المؤلفون: Bouachma, Soraya, Zheng, Xiaoying, Moreno Zuria, Alonso, Kechouane, Mohamed, Gabouze, Noureddine, Mohamedi, Mohamed

المصدر: Materials (1996-1944); Aug2024, Vol. 17 Issue 16, p4079, 13p

مصطلحات موضوعية: CLEAN energy, SUPERCAPACITOR performance, ENERGY storage, CARBON paper, CARBON nanotubes, SUPERCAPACITORS, SUPERCAPACITOR electrodes

المؤلفون: Zegtouf, Hind, Saoula, Nadia, Azibi, Mourad, Bait, Larbi, Madaoui, Noureddine, Khelladi, Mohamed Redha, Kechouane, Mohamed

المصدر: Journal of Electrical Engineering ; volume 70, issue 7, page 117-121 ; ISSN 1339-309X

الاتاحة: http://dx.doi.org/10.2478/jee-2019-0052
https://content.sciendo.com/view/journals/jee/70/7/article-p117.xml
https://www.sciendo.com/pdf/10.2478/jee-2019-0052

المؤلفون: Benazouz, Ouafa, Kezzoula, Faouzi, Schmidt, Javier, Larbah, Youssef, Kechouane, Mohamed

المساهمون: USTHB

المصدر: Applied Physics A ; volume 129, issue 10 ; ISSN 0947-8396 1432-0630

الاتاحة: http://dx.doi.org/10.1007/s00339-023-06980-9
https://link.springer.com/content/pdf/10.1007/s00339-023-06980-9.pdf
https://link.springer.com/article/10.1007/s00339-023-06980-9/fulltext.html

المؤلفون: Achour, Wafa, Ynineb, Fayssal, Hadjersi, Toufik, Moulai, Fatsah, Ifires, Madjid, Khen, Adel, Manseri, Amar, Kechouane, Mohamed

المساهمون: Direction Générale de la Recherche Scientifique et du Développement Technologique

المصدر: Journal of Applied Electrochemistry ; volume 53, issue 7, page 1405-1419 ; ISSN 0021-891X 1572-8838

الاتاحة: http://dx.doi.org/10.1007/s10800-023-01863-6
https://link.springer.com/content/pdf/10.1007/s10800-023-01863-6.pdf
https://link.springer.com/article/10.1007/s10800-023-01863-6/fulltext.html

المؤلفون: Achour, Wafa, Ynineb, Fayssal, Hadjersi, Toufik, Moulai, Fatsah, Ifires, Madjid, Khen, Adel, Manseri, Amar, Kechouane, Mohamed

المصدر: Journal of Applied Electrochemistry; Jul2023, Vol. 53 Issue 7, p1405-1419, 15p

مصطلحات موضوعية: ELECTRODES, AQUEOUS electrolytes, SUPERCAPACITOR electrodes, ELECTRONIC equipment, SUPERCAPACITORS, NANOWIRES, SURFACE interactions

المؤلفون: Ayat, Maha, Belhousse, Samia, Boarino, Luca, Gabouze, Noureddine, Boukherroub, Rabah, Kechouane, Mohamed

المصدر: Nanoscale Research Letters ; volume 9, issue 1 ; ISSN 1556-276X

الاتاحة: http://dx.doi.org/10.1186/1556-276x-9-482
https://link.springer.com/content/pdf/10.1186/1556-276X-9-482.pdf

المؤلفون: Ayat, Maha, Kechouane, Mohamed, Yaddadene, Chafiaa, Berouaken, Malika, Ayouz, Katia, Boarino, Luca, Gabouze, Noureddine

المساهمون: Ayat, Maha, Kechouane, Mohamed, Yaddadene, Chafiaa, Berouaken, Malika, Ayouz, Katia, Boarino, Luca, Gabouze, Noureddine

مصطلحات موضوعية: Porous silicon, Pillars structures, Hydrophobicity, Gas sensing applications

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000511687900016; journal:SILICON; http://hdl.handle.net/11696/59889; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85059697828

الاتاحة: http://hdl.handle.net/11696/59889
https://doi.org/10.1007/s12633-018-0055-2

المؤلفون: Boughelout, Abderrahmane, Macaluso, Roberto, Crupi, Isodiana, Megna, Bartolomeo, Brighet, Amer, Trari, Mohamed, Kechouane, Mohamed

المصدر: Semiconductor Science and Technology ; volume 36, issue 1, page 015001 ; ISSN 0268-1242 1361-6641

الاتاحة: http://dx.doi.org/10.1088/1361-6641/abbc42
https://iopscience.iop.org/article/10.1088/1361-6641/abbc42
https://iopscience.iop.org/article/10.1088/1361-6641/abbc42/pdf

المؤلفون: Zegtouf, Hind, Saoula, Nadia, Azibi, Mourad, Sali, Samira, Mechri, Hanane, Sam, Sabrina, Khelladi, Mohamed Redha, Kechouane, Mohamed

المصدر: Applied Surface Science ; volume 532, page 147403 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/j.apsusc.2020.147403
https://api.elsevier.com/content/article/PII:S0169433220321607?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0169433220321607?httpAccept=text/plain

المؤلفون: Kezzoula, Faouzi, Kechouane, Mohamed, Mohammed-Brahim, Tayeb, Menari, Hamid

المساهمون: DGRSDT-ALGERIA

المصدر: Silicon ; volume 12, issue 2, page 405-411 ; ISSN 1876-990X 1876-9918

الاتاحة: http://dx.doi.org/10.1007/s12633-019-00129-1
http://link.springer.com/content/pdf/10.1007/s12633-019-00129-1.pdf
http://link.springer.com/article/10.1007/s12633-019-00129-1/fulltext.html

المؤلفون: Lachebi, Ines, Fedala, Abdelkrim, Djenizian, Thierry, Hadjersi, Toufik, Kechouane, Mohamed

المساهمون: USTHB, CNEPRU

المصدر: Surface and Coatings Technology ; volume 343, page 160-165 ; ISSN 0257-8972

الاتاحة: http://dx.doi.org/10.1016/j.surfcoat.2017.09.061
https://api.elsevier.com/content/article/PII:S0257897217309957?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0257897217309957?httpAccept=text/plain

المؤلفون: Boughelout, Abderrahmane, Macaluso, Roberto, Crupi, Isodiana, Megna, Bartolomeo, Brighet, Amer, Trari, Mohamed, Kechouane, Mohamed

المصدر: Semiconductor Science & Technology; Jan2021, Vol. 36 Issue 1, p1-10, 10p

مصطلحات موضوعية: LASER deposition, PULSED laser deposition, HETEROJUNCTIONS, LOW temperatures, ATOMIC force microscopy, BAND gaps

المؤلفون: Berrian, Djaber, Fathi, Mohamed, Kechouane, Mohamed

المصدر: Journal of Electronic Materials ; volume 47, issue 2, page 1140-1150 ; ISSN 0361-5235 1543-186X

الاتاحة: http://dx.doi.org/10.1007/s11664-017-5828-7
http://link.springer.com/article/10.1007/s11664-017-5828-7/fulltext.html
http://link.springer.com/content/pdf/10.1007/s11664-017-5828-7.pdf

المؤلفون: Tadjine, Rabah, Alim, Mounes M., Kechouane, Mohamed

المساهمون: National Funding of Research

المصدر: Surface and Coatings Technology ; volume 309, page 573-578 ; ISSN 0257-8972

الاتاحة: http://dx.doi.org/10.1016/j.surfcoat.2016.12.009
https://api.elsevier.com/content/article/PII:S0257897216312956?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0257897216312956?httpAccept=text/plain

المؤلفون: Kaibi, Amel, Guittoum, Abderrahim, Souami, Nassim, Kechouane, Mohamed

المصدر: Journal of Metastable and Nanocrystalline Materials; April 2021, Vol. 32 Issue: 1 p1-13, 13p

المؤلفون: Benabdelmoumene, Abdelmadjid, Djezzar, Boualem, Tahi, Hakim, Chenouf, Amel, Trombetta, Leonard, Kechouane, Mohamed

المصدر: 2012 IEEE International Integrated Reliability Workshop Final Report ; page 175-178

الاتاحة: http://dx.doi.org/10.1109/iirw.2012.6468949
http://xplorestaging.ieee.org/ielx7/6457539/6468894/06468949.pdf?arnumber=6468949

المؤلفون: Benabdelmoumene, Abdelmadjid, Djezzar, Boualem, Tahi, Hakim, Chenouf, Amel, Trombetta, Leonard, Kechouane, Mohamed

المصدر: 2012 24th International Conference on Microelectronics (ICM) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/icm.2012.6471430
http://xplorestaging.ieee.org/ielx7/6461634/6471355/06471430.pdf?arnumber=6471430

المؤلفون: Kezzoula, Faouzi, Kechouane, Mohamed, Mohammed-Brahim, Tayeb, Menari, Hamid

المصدر: SILICON (1876990X); Feb2020, Vol. 12 Issue 2, p405-411, 7p

المؤلفون: Zegtouf, Hind, Saoula, Nadia, Azibi, Mourad, Bait, Larbi, Madaoui, Noureddine, Khelladi, Mohamed Redha, Kechouane, Mohamed

المصدر: Journal of Electrical Engineering; 2019, Vol. 70 Issue 7, p117-121, 5p

مصطلحات موضوعية: MAGNETRON sputtering, THIN films, ZIRCONIUM oxide, X-ray diffraction, ATOMIC force microscopy, STAINLESS steel

المؤلفون: Mokeddem, Kamel, Kechouane, Mohamed

مصطلحات موضوعية: Negative capacitance, Silicon nitride, FTIR, Sputtering

Relation: Superlattices and Microstructures 86 (2015);pp.335-341; http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/2191

الاتاحة: http://dlibrary.univ-boumerdes.dz:8080/handle/123456789/2191