المؤلفون: Kim, Chi-Hwan, Lee, Jang Hoon, Kang, Jin, Song, Sujin, Yun, Myung-ho, Kim, Jong Chan

المصدر: Radiocarbon ; volume 59, issue 2, page 373-381 ; ISSN 0033-8222 1945-5755

الاتاحة: http://dx.doi.org/10.1017/rdc.2017.8
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S003382221700008X

المؤلفون: Kim, Chi Hwan.

المصدر: Bibliogr. s. 206-211.

مصطلحات موضوعية: Dodekafonia

Subject Person: Schönberg, Arnold (1874-1951) -- krytyka i interpretacja.

URL الوصول: http://katalog.nukat.edu.pl/lib/item?id=chamo:1902585&theme=nukat

Degree: Diss. Univ. zu Köln.

المؤلفون: Kim, Chi-Hwan, Bae, Jin-Hyuk, Lee, Sin-Doo, Choi, Jong Sun

المصدر: Molecular Crystals and Liquid Crystals ; volume 471, issue 1, page 147-154 ; ISSN 1542-1406 1563-5287

الاتاحة: http://dx.doi.org/10.1080/15421400701548068
http://www.tandfonline.com/doi/pdf/10.1080/15421400701548068

المؤلفون: Bae, Mun Ki¹ (AUTHOR) wck9230@naver.com, Kim, Chi Hwan¹ (AUTHOR) kch792@daum.net, Park, Yeong Min¹ (AUTHOR) ymin9634@naver.com, Yoon, Su Jong² (AUTHOR) yoonsj@pusan.ac.kr, Kim, Tae Gyu² (AUTHOR) tgkim@pusan.ac.kr

المصدر: Modern Physics Letters B. 3/10/2020, Vol. 34 Issue 7-9, pN.PAG-N.PAG. 4p.

مصطلحات موضوعية: *CHEMICAL vapor deposition, *DIAMOND films, *FIBERS, *AMORPHOUS carbon, *SCANNING electron microscopy, *DIAMOND-like carbon

المؤلفون: Jeong, Il Heon, Park, Yeong Min, Bae, Mun Ki, Kim, Chi Hwan, Kim, Tae Gyu

المصدر: Modern Physics Letters B; 5/20/2019, Vol. 33 Issue 14/15, pN.PAG-N.PAG, 5p

مصطلحات موضوعية: SHIP propulsion, FATIGUE life, STEEL, ENGINES, SHIPS

المؤلفون: Jeong, Il Heon, Park, Yeong Min, Bae, Mun Ki, Kim, Chi Hwan, Kim, Tae Gyu

المصدر: Modern Physics Letters B; 5/20/2019, Vol. 33 Issue 14/15, pN.PAG-N.PAG, 5p

مصطلحات موضوعية: HEAT resistant alloys, TENSILE tests, CHROMIUM, STEEL, NUCLEAR power plants, MATERIAL plasticity

المؤلفون: Kim, Sung-Jin, Yu, Chang-Jae, Kim, Chi-Hwan, Lee, Sin-Doo

المساهمون: Bao, Zhenan, Gundlach, David J.

المصدر: SPIE Proceedings ; Organic Field-Effect Transistors IV ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.616176
http://proceedings.spiedigitallibrary.org/proceeding.aspx?doi=10.1117/12.616176

المؤلفون: Byun, Jai-Hyun, Kim, Chi-Hwan

المصدر: Quality Engineering ; volume 26, issue 4, page 383-391 ; ISSN 0898-2112 1532-4222

الاتاحة: http://dx.doi.org/10.1080/08982112.2013.830741
http://www.tandfonline.com/doi/pdf/10.1080/08982112.2013.830741