGHUN, YOON, GILSANG, GO, DONGHYUN, KIM, DONGHWI, KIM, JUNGSIK, LEE, JEONG SOO

مصطلحات موضوعية: 3-D NAND flash memory, radiation, single-event upset (SEU), technology-computer-aided design (TCAD) simulation

Relation: IEEE Transactions on Electron Devices; Engineering, Electrical & Electronic; Physics, Applied; Engineering; Physics; https://oasis.postech.ac.kr/handle/2014.oak/114629; 51921; IEEE Transactions on Electron Devices, v.69, no.11, pp.6089 - 6094; 000862328900001; 2-s2.0-85139514229

الاتاحة: https://oasis.postech.ac.kr/handle/2014.oak/114629
https://doi.org/10.1109/TED.2022.3207113

المؤلفون: Go, Donghyun, Yoon, Gilsang, Park, Jounghun, Kim, Donghwi, Kim, Jiwon, Kim, Jungsik, Lee, Jeong-Soo

المصدر: Micromachines; Nov2023, Vol. 14 Issue 11, p2007, 11p

مصطلحات موضوعية: FLASH memory, THRESHOLD voltage, MARKETING channels, ELECTRON density, ELECTRIC fields, PROGRAMMED cell death 1 receptors