نتائج البحث - "Khan, Jonas"

1

Conference

Overlay performances of wafer scale nanoimprint lithography

المؤلفون: Rêche, Jérôme, Warsono, Api, De Lehelle D'Affroux, Anaïs, Khan, Jonas, Haumann, Sebastian, Kneidinger, Andrea

المساهمون: Liddle, J. Alexander, Ruiz, Ricardo

المصدر: Novel Patterning Technologies 2023

الاتاحة: http://dx.doi.org/10.1117/12.2655105

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2

Conference

Wafer scale nanoimprint lithography: distortion improvement and stabilization

المؤلفون: Rêche, Jérôme, Argoud, Maxime, De Lehelle D'Affroux, Anaïs, Al Dujaili, Haidar, Khan, Jonas, Haumann, Sebastian, Ledel, Peter, Eibelhuber, Martin

المساهمون: Panning, Eric M., Liddle, J. Alexander

المصدر: Novel Patterning Technologies 2022

الاتاحة: http://dx.doi.org/10.1117/12.2613788

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3

Academic Journal

A full-process chain assessment for nanoimprint technology on 200-mm industrial platform

المؤلفون: Teyssedre, Hubert, Landis, Stefan, Thanner, Christine, Laure, Maria, Khan, Jonas, Bos, Sandra, Eibelhuber, Martin, Chouiki, Mustapha, May, Michael, Brianceau, Pierre, Pollet, Olivier, Hazart, Jerome, Laviron, Cyrille, Pain, Laurent, Wimplinger, Markus

المصدر: Advanced Optical Technologies ; volume 6, issue 3-4, page 277-292 ; ISSN 2192-8584 2192-8576

الاتاحة: http://dx.doi.org/10.1515/aot-2017-0018
http://www.degruyter.com/view/j/aot.2017.6.issue-3-4/aot-2017-0018/aot-2017-0018.xml
https://www.degruyter.com/document/doi/10.1515/aot-2017-0018/xml
https://www.degruyter.com/document/doi/10.1515/aot-2017-0018/pdf

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4

Periodical

Overlay performances of wafer scale nanoimprint lithography

المؤلفون: Liddle, J. Alexander, Ruiz, Ricardo, Reche, Jerome, Warsono, Api, De Lehelle D'Affroux, Anaïs, Khan, Jonas, Haumann, Sebastian, Kneidinger, Andrea

المصدر: Proceedings of SPIE; May 2023, Vol. 12497 Issue: 1 p124970Q-124970Q-5, 1124736p

5

Träningsmotivation som bränsle : Träningsinstruktörers motivation för träning och instruktion

المؤلفون: Khan, Jonas

مصطلحات موضوعية: Motivation, teorin om självbestämmande, Samhälls, autonomt-stödjande, Social Behaviour Law, beteendevetenskap, träning, juridik

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::83cc3b0f108b4acb4d04e7ba72ce4408
http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-49693

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6

Periodical

Integration of sub 50 nm features based on EVG SmartNIL for 8-inch substrates

المؤلفون: Panning, Eric M., Rêche, Jérôme, Argoud, Maxime, De Lehelle D'Affroux, Anaïs, Benotmane, Khatia, Haumann, Sebastian, Khan, Jonas, Eibelhuber, Martin

المصدر: Proceedings of SPIE; February 2021, Vol. 11610 Issue: 1 p116100C-116100C-7, 1044908p

7

A full-process chain assessment for nanoimprint technology on 200-mm industrial platform

المؤلفون: Teyssedre, Hubert, Landis, Stefan, Thanner, Christine, Laure, Maria, Khan, Jonas, Bos, Sandra, Eibelhuber, Martin, Chouiki, Mustapha, May, Michael, Brianceau, Pierre, Pollet, Olivier, Hazart, Jerome, Laviron, Cyrille, Pain, Laurent, Wimplinger, Markus

المصدر: nano Online

الاتاحة: http://dx.doi.org/10.1515/nano.0069.00009
http://www.degruyter.com/view/NANO/nano.0069.00009

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8

Dissertation/ Thesis

Träningsmotivation som bränsle : Träningsinstruktörers motivation för träning och instruktion ; Driving motivation as a fuel: Training and instruction motivation of interest rate instructors

المؤلفون: Khan, Jonas

المصدر: ftluleatu

مصطلحات موضوعية: Social Behaviour Law, Samhälls-, beteendevetenskap, juridik, Motivation, träning, autonomt-stödjande, teorin om självbestämmande, psy, lang

Relation: http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-49693

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-49693

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9

Conference

Integration of sub 50 nm features based on EVG SmartNIL for 8-inch substrates.

المؤلفون: Panning, Eric M., Rêche, Jérôme, Argoud, Maxime, De Lehelle D'Affroux, Anaïs, Benotmane, Khatia, Haumann, Sebastian, Khan, Jonas, Eibelhuber, Martin

المصدر: Proceedings of SPIE; 11/3/2020, Vol. 11610, p116100C-116100C-7, 1p

10

Periodical

Wafer scale nanoimprint lithography: distortion improvement and stabilization

المؤلفون: Panning, Eric M., Liddle, J. Alexander, Reche, Jerome, Argoud, Maxime, De Lehelle D'Affroux, Anaïs, Al Dujaili, Haidar, Khan, Jonas, Haumann, Sebastian, Ledel, Peter, Eibelhuber, Martin

المصدر: Proceedings of SPIE; May 2022, Vol. 12054 Issue: 1 p1205404-1205404-7

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