المؤلفون: Junekyun Park, Eunkyu Shin, Jongwoo Park, Yonghan Roh

المصدر: Applied Sciences, Vol 10, Iss 17, p 6081 (2020)

مصطلحات موضوعية: hexamethyldisilazane, CdSe/ZnS, defect passivation, emission profile, charge balance, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/10/17/6081; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/0e9a11412dc947e981ce3fc0ff1ec2e1

المؤلفون: Sanghyun Lee, Jaehyun Kim, Junekyun Park, Eunkyu Shin, Yonghan Roh

المصدر: Current Applied Physics. 38:81-90

مصطلحات موضوعية: General Physics and Astronomy, General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e9c0c93f62b27f2b45c70aa06e7e638b
https://doi.org/10.1016/j.cap.2022.03.007

المؤلفون: Kihyun Choi, Hyun Chul Sagong, Wonchang Kang, Hyunjin Kim, Jiang Hai, Miji Lee, Bomi Kim, Mi-ji Lee, Soonyoung Lee, Hyewon Shim, Junekyun Park, Youngwoo Cho, Hwasung Rhee, Sangwoo Pae

المصدر: IEEE Transactions on Electron Devices. 66:5399-5403

مصطلحات موضوعية: 010302 applied physics, Materials science, Computer science, business.industry, Extreme ultraviolet lithography, Process (computing), Time-dependent gate oxide breakdown, 01 natural sciences, High volume manufacturing, Electronic, Optical and Magnetic Materials, Back end of line, Reliability (semiconductor), Logic gate, Extreme ultraviolet, 0103 physical sciences, Multiple patterning, Optoelectronics, Static random-access memory, Electrical and Electronic Engineering, business, Hot-carrier injection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d3ac446006f81966c9b6356d809ebb07
https://doi.org/10.1109/ted.2019.2950008

المؤلفون: Jaewon Jeong, Seokwon Jeong, Junekyun Park, Sanghyun Lee, Juhyung Kim, Yonghan Roh, Jaehyun Kim

المصدر: Journal of Nanoscience and Nanotechnology. 19:6152-6157

مصطلحات موضوعية: Electron transport layer, Materials science, business.industry, Biomedical Engineering, Bioengineering, Charge (physics), General Chemistry, Electron, Condensed Matter Physics, law.invention, law, Quantum dot, Optoelectronics, General Materials Science, Quantum efficiency, Spin (physics), business, HOMO/LUMO, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2dbb76f107d0111c66fdda0a5b1ceff1
https://doi.org/10.1166/jnn.2019.17020

المؤلفون: Hyewon Shim, Hyunchul Sagong, Junekyun Park, Jinju Kim, Hwa-Sung Rhee, Hai Jiang, Eun-Cheol Lee, Kihyun Choi

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, 020208 electrical & electronic engineering, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, 01 natural sciences, Scaling, Reliability (statistics), Degradation (telecommunications), Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8304388604ba85cbf4b415ebb79b07a3
https://doi.org/10.1109/irps46558.2021.9405129

المؤلفون: Sangwoo Pae, Hwa-Sung Rhee, Hyun Chul Sagong, Junekyun Park, Kihyun Choi, Hai Jiang

المصدر: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).

مصطلحات موضوعية: Reliability (semiconductor), Materials science, Dielectric strength, Passivation, Dangling bond, Time-dependent gate oxide breakdown, Dielectric, Forming gas, Engineering physics, Hot-carrier injection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9f2922bdff54bb8d18ac97f6e6ade2e4
https://doi.org/10.1109/edtm47692.2020.9117835

المؤلفون: Hwa-Sung Rhee, Tae-Young Jeong, Junekyun Park, Hyewon Shim, Brandon Lee, Taiki Uemura, Yoohwan Kim, Hyunchul Sagong, Yongsung Ji, Sangwoo Pae, Jinju Kim, Dongkyun Kwon, Hai Jiang

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Work (thermodynamics), Computer science, Thermal resistance, 02 engineering and technology, Integrated circuit, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, Superposition principle, Matrix (mathematics), Reliability (semiconductor), law, 0103 physical sciences, Thermal, Proximity effect (audio), Electronic engineering, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6521431ade2f3e6169f88462c53fb75
https://doi.org/10.1109/irps45951.2020.9128322

المؤلفون: Junekyun Park, Hyunchul Sagong, Sang-chul Shin, Sangwoo Pae, Jinju Kim, Hai Jiang

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Computer science, Transistor, 020207 software engineering, 02 engineering and technology, Ring oscillator, 01 natural sciences, law.invention, Footprint (electronics), Reliability (semiconductor), law, 0103 physical sciences, Strain effect, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::81662716ea8f06b0f19f0760a5877cda
https://doi.org/10.1109/irps.2019.8720409

المؤلفون: Hyunjun Choi, Sang-chul Shin, Jinseok Kim, Han-Byul Kang, Tae-Young Jeong, Jae-Won Chang, Myung Soo Yeo, Sangkwon Park, Sangwoo Pae, Jo Yoon-Kyeong, Junekyun Park

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: Materials science, Intermetallic, 02 engineering and technology, Temperature cycling, 021001 nanoscience & nanotechnology, Electromigration, 020501 mining & metallurgy, Stress (mechanics), 0205 materials engineering, Electrical resistivity and conductivity, Soldering, Composite material, 0210 nano-technology, Joule heating, Current density

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::189f40c34b8b9b3e157a2c3a49c5ef88
https://doi.org/10.1109/ipfa.2018.8452493

المؤلفون: Sang-chul Shin, Jinju Kim, Hyunchul Sagong, Minhyuck Choi, Ukjin Jung, Sangwoo Pae, Hyun-Jin Kim, Minjung Jin, Junekyun Park

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Materials science, Gate oxide, business.industry, 0103 physical sciences, Gate dielectric, Optoelectronics, Time-dependent gate oxide breakdown, SILC, business, 01 natural sciences

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2e9ad79cf416735443e8d350cacd726e
https://doi.org/10.1109/irps.2018.8353577

المؤلفون: Sangsu Ha, Hyun-Jin Kim, Tae-Young Jeong, Sang-chul Shin, Minhyeok Choe, Sungyoung Yoon, Hyewon Shim, Hyun Chul Sagong, Junekyun Park, Seungjin Choo, Sangwoo Pae

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, Pressure range, Materials science, Reliability (semiconductor), Passivation, 0103 physical sciences, Gate dielectric, Dangling bond, Process (computing), Forming gas, 01 natural sciences, Engineering physics, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f4681acc47ccbe4c0e653bb26a07d76d
https://doi.org/10.1109/irps.2018.8353649

المؤلفون: Miji Lee, Jae-heon Noh, Jeong-Hoon Kim, Yeon-sik Choo, Eunkyeong Choi, Hoyoung Kang, Sang-chul Shin, Gilhwan Do, Juhyeon Shin, Changki Kang, Hyunchul Sagong, Tae-Young Jeong, Dongyoon Sun, Y. Ji, Ung Cho, Junho Kim, Junekyun Park, Young Heo, Jungin Kim, Sangwoo Pae

المصدر: IRPS

مصطلحات موضوعية: Pixel, Computer science, business.industry, Image quality, 010401 analytical chemistry, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, 0104 chemical sciences, Reliability (semiconductor), CMOS, Stack (abstract data type), 0202 electrical engineering, electronic engineering, information engineering, Noise (video), Image sensor, business, Computer hardware, Camera module

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a4c7587c3e8ff60a451ca009188f9439
https://doi.org/10.1109/irps.2018.8353570

المؤلفون: Taiki Uemura, Jungin Kim, Jinju Kim, Hyun Chul Sagong, Gunrae Kim, Ukjin Jung, Changze Liu, Sangwoo Pae, Sang-chul Shin, Junekyun Park, Minjung Jin

المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).

مصطلحات موضوعية: 010302 applied physics, Engineering, Variation (linguistics), business.industry, 0103 physical sciences, Electronic engineering, Node (circuits), Static random-access memory, business, 01 natural sciences, Reliability (statistics), Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9895eb26a05ceb92006dad815918217e
https://doi.org/10.1109/irps.2017.7936416

المؤلفون: Kwangsoo Kim, Kyung Taek Lee, Minhyeok Choe, Sungeun Kim, Jongwoo Park, Kidan Bae, Junekyun Park, Sangwoo Pae, Hyun-Woo Lee, Hyun Chul Sagong

المصدر: ECS Transactions. 58:3-7

مصطلحات موضوعية: Materials science, Fabrication, Dielectric strength, business.industry, Annealing (metallurgy), Transistor, chemistry.chemical_element, Time-dependent gate oxide breakdown, law.invention, chemistry, law, Optoelectronics, business, Tin, Metal gate, Algorithm, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4322da0fefda03b95a52dcbbc82c9e4f
https://doi.org/10.1149/05807.0003ecst

المؤلفون: Junekyun Park, Taiki Uemura, Taehyun An, Soonyoung Lee, Sangwoo Pae, Man Chang, Minjung Jin, Jinju Kim, Changze Liu, Jungin Kim, Kangjung Kim, Hyewon Shim, Gunrae Kim

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, 020208 electrical & electronic engineering, Transistor, Electrical engineering, Time-dependent gate oxide breakdown, 02 engineering and technology, 01 natural sciences, PMOS logic, law.invention, Reliability (semiconductor), Stack (abstract data type), law, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Node (circuits), Static random-access memory, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9958675bab4dfade9e2c908d044ef77b
https://doi.org/10.1109/iedm.2016.7838420

المؤلفون: Gunrae Kim, Jongwoo Park, Yong-Bum Jo, Junekyun Park

المصدر: IEEE Transactions on Device and Materials Reliability. 8:368-374

مصطلحات موضوعية: Resistive touchscreen, Auger electron spectroscopy, Materials science, Electronic packaging, Analytical chemistry, Molding (process), Electronic, Optical and Magnetic Materials, Stress (mechanics), Dendrite (crystal), Adhesive, Electrical and Electronic Engineering, Quad Flat Package, Composite material, Safety, Risk, Reliability and Quality

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::af830661016b4f100aaf246bd4580cf9
https://doi.org/10.1109/tdmr.2008.919578

المؤلفون: Kyong Taek Lee, Wonchang Kang, Eun-Ae Chung, Gunrae Kim, Hyewon Shim, Hyunwoo Lee, Hyejin Kim, Minhyeok Choe, Nae-In Lee, Patel, Anuj, Junekyun Park, Jongwoo Park

المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS) ; page 2D.1.1-2D.1.4

الاتاحة: http://dx.doi.org/10.1109/irps.2013.6531956
http://xplorestaging.ieee.org/ielx7/6523362/6531927/06531956.pdf?arnumber=6531956

المؤلفون: Hyun-Goo Jeon, Kyung-Il Ouh, Junekyun Park, Jongwoo Park, Yong-Bum Jo

المصدر: IEEE Transactions on Components and Packaging Technologies. 30:724-730

مصطلحات موضوعية: Void (astronomy), Materials science, Compressive strength, High-temperature operating life, Electronic engineering, Extrusion, Electrical and Electronic Engineering, Composite material, Quad Flat Package, Circuit reliability, Electromigration, Electronic, Optical and Magnetic Materials, Stress concentration

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b3f68f6e386d97cf75621b0ecd21d5fe
https://doi.org/10.1109/tcapt.2007.906322

المؤلفون: Junekyun Park, Hyun-Goo Jeon, Sam-Young Kim, Man-Young Shin, Kyung-Il Ouh, Sang-Cheol Shin, Back-Sung Kim, Hyun-Joon Cha, Jongwoo Park, Yong-Bum Jo

المصدر: IEEE Transactions on Components and Packaging Technologies. 30:731-744

مصطلحات موضوعية: Wire bonding, Auger electron spectroscopy, Materials science, Cost effectiveness, Alloy, Metallurgy, Intermetallic, Epoxy, Molding (process), engineering.material, Electronic, Optical and Magnetic Materials, visual_art, visual_art.visual_art_medium, engineering, Surface roughness, Electrical and Electronic Engineering, Composite material

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0c8ff73e995162b26ee4139f58469a18
https://doi.org/10.1109/tcapt.2007.906318

المؤلفون: Hyunchul Sagong, Seungjin Choo, Jin-soak Kim, Minjung Jin, Yeshin Kim, Sungyoung Yoon, Seung Chul Shin, Changze Liu, Sangwoo Pae, Seung-Hyun Park, Ju-Seop Park, Hyeonwoo Nam, Hwa-Kyung Kim, Hyewon Shim, Junekyun Park

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Engineering, Fin, Product design, business.industry, Transistor, Work (physics), Geometry, law.invention, Reliability engineering, Stress (mechanics), Reliability (semiconductor), law, Product (mathematics), Stress conditions, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::db222c11cb9a817ac51c35177685375c
https://doi.org/10.1109/iedm.2015.7409744