المؤلفون: Jong-Ho Park, Sung-Hoi Hur, Joun-Hee Lee, Jin-Taek Park, Sel, J.-S., Jong-Won Kim, Sang-Bin Song, Jung-Young Lee, Ji-Hwon Lee, Suk-Joon Son, Yong-Seok Kim, Min-Cheol Park, Sooin Chai, Jung-Dal Choi, Chung, U.-I., Joo-Tae Moon, Kycong-Tae Kim, Kinam Kim, Byang-Il Ryu

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. ; page 873-876

الاتاحة: http://dx.doi.org/10.1109/iedm.2004.1419319
http://xplorestaging.ieee.org/ielx5/9719/30682/01419319.pdf?arnumber=1419319