المؤلفون: König, C., Sneppen, T.B., Bastos da Silva Fanta, A., Jinschek, J.

المصدر: König , C , Sneppen , T B , Bastos da Silva Fanta , A & Jinschek , J 2023 , ' Dynamic SEM in-situ studies: A tool to investigate microstructural evolution during metal additive manufacturing? ' , 3rd Asia-Pacific International Conference on Additive Manufacturing , Sydney , Australia , 21/06/2023 - 23/06/2023 .

وصف الملف: application/pdf

Relation: https://orbit.dtu.dk/en/publications/24a8863b-9582-443e-9363-d76c916d8858

الاتاحة: https://orbit.dtu.dk/en/publications/24a8863b-9582-443e-9363-d76c916d8858
https://backend.orbit.dtu.dk/ws/files/345932126/Abstract_APICAM23_V03.pdf

المؤلفون: Yang, Y.-C., Bastos da Silva Fanta, A, Jinschek, J., Popovich, V., Zhu, J.

المصدر: Yang , Y-C , Bastos da Silva Fanta , A , Jinschek , J , Popovich , V & Zhu , J 2023 , ' Study in Phase-Transformation Temperature in Nitinol by In Situ TEM Heating ' , FEMS EUROMAT 2023 , Frankfurt am Main , Germany , 03/09/2023 - 07/09/2023 .

وصف الملف: application/pdf

Relation: https://orbit.dtu.dk/en/publications/62adac51-c319-464c-9ed4-867be26876ef

الاتاحة: https://orbit.dtu.dk/en/publications/62adac51-c319-464c-9ed4-867be26876ef
https://backend.orbit.dtu.dk/ws/files/348816109/Pre-abstract_2023_FEMS_EJ_final_1_.pdf

المؤلفون: Ek, M, Hansen, L P, Chen, F R, van Dyck, D, Kisielowski, C, Specht, P, Damsgaard, C D, Jinschek, J R, Helveg, S

المصدر: Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 1291-1291 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1093/micmic/ozad067.660
https://academic.oup.com/mam/article-pdf/29/Supplement_1/1291/50933344/ozad067.660.pdf

المؤلفون: Jinschek, J, Primig, S, Proust, G

المصدر: urn:ISSN:0022-2461 ; urn:ISSN:1573-4803 ; Journal of Materials Science, 57, 21, 9525-9526

مصطلحات موضوعية: anzsrc-for: 03 Chemical Sciences, anzsrc-for: 09 Engineering

Relation: http://hdl.handle.net/1959.4/unsworks_80309; https://doi.org/10.1007/s10853-022-07260-2

الاتاحة: http://hdl.handle.net/1959.4/unsworks_80309
https://doi.org/10.1007/s10853-022-07260-2

المؤلفون: Kovacs, A., Schaffer, B., Moreno, M. S., Jinschek, J. R., Craven, A. J., Dietl, T., Bonanni, A., Dunin-Borkowski, R. E.

المصدر: Journal of Applied Physics 114, 033530 (2013)

مصطلحات موضوعية: Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/1307.7871

المؤلفون: O’Brien, S. P., Christudasjustus, J., Esteves, L., Vijayan, S., Jinschek, J. R., Birbilis, N., Gupta, R. K.

المصدر: npj Materials Degradation ; volume 5, issue 1 ; ISSN 2397-2106

الاتاحة: http://dx.doi.org/10.1038/s41529-021-00158-5
https://www.nature.com/articles/s41529-021-00158-5.pdf
https://www.nature.com/articles/s41529-021-00158-5

المؤلفون: Koenig, C., Sneppen, T.B., Bastos da Silva, A., Jinschek, J.

المصدر: Koenig , C , Sneppen , T B , Bastos da Silva , A & Jinschek , J 2023 , ' Investigate microstructural evolution in metal additive manufacturing processes using dynamic in-situ SEM. ' , 8th International Conference on Recrystallization and Grain Growth , Chongqing , China , 15/05/2023 - 19/05/2023 .

Relation: https://orbit.dtu.dk/en/publications/f037204d-5d1f-4852-bf5b-9958bf3510fc

الاتاحة: https://orbit.dtu.dk/en/publications/f037204d-5d1f-4852-bf5b-9958bf3510fc

المؤلفون: Jespersen, S. P., Ek, M., Jinschek, J. R., Hendriksen, B., Mele, L., Dona, P., Damsgaard, C. D., Helveg, S.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 1982-1983 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927618010395
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618010395

المؤلفون: Ek, M., Hansen, L. P., Chen, F.-R., van Dyck, D., Kisielowski, C., Jinschek, J. R., Helveg, S.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 1974-1975 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927618010358
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618010358

المؤلفون: Helveg, S., Elkjcer, C. F., Jespersen, S. P., Vendelbo, S., Hendriksen, B., Mele, L., Dona, P., Creemer, J. F., Kooyman, P., Chorkendorff, I., Damsgaard, C., Jinschek, J. R.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 232-233 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927618001654
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618001654

المؤلفون: Kovács, A., Schaffer, B., Moreno, M. S., Jinschek, J. R., Craven, A. J., Dietl, T., Bonanni, A., Dunin-Borkowski, Rafal

المصدر: Journal of applied physics 114(3), 033530 - (2013). doi:10.1063/1.4816049

مصطلحات موضوعية: info:eu-repo/classification/ddc/530

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000322202700045; info:eu-repo/semantics/altIdentifier/issn/0148-6349; info:eu-repo/semantics/altIdentifier/issn/1089-7550; info:eu-repo/semantics/altIdentifier/issn/0021-8979; info:eu-repo/semantics/altIdentifier/hdl/2128/16790; https://juser.fz-juelich.de/record/201608; https://juser.fz-juelich.de/search?p=id:%22FZJ-2015-03902%22

الاتاحة: https://juser.fz-juelich.de/record/201608
https://juser.fz-juelich.de/search?p=id:%22FZJ-2015-03902%22

المؤلفون: de Pablos-Martín, A., Muñoz, F., Mather, G. C., Patzig, C., Bhattacharyya, S., Jinschek, J. R., Höche, Th., Durán, A., Pascual, M. J.

المصدر: CrystEngComm ; volume 15, issue 47, page 10323 ; ISSN 1466-8033

الاتاحة: http://dx.doi.org/10.1039/c3ce41345d
http://pubs.rsc.org/en/content/articlepdf/2013/CE/C3CE41345D

المؤلفون: Yoshida, K, Carlsson, A, Jinschek, J R, Stokes, D J, Gai, P L, Arai, S, Saitoh, K, Tanaka, N

المصدر: Journal of Physics: Conference Series ; volume 371, page 012044 ; ISSN 1742-6596

الاتاحة: http://dx.doi.org/10.1088/1742-6596/371/1/012044
http://stacks.iop.org/1742-6596/371/i=1/a=012044/pdf

المؤلفون: Yoshida, K, Carlsson, A, Jinschek, J, Stokes, D, Gai, P, Arai, S, Saitoh, K, Tanaka, N

المصدر: Microscopy and Microanalysis ; volume 17, issue S2, page 1706-1707 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927611009408
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927611009408

المؤلفون: Pennington, R S, Jinschek, J R, Wagner, J B, Boothroyd, C B, Dunin-Borkowski, R E

المصدر: Journal of Physics: Conference Series ; volume 209, page 012013 ; ISSN 1742-6596

الاتاحة: http://dx.doi.org/10.1088/1742-6596/209/1/012013
http://stacks.iop.org/1742-6596/209/i=1/a=012013/pdf

المؤلفون: Bhattacharyya, Somnath, Jinschek, J. R., Cao, Hu, Wang, Yu. U., Li, Jiefang, Viehland, Dwight D.

المساهمون: Materials Science and Engineering (MSE), Virginia Tech

مصطلحات موضوعية: Single-crystal, Polarization rotation, 1st principles, Mechanisms, States

وصف الملف: application/pdf

Relation: Bhattacharyya, Somnath; Jinschek, J. R.; Cao, Hu; et al., "Direct high-resolution transmission electron microscopy observation of tetragonal nanotwins within the monoclinic M(C) phase of Pb(Mg(1/3)Nb(2/3))O(3)-0.35PbTiO(3) crystals," Appl. Phys. Lett. 92, 142904 (2008); http://dx.doi.org/10.1063/1.2908228; http://hdl.handle.net/10919/47372; http://scitation.aip.org/content/aip/journal/apl/92/14/10.1063/1.2908228; https://doi.org/10.1063/1.2908228

الاتاحة: http://hdl.handle.net/10919/47372
http://scitation.aip.org/content/aip/journal/apl/92/14/10.1063/1.2908228
https://doi.org/10.1063/1.2908228

المؤلفون: Bhattacharyya, Somnath, Jinschek, J. R., Khachaturyan, Armen G., Cao, Hu, Li, Jiefang, Viehland, Dwight D.

المساهمون: Institute for Critical Technology and Applied Science (ICTAS), Materials Science and Engineering (MSE), Virginia Tech

مصطلحات موضوعية: Short-range order, Fe-Ga, AL alloys, State, Phase, Physics

وصف الملف: application/pdf

Relation: Bhattacharyya, Somnath; Jinschek, J. R.; Khachaturyan, A.; et al., Mar 2008. "Nanodispersed DO(3)-phase nanostructures observed in magnetostrictive Fe-19% Ga Galfenol alloys," PHYSICAL REVIEW B 77(10): 104107. DOI:10.1103/PhysRevB.77.104107; http://hdl.handle.net/10919/25396; https://doi.org/10.1103/PhysRevB.77.104107

الاتاحة: http://hdl.handle.net/10919/25396
http://link.aps.org/doi/10.1103/PhysRevB.77.104107
https://doi.org/10.1103/PhysRevB.77.104107

المؤلفون: Chen, F-R, Kisielowski, C F, Jinschek, J R, Plitzko, J, Kai, J-J

المصدر: Microscopy and Microanalysis ; volume 11, issue S02 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927605509206
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927605509206

المؤلفون: Batenburg, K J, Jinschek, J R, Kisielowski, C F

المصدر: Microscopy and Microanalysis ; volume 11, issue S02 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الاتاحة: http://dx.doi.org/10.1017/s1431927605502861
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927605502861

المؤلفون: Jinschek, J. R., Batenburg, K. J., Calderon, H. A., Van Dyck, D., Chen, F.-R., Radmilovic, V., Kisielowski, C.

المصدر: Microscopy and Microanalysis ; volume 10, issue S03, page 44-45 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927604555629
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927604555629