المؤلفون: Choi, K.S., Kim, S.H., Seo, J.W., Kang, H.S., Chu, S.W., Bae, S.W., Kwon, J.H., Kim, G.S., Park, Y.T., Kwak, J.H., Song, D.I., Park, S.M., Kim, Y.T., Jang, K.C., Cho, J.S., Lee, H.S., Lee, B.H., Park, J.W., Lee, J.H., Kwon, H. H., You, D.S., Hyun, C.S., Lee, J.J., Lee, S.C., Kim, I.D., Myung, J.H., Won, H.S., Chun, J.H., Kim, K.H., Kang, J.H., Kim, S.B., Lee, K.H., Chung, S.O., Kim, S.S., Jin, I.S., Lee, B.K., Kim, C.W., Park, J., Cha, S.Y.

المصدر: 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/vlsitechnologyandcir46783.2024.10631471
http://xplorestaging.ieee.org/ielx8/10631290/10631310/10631471.pdf?arnumber=10631471

المؤلفون: Jin, I.S., Cho, K., Whang, K.C.

المصدر: Electronics Letters (Institution of Engineering & Technology); 08/17/1995, Vol. 31 Issue 17, p1404-1406, 3p

المؤلفون: Jin, I.S., Whang, K.C., Cho, K., Ahn, J.Y., Oh, H.S.

المصدر: Electronics Letters (Institution of Engineering & Technology); 09/25/1997, Vol. 33 Issue 20, p1668-1669, 2p