المؤلفون: John P. Snyder, John M. Larson

المصدر: IEEE Transactions on Electron Devices. 53:1048-1058

مصطلحات موضوعية: Materials science, business.industry, Schottky barrier, Electrical engineering, Schottky diode, Strained silicon, Electronic, Optical and Magnetic Materials, CMOS, MOSFET, Parasitic element, Optoelectronics, Electrical and Electronic Engineering, business, NMOS logic, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::129c129c477cb0243a3f108f2c1176de
https://doi.org/10.1109/ted.2006.871842

المؤلفون: John M. Larson, Bruce Wheeler, Craig L. Keast, Peter W. Wyatt, D.-R. Yost, C. L. Chen, John P. Snyder, S. Calawa, Michael Fritze

المصدر: IEEE Electron Device Letters. 25:220-222

مصطلحات موضوعية: Fabrication, Materials science, Silicon, Equivalent series resistance, business.industry, Schottky barrier, Transistor, Electrical engineering, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Cutoff frequency, Electronic, Optical and Magnetic Materials, law.invention, Platinum silicide, chemistry.chemical_compound, chemistry, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Electrical and Electronic Engineering, business, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68aa8e0371e1ecdbca394497629fe30b
https://doi.org/10.1109/led.2004.826294

المؤلفون: Soonam Park, Feng Liao, John M. Larson, Steven L. Girshick, Michael R. Zachariah

المصدر: Plasma Chemistry & Plasma Processing; Sep2004, Vol. 24 Issue 3, p353-372, 20p

المؤلفون: Nicholas A. Peppas, Lucy M. Lucht, John M. Larson

المصدر: Energy & Fuels. 1:56-58

مصطلحات موضوعية: Fuel Technology, Differential scanning calorimetry, Chemistry, Stereochemistry, General Chemical Engineering, Energy Engineering and Power Technology, Physical chemistry, Molecule, Solvent extraction, Glass transition, Macromolecule

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2989c8723cc90c0b63dad2d56b1debae
https://doi.org/10.1021/ef00001a010