المؤلفون: Jong-Ahn Kim, Jae Yong Lee, Chu-Shik Kang, Sung Hoon Eom

المصدر: International Journal of Precision Engineering and Manufacturing.

مصطلحات موضوعية: Mechanical Engineering, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d5804fe871ea41a71182130de103352
https://doi.org/10.1007/s12541-023-00814-7

المؤلفون: Jong-Ahn Kim, Jae Heun Woo, Chu-Shik Kang, Jae Wan Kim, Jae Yong Lee

المصدر: IEEE Transactions on Instrumentation and Measurement. 69:2225-2231

مصطلحات موضوعية: Physics, Observational error, business.industry, 020208 electrical & electronic engineering, Detector, Binary scaling, 02 engineering and technology, Flat panel display, law.invention, Interferometry, Optics, Planar, law, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, Instrumentation, Encoder, Position sensor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::00b2dda23dbd7ac2c0b8f397040e5e03
https://doi.org/10.1109/tim.2019.2922513

المؤلفون: Jae Heun Woo, Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Sunghoon Eom, Jae Yong Lee

المصدر: Optical Engineering. 61

مصطلحات موضوعية: General Engineering, Atomic and Molecular Physics, and Optics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5b7e0f5911346859302af603ed674050
https://doi.org/10.1117/1.oe.61.5.054104

المؤلفون: Jong-Ahn Kim, Jaeseok Bae, Jungjae Park, Jonghan Jin, Heulbi Ahn

المصدر: International Journal of Precision Engineering and Manufacturing. 20:463-477

مصطلحات موضوعية: 0209 industrial biotechnology, Materials science, business.industry, Mechanical Engineering, 02 engineering and technology, Industrial and Manufacturing Engineering, Interferometry, Laser interferometry, 020303 mechanical engineering & transports, 020901 industrial engineering & automation, Semiconductor, Optics, 0203 mechanical engineering, Interference (communication), Metre, Monochromatic color, Electrical and Electronic Engineering, business, Analysis method

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::93e5bf69ea821bdf9ee361adc1067eb6
https://doi.org/10.1007/s12541-019-00105-0

المؤلفون: Jong-Ahn Kim, Jaeseok Bae, Jungjae Park, Jonghan Jin

المصدر: Optics Communications. 431:181-186

مصطلحات موضوعية: Materials science, business.industry, 02 engineering and technology, Repeatability, Photoresist, 021001 nanoscience & nanotechnology, Laser, 01 natural sciences, Sample (graphics), Atomic and Molecular Physics, and Optics, Standard deviation, Electronic, Optical and Magnetic Materials, law.invention, 010309 optics, Interferometry, Optics, law, 0103 physical sciences, Wafer, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, 0210 nano-technology, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::39e1aaf42baa3dccf87a87d6b6949e8b
https://doi.org/10.1016/j.optcom.2018.09.024

المؤلفون: Jong-Ahn Kim, Jae Yong Lee, Chu-Shik Kang, Jae Heun Woo

المصدر: Measurement. 194:111023

مصطلحات موضوعية: Applied Mathematics, Electrical and Electronic Engineering, Condensed Matter Physics, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::79382df904cacb921f290de3cf5b8e30
https://doi.org/10.1016/j.measurement.2022.111023

المؤلفون: Tae Bong Eom, Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin, Chu-Shik Kang

المصدر: Measurement. 118:113-119

مصطلحات موضوعية: Surface (mathematics), 0209 industrial biotechnology, Materials science, Bar (music), Measure (physics), 02 engineering and technology, 01 natural sciences, Standard deviation, law.invention, 010309 optics, symbols.namesake, 020901 industrial engineering & automation, Planar, Optics, law, 0103 physical sciences, Electrical and Electronic Engineering, Instrumentation, business.industry, Applied Mathematics, Astrophysics::Instrumentation and Methods for Astrophysics, Condensed Matter Physics, Laser, Interferometry, Fourier transform, symbols, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::50b72624663a5e9b9794dd65b845619f
https://doi.org/10.1016/j.measurement.2018.01.023

المؤلفون: Chu-shik Kang, Jae Wan Kim, Jong-ahn Kim, Tae Bong Eom

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.imeko2009.it.pt/Papers/FP_102.pdf.

مصطلحات موضوعية: step height, profile measurement, Fourier

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.415.9091; http://www.imeko2009.it.pt/Papers/FP_102.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.415.9091
http://www.imeko2009.it.pt/Papers/FP_102.pdf

المؤلفون: Jong-Ahn Kim, Jae Yong Lee, Chu-Shik Kang, Jae Wan Kim, Jonghan Jin

المصدر: The Review of scientific instruments. 90(4)

مصطلحات موضوعية: 010302 applied physics, Physics, business.industry, Resolution (electron density), Autocollimator, 01 natural sciences, Collimated light, 010305 fluids & plasmas, law.invention, Amplitude, Optics, law, Modulation, 0103 physical sciences, Double-slit experiment, Allan variance, business, Instrumentation, Intensity (heat transfer)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::047f01ceba825787d8b5b87eeebfebc7
https://pubmed.ncbi.nlm.nih.gov/31043054

المؤلفون: Jae Heun Woo, Jae Yong Lee, Chu-Shik Kang, Jong-Ahn Kim

المصدر: Measurement Science and Technology. 32:105204

مصطلحات موضوعية: Physics, Optics, business.industry, Applied Mathematics, Dot array, Element (category theory), business, Instrumentation, Engineering (miscellaneous)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0408efbfa95a3229d68bb20a2e441d7c
https://doi.org/10.1088/1361-6501/ac0d76

المؤلفون: Jungjae Park, Jonghan Jin, Jong-Ahn Kim, Heulbi Ahn

المصدر: Journal of Lightwave Technology. 34:5462-5466

مصطلحات موضوعية: Materials science, Microscope, Optical fiber, Silicon, business.industry, Confocal, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, 010309 optics, Interferometry, Light intensity, Optics, chemistry, law, Confocal microscopy, 0103 physical sciences, 0210 nano-technology, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b4e37ab17722d2ff0a53a516f1b1bcb6
https://doi.org/10.1109/jlt.2016.2618419

المؤلفون: Jae Heun Woo, Jong-Ahn Kim, Jae Yong Lee, Chu-Shik Kang, Myung Soon Kim, Sung Hoon Eom

المصدر: Measurement Science and Technology. 32:047003

مصطلحات موضوعية: Physics, Calibration (statistics), Applied Mathematics, Acoustics, Linear measurement, Gauge (firearms), Instrumentation, Engineering (miscellaneous)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6fa11bcd980a6e0e12bdfabbe8c26ed8
https://doi.org/10.1088/1361-6501/abcb23

المؤلفون: MyeongHyeon Kim, Mun Seog Kim, Sungjun Lee, Jong-Ahn Kim, Dong-Hun Chae, Minky Seo, Kwang-Cheol Lee, Byung-Chill Woo, Dongmin Kim, In-Mook Choi

المصدر: Metrologia. 57:055006

مصطلحات موضوعية: Nuclear physics, Physics, symbols.namesake, Kilogram, Crystal density, General Engineering, symbols, International System of Units, Standard uncertainty, Planck constant, Mass measurement, Realization (systems)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c40a5fa1313d6388a81939b2e98a6f56
https://doi.org/10.1088/1681-7575/ab92e0

المؤلفون: Chu-Shik Kang, Jae Wan Kim, Jonghan Jin, Jae Yong Lee, Jong-Ahn Kim

المصدر: Measurement. 153:107399

مصطلحات موضوعية: Physics, Observational error, Angular displacement, Applied Mathematics, Acoustics, 020208 electrical & electronic engineering, 010401 analytical chemistry, 02 engineering and technology, Repeatability, Condensed Matter Physics, 01 natural sciences, 0104 chemical sciences, symbols.namesake, Fourier analysis, Robustness (computer science), Reference values, 0202 electrical engineering, electronic engineering, information engineering, symbols, Electrical and Electronic Engineering, Instrumentation, Position sensor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4feb46d1ebb6544d5ba6622cb6d3e00b
https://doi.org/10.1016/j.measurement.2019.107399

المؤلفون: Jong-Ahn Kim, Tae Bong Eom, Jonghan Jin, Chu-Shik Kang, Jae Wan Kim

المصدر: Measurement. 80:288-293

مصطلحات موضوعية: business.industry, Applied Mathematics, 010401 analytical chemistry, Detector, Phase (waves), Binary number, Condensed Matter Physics, 01 natural sciences, Signal, 0104 chemical sciences, 010309 optics, Optics, Position (vector), 0103 physical sciences, Binary code, Electrical and Electronic Engineering, business, Instrumentation, Encoder, Rotation (mathematics), Mathematics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c3b09e9fe0c29d69f19812f46099af45
https://doi.org/10.1016/j.measurement.2015.11.037

المؤلفون: Jae Wan Kim, Chu-Shik Kang, Tae Bong Eom, Jonghan Jin, Jong-Ahn Kim

المصدر: International Journal of Precision Engineering and Manufacturing. 16:1955-1961

مصطلحات موضوعية: Materials science, Fringe shift, Waviness, business.industry, Mechanical Engineering, System of measurement, Detector, Interference (wave propagation), Industrial and Manufacturing Engineering, Interferometry, Optics, Calibration, Cylindrical lens, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15042572ef9f0f74ad7ce180fa58e771
https://doi.org/10.1007/s12541-015-0254-3

المؤلفون: Tae Bong Eom, Chu-Shik Kang, Jae Wan Kim, Jonghan Jin, Jong-Ahn Kim

المصدر: Measurement. 61:257-262

مصطلحات موضوعية: Engineering, business.industry, Applied Mathematics, Amplifier, Detector, Right angle, Physics::Optics, Reflector (antenna), Condensed Matter Physics, Laser, law.invention, Interferometry, Optics, law, Prism, Electrical and Electronic Engineering, business, Instrumentation, Watt balance

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7cc26f3f3fc0b85c352cda76ca765fd0
https://doi.org/10.1016/j.measurement.2014.10.055

المؤلفون: Jonghan Jin, Jae Wan Kim, Jong-Ahn Kim, Chu-Shik Kang, Jae Yong Lee

المصدر: The Review of scientific instruments. 88(5)

مصطلحات موضوعية: Accuracy and precision, Materials science, Laser diode, business.industry, Phase (waves), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Standard deviation, Quadrature (mathematics), law.invention, 010309 optics, Interferometry, Optics, law, 0103 physical sciences, 0210 nano-technology, business, Instrumentation, Refractive index, Rotation (mathematics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1fce3298a5f49cff0fe29aff60cbd2a
https://pubmed.ncbi.nlm.nih.gov/28571473

المؤلفون: Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin, Jungjae Park

المصدر: Optics Communications. 305:170-174

مصطلحات موضوعية: Materials science, business.industry, Physics::Optics, Translation (geometry), Laser, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Interferometry, Optics, law, Wafer, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, business, Step-index profile, Refractive index, Optical path length, Physical quantity

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d954a81548cac5e527ee4c41b02d8f09
https://doi.org/10.1016/j.optcom.2013.03.055

المؤلفون: Chu-Shik Kang, Jae Wan Kim, Tae Bong Eom, Jong-Ahn Kim, Jonghan Jin

المصدر: International Journal of Precision Engineering and Manufacturing. 14:367-371

مصطلحات موضوعية: Engineering, Generator (computer programming), Precision engineering, business.industry, Mechanical Engineering, Autocollimator, Signal, Industrial and Manufacturing Engineering, Metrology, law.invention, Optics, law, Calibration, Electrical and Electronic Engineering, business, Encoder, Uncertainty analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1978bb596c6d37d5e4fa9525578b9809
https://doi.org/10.1007/s12541-013-0051-9